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IEC 60970-2007 Insulating liquids - Methods for counting and sizing particles《绝缘液体.粒子计数和大小测定用方法》.pdf 40

IEC 60970-2007 Insulating liquids - Methods for counting and sizing particles《绝缘液体.粒子计数和大小测定用方法》.pdfIEC 60970-2007 Insulating liquids - Methods for counting and sizing particles《绝缘液体.粒子计数和大小测定用方法》.pdf

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IEC 60969-2016 Self-ballasted compact fluorescent lamps for general lighting services - Performance requirements《一般照明用自镇流荧光灯.性能要求》.pdf 106

IEC 60969-2016 Self-ballasted compact fluorescent lamps for general lighting services - Performance requirements《一般照明用自镇流荧光灯.性能要求》.pdfIEC 60969-2016 Self-ballasted compact fluorescent lamps for general lighting services - Performance requirements《一般照明用自镇流荧光灯.性能要求》.pdf

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IEC 60969 CORR 1-2017 Self-ballasted compact fluorescent lamps for general lighting services - Performance requirements Corrigendum 1《一般照明用自镇流荧光灯 性能要求 勘误表1》.pdf 1

IEC 60969 CORR 1-2017 Self-ballasted compact fluorescent lamps for general lighting services - Performance requirements Corrigendum 1《一般照明用自镇流荧光灯 性能要求 勘误表1》.pdfIEC 60969 CORR 1-2017 Self-ballasted compact fluorescent lamps for general lighting services - Performance requirements Corrigendum 1《一般照明用自镇流荧光灯 性能要求 勘误表1》.pdf

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IEC 60968-2015 Self-ballasted fluorescent lamps for general lighting services - Safety requirements《普通照明用自镇流荧光灯.安全性要求》.pdf 64

IEC 60968-2015 Self-ballasted fluorescent lamps for general lighting services - Safety requirements《普通照明用自镇流荧光灯.安全性要求》.pdfIEC 60968-2015 Self-ballasted fluorescent lamps for general lighting services - Safety requirements《普通照明用自镇流荧光灯.安全性要求》.pdf

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IEC 60968 CORR 1-2015 Self-ballasted fluorescent lamps for general lighting services - Safety requirements Corrigendum 1《普通照明用自镇流荧光灯.安全性要求 勘误1》.pdf 1

IEC 60968 CORR 1-2015 Self-ballasted fluorescent lamps for general lighting services - Safety requirements Corrigendum 1《普通照明用自镇流荧光灯.安全性要求 勘误1》.pdfIEC 60968 CORR 1-2015 Self-ballasted fluorescent lamps for general lighting services - Safety requirements Corrigendum 1《普通照明用自镇流荧光灯.安全性要求 勘误1》.pdf

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IEC 60749-42-2014 Semiconductor devices - Mechanical and climatic test methods - Part 42 Temperature and humidity storage《半导体器件 机械和气候试验方法 第42部分 温度和湿度存储》.pdf 20

IEC 60749-42-2014 Semiconductor devices - Mechanical and climatic test methods - Part 42 Temperature and humidity storage《半导体器件 机械和气候试验方法 第42部分 温度和湿度存储》.pdfIEC 60749-42-2014 Semiconductor devices - Mechanical and climatic test methods - Part 42 Temperature and humidity storage《半导体器件 机械和气候试验方法 第42部分 温度和湿度存储》.pdf

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IEC 60749-40-2011 Semiconductor devices - Mechanical and climatic test methods - Part 40 Board level drop test method using a strain gauge《半导体器件.机械和气候试验方法.第40部分 使用应变计的板级跌落试验方法》.pdf 48

IEC 60749-40-2011 Semiconductor devices - Mechanical and climatic test methods - Part 40 Board level drop test method using a strain gauge《半导体器件.机械和气候试验方法.第40部分 使用应变计的板级跌落试验方法》.pdfIEC 60749-40-2011 Semiconductor devices - Mechanical and climatic test methods - Part 40 Board level drop test method using a strain gauge《半导体器件.机械和气候试验方法.第40部分 使用应变计的板级跌落试验方法》.pdf

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IEC 60749-4-2017 Semiconductor devices - Mechanical and climatic test methods - Part 4 Damp heat steady state highly accelerated stress test (HAST)《半导体器件.机械和气候试验方法.第4部分 湿热 稳态 高加速应力试验》.pdf 14

IEC 60749-4-2017 Semiconductor devices - Mechanical and climatic test methods - Part 4 Damp heat steady state highly accelerated stress test (HAST)《半导体器件.机械和气候试验方法.第4部分 湿热 稳态 高加速应力试验》.pdfIEC 60749-4-2017 Semiconductor devices - Mechanical and climatic test methods - Part 4 Damp heat steady state highly accelerated stress test (HAST)《半导体器件.机械和气候试验方法.第4部分 湿热 稳态 高加速应力试验》.pdf

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IEC 60749-38-2008 Semiconductor devices - Mechanical and climatic test methods - Part 38 Soft error test method for semiconductor devices with memory《半导体器件.机械和气候试验方法.第38部分 带存储器的半导体器件用软错误试验法》.pdf 30

IEC 60749-38-2008 Semiconductor devices - Mechanical and climatic test methods - Part 38 Soft error test method for semiconductor devices with memory《半导体器件.机械和气候试验方法.第38部分 带存储器的半导体器件用软错误试验法》.pdfIEC 60749-38-2008 Semiconductor devices - Mechanical and climatic test methods - Part 38 Soft error test method for semiconductor devices with memory《半导体器件.机械和气候试验方法.第38部分 带存储器的半导体器件用软错误试验法》.pdf

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IEC 60749-37-2008 Semiconductor devices - Mechanical and climatic test methods - Part 37 Board level drop test method using an accelerometer《半导体装置.机械和气候试验方法.第37部分 用加速计的电路板级落锤试验方法》.pdf 44

IEC 60749-37-2008 Semiconductor devices - Mechanical and climatic test methods - Part 37 Board level drop test method using an accelerometer《半导体装置.机械和气候试验方法.第37部分 用加速计的电路板级落锤试验方法》.pdfIEC 60749-37-2008 Semiconductor devices - Mechanical and climatic test methods - Part 37 Board level drop test method using an accelerometer《半导体装置.机械和气候试验方法.第37部分 用加速计的电路板级落锤试验方法》.pdf

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