IEEE C37 90 1-2012 en Surge Withstand Capability (SWC) Tests for Relays and Relay Systems Associated with Electric Power Apparatus《与电力装置相关的继电器和中继系统的抗冲击能力(SWC)试验.pdf

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1、 IEEE Standard for Surge Withstand Capability (SWC) Tests for Relays and Relay Systems Associated with Electric Power Apparatus Sponsored by the Power System Relaying Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 17 September 2012 IEEE Power +1 978 750 8400. Permission to photocopy portio

2、ns of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copyright 2012 IEEE. All rights reserved. iv Notice to users Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance

3、with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urg

4、e action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations,

5、and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Us

6、ers of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edi

7、tion of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/standards.ieee.

8、org/index.html or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit IEEE-SA Website at http:/standards.ieee.org/index.html. Errata Errata, if any, for this and all other standards can be acces

9、sed at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publicatio

10、n of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Webs

11、ite at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any

12、 unfair discrimination to applicants desiring to obtain such licenses. Copyright 2012 IEEE. All rights reserved. v Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be r

13、equired, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this s

14、tandard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2012 IEEE. All rights reserved. vi Participants

15、 At the time this IEEE standard was completed, the I 20 Working Group had the following membership: Tom Beckwith, Chair Jeff Burnworth, Vice Chair Barbara Anderson Bob Beresh Ryan Bares Jack Chadwick, Jr. Bui Dac-Phuoc Jay Murphy Mario Ranieri Roger Ray Norbert Rochow Mark Simon Veselin Skendzic Joh

16、n Tengdin Murty V. Yally The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Ali Al Awazi Jay Anderson G. Bartok Michael Basler Philip Beaumont Thomas Beckwith Robert Beresh Steven Bez

17、ner Wallace Binder Oscar Bolado Gustavo Brunello Jeffrey Burnworth William Bush Mark Bushnell Suresh Channarasappa Arvind K. Chaudhary Bill Chiu Stephen Conrad Gary Donner Michael Dood Randall Dotson Neal Dowling Gary Engmann Dan Evans Fredric Friend John Galanos Frank Gerleve Jeffrey Gilbert David

18、Gilmer Mietek Glinkowski Jalal Gohari Stephen Grier Randall Groves Ajit Gwal Roger Hedding Gary Hoffman Jerry Hohn Ronald Hotchkiss Gerald Johnson Joseph L. Koepfinger Jim Kulchisky Chung-Yiu Lam Robert Landman Greg Luri Michael Maytum Omar Mazzoni John McDonald Nigel Mcquin Brian Mugalian Jerry Mur

19、phy R. Murphy Bruce Muschlitz Michael S. Newman Bansi Patel Robert Pettigrew Iulian Profir Mario Ranieri Roger Ray Michael Roberts Charles Rogers Bartien Sayogo Samuel Sciacca Gil Shultz Mark Simon Veselin Skendzic James Smith Jeremy Smith Jerry Smith Gary Stoedter Charles Sufana James Swank John Te

20、ngdin Demetrios Tziouvaras Joe Uchiyama Eric Udren John Vergis John Wang Steven Whalen Thomas Wiedman Philip Winston Murty V. Yalla Jian Yu Matthew Zeedyk Copyright 2012 IEEE. All rights reserved. vii When the IEEE-SA Standards Board approved this standard on 30 August 2012, it had the following mem

21、bership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past Chair Konstantinos Karachalios, Secretary Satish Aggarwal Masayuki Ariyoshi Peter Balma William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alexander Gelman Paul Houz Jim Hughes Young Kyun Kim Joseph L.

22、Koepfinger* David J. Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Walter Rosdahl Mike Seavey Yatin Trivedi Phil Winsgton Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NI

23、ST Representative Matthew J. Ceglia IEEE Client Services Manager, Professional Services Michelle D. Turner IEEE Standards Program Manager, Document Development Erin Spiewak IEEE Standards Program Manager, Technical Program Development Copyright 2012 IEEE. All rights reserved. viii Introduction This

24、introduction is not part of IEEE Std C37.90.1-2012, IEEE Standard for Surge Withstand Capability (SWC) Tests for Relays and Relay Systems Associated with Electric Power Apparatus. Assurance is needed that electronic relays and relay systems will operate satisfactorily when installed in the harsh env

