1、 IEC 62321-5 Edition 1.0 2013-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Determination of certain substances in electrotechnical products Part 5: Cadmium, lead and chromium in polymers and electronics and cadmium and lead in metals by AAS, AFS, ICP-OES and ICP-MS Dtermination de certaines substa
2、nces dans les produits lectrotechniques Partie 5: Du cadmium, du plomb et du chrome dans les polymres et les produits lectroniques, du cadmium et du plomb dans les mtaux par AAS, AFS, ICP-OES et ICP-MS IEC62321-5:2013 colourinsideTHIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2013 IEC, Geneva, Sw
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16、I) en ligne. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 62321-5 Edition 1.0 2013-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Determination of certain substances in electrotech
17、nical products Part 5: Cadmium, lead and chromium in polymers and electronics and cadmium and lead in metals by AAS, AFS, ICP-OES and ICP-MS Dtermination de certaines substances dans les produits lectrotechniques Partie 5: Du cadmium, du plomb et du chrome dans les polymres et les produits lectroniq
18、ues, du cadmium et du plomb dans les mtaux par AAS, AFS, ICP-OES et ICP-MS INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE W ICS 13.020; 43.040.10 PRICE CODE CODE PRIX ISBN 978-2-83220-842-7 Registered trademark of the International Electrotechnical Commission Ma
19、rque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. colourinside 2 62321-5 IEC:2013 CONTENTS FOREWORD . 4 INT
20、RODUCTION . 6 1 Scope . 7 2 Normative references . 8 3 Terms, definitions and abbreviations 8 Terms and definitions 8 3.1Abbreviations 9 3.24 Reagents 9 General . 9 4.1Reagents . 9 4.25 Apparatus . 11 General . 11 5.1Apparatus 12 5.26 Sampling 13 General . 13 6.1Test portion . 13 6.2Polymers . 13 6.
21、2.1Metals . 13 6.2.2Electronics 13 6.2.37 Procedure. 13 Polymers . 13 7.1General . 13 7.1.1Dry ashing method 14 7.1.2Acid digestion method . 15 7.1.3Microwave digestion 15 7.1.4Metals . 16 7.2General . 16 7.2.1Common methods of sample digestion. 17 7.2.2Samples containing Zr, Hf, Ti, Ta, Nb or W 17
22、7.2.3Samples containing Sn 17 7.2.4Electronics 18 7.3General . 18 7.3.1Digestion with aqua regia 18 7.3.2Microwave digestion 19 7.3.3Preparation of reagent blank solution 20 7.48 Calibration 20 General . 20 8.1Preparation of the calibration solution . 20 8.2Development of the calibration curve . 20
23、8.3Measurement of the sample 21 8.49 Calculation . 22 10 Precision 22 11 Quality control 24 General . 24 11.1Limits of detection (LOD) and limits of quantification (LOQ) . 25 11.262321-5 IEC:2013 3 Annex A (informative) Practical application of determination of Cd , Pb and Cr in polymers and electro
24、nics and Cd and Pb in metals by AAS, AFS, ICP-OES and ICP-MS . 27 Annex B (informative) Results of international interlaboratory study nos. 2 (IIS2) and 4A (IIS 4A) 33 Bibliography 36 Figure A.1 Background correction 31 Table 1 Repeatability and reproducibility 22 Table 2 Acceptance criteria of item
25、s for the quality control . 24 Table 3 Method detection limit = t sn1. 26 Table A.1 Spectral interferences for the wavelengths of Cd and Pb . 28 Table A.2 Spectral interferences for the wavelengths of Cr 29 Table A.3 Examples of mass/charge (m/z) ratios 30 Table A.4 Examples of wavelengths for AAS 3
26、0 Table A.5 Examples of wavelengths for AFS 31 Table A.6 Program for microwave digestion of samples . 32 Table B.1 Statistical data for AAS 33 Table B.2 Statistical data for AFS 33 Table B.3 Statistical data for ICP-OES . 34 Table B.4 Statistical data for ICP-MS . 35 4 62321-5 IEC:2013 INTERNATIONAL
27、 ELECTROTECHNICAL COMMISSION _ DETERMINATION OF CERTAIN SUBSTANCES IN ELECTROTECHNICAL PRODUCTS Part 5: Cadmium, lead and chromium in polymers and electronics and cadmium and lead in metals by AAS, AFS, ICP-OES and ICP-MS FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide
28、 organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activi
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34、nd the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not resp
35、onsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical co
36、mmittees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publica
37、tions. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of pa
38、tent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62321-5 has been prepared by IEC technical committee 111: Environmental standardization for electrical and electronic products and systems. The first edition of IEC 62321:2008 was
39、 a stand-alone standard that included an introduction, an overview of test methods, a mechanical sample preparation as well as various test method clauses. This first edition of IEC 62321-5 is a partial replacement of IEC 62321:2008, forming a structural revision and generally replacing Clauses 8 to
40、 10, as well as Annexes F, G and H. Future parts in the IEC 62321 series will gradually replace the corresponding clauses from IEC 62321:2008. Until such time as all parts are published, however, IEC 62321:2008 remains valid for those clauses not yet re-published as a separate part. 62321-5 IEC:2013
41、 5 The text of this standard is based on the following documents: FDIS Report on voting 111/297/FDIS 111/307/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with th
42、e ISO/IEC Directives, Part 2. A list of all parts in the IEC 62321 series can be found on the IEC website under the general title: Determination of certain substances in electrotechnical products. The committee has decided that the contents of this publication will remain unchanged until the stabili
43、ty date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page of this publication indicat
44、es that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. 6 62321-5 IEC:2013 INTRODUCTION The widespread use of electrotechnical products has drawn increased attention to their impac
45、t on the environment. In many countries this has resulted in the adaptation of regulations affecting wastes, substances and energy use of electrotechnical products. The use of certain substances (e.g. lead (Pb), cadmium (Cd) and polybrominated diphenyl ethers (PBDEs) in electrotechnical products, is
46、 a source of concern in current and proposed regional legislation. The purpose of the IEC 62321 series is therefore to provide test methods that will allow the electrotechnical industry to determine the levels of certain substances of concern in electrotechnical products on a consistent global basis
47、. WARNING Persons using this International Standard should be familiar with normal laboratory practice. This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user to establish appropriate safety and health practices and
48、 to ensure compliance with any national regulatory conditions. 62321-5 IEC:2013 7 DETERMINATION OF CERTAIN SUBSTANCES IN ELECTROTECHNICAL PRODUCTS Part 5: Cadmium, lead and chromium in polymers and electronics and cadmium and lead in metals by AAS, AFS, ICP-OES and ICP-MS 1 Scope This Part of IEC 62
49、321 describes the test methods for lead, cadmium and chromium in polymers, metals and electronics by AAS, AFS, ICP-OES and ICP-MS. This standard specifies the determination of the levels of cadmium (Cd), lead (Pb) and chromium (Cr) in electrotechnical products. It covers three types of matrices: polymers/polymeric workpieces, metals and alloys and electronics. This standard refers to the sample as the ob