25、ironment of a substation or switchyard. Standard surge tests will provide assurance that the relays and relay systems will withstand a specified surge level. The use of proper grounding and shielding techniques when installing the equipment will attenuate the actual surge level impinging on the equi

26、pment. However, even with proper grounding and shielding, surges may reach the equipment that are above the test levels specified in this standard. In such cases, the addition by the user of surge suppression devices external to the relay system may be required. The first standard document to specif

27、y an SWC Test was ANSI/IEEE Std C37.90a-1974/IEEE Std 472-1974 (redesignated ANSI/IEEE Std C37.90.1-1974), Guide for Surge Withstand Capability (SWC) Tests. Experience with ANSI/IEEE C37.90.1-1974 was good, and in 1978 the Guide was incorporated as Clause 9 of ANSI/IEEE Std C37.90-1978, IEEE Standar

28、d for Relays and Relay Systems Associated with Electric Power Apparatus. This meant that the oscillatory SWC Test became a required test for relays and relay systems containing semiconducting devices. From the beginning, it was realized that the oscillatory SWC test had limitations and did not adequ

29、ately represent all conducted transients that may be experienced in substation environments. The need for a complementary test was recognized and the general type of test required was identified. The problem then became one of a search for a circuit that would produce a repeatable, controllable outp

30、ut. During the search, the IEC showering arc test was studied as well as a number of other tests proposed by various organizations. These were not chosen because they were not repeatable or controllable. The combination of the original oscillatory SWC test and the fast transient SWC test ensure that

31、 relays and relay systems will function at a level of immunity in the presence of conducted transients that occur in substations. The fast transient test was therefore incorporated into ANSI/IEEE Std C37.90.1-1989, because it is stable, easy to control and can be performed in a minimum time and at a

32、 reasonable cost. A working group was later assembled to harmonize ANSI/IEEE Std C37.90.1-1989 with corresponding IEC standards and to make the standard more understandable through clarifications and improvements to the document. This working group made extensive revisions such that one set of tests

33、 are necessary to reach closer harmonization with the corresponding IEC standards. Copyright 2012 IEEE. All rights reserved. ix Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 2 3. Definitions 2 4. Test wave shapes 3 4.1 Oscillatory test waveform characteristics (see Figur

34、e 1) . 3 4.2 Fast transient test waveform (see Figure 2) . 4 5. Test generator characteristics . 6 5.1 Oscillatory SWC test . 6 5.2 Fast transient SWC test 6 5.3 Common characteristics for all SWC test generators 6 5.4 Verification of test generator characteristics . 7 6. Equipment to be tested . 8

35、6.1 Test intent 8 6.2 System . 8 6.3 Application 8 6.4 Protective relay communications equipment . 8 6.5 Test points . 9 7. Application of test wave . 9 7.1 External connection groups . 9 7.2 Point of application of tests . 9 7.3 Conditions of test 10 8. Test procedures 14 8.1 Test types 14 8.2 Comm

36、on mode tests .14 8.3 Transverse mode tests .14 9. Criteria for acceptance .15 9.1 Application of criteria .15 9.2 Conditions to be met .16 9.3 Equipment functioning .16 10. Test records .16 Annex A (informative) Bibliography 18 Annex B (informative) Verification of test generator characteristics 19

37、 Annex C (informative) Test waveform delivery23 Annex D (informative) Balanced/unbalanced (balun) transformer impedance matching network examples 25 Copyright 2012 IEEE. All rights reserved. x Annex E (normative) Communication interface equipment and communication system equipment .27 Annex F (infor

38、mative) Comparison with IEC Protective Relay Standards .34 Annex G (informative) History of IEEE Std C37.90.1 36 Copyright 2012 IEEE. All rights reserved. 1 IEEE Standard for Surge Withstand Capability (SWC) Tests for Relays and Relay Systems Associated with Electric Power Apparatus IMPORTANT NOTICE

39、: IEEE Standards documents are not intended to ensure safety, health, or environmental protection, or ensure against interference with or from other devices or networks. Implementers of IEEE Standards documents are responsible for determining and complying with all appropriate safety, security, envi

40、ronmental, health, and interference protection practices and all applicable laws and regulations. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under

41、the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This standard specifies design tests for relays and relay systems that rel

42、ate to the immunity of this equipment to repetitive electrical transients. Two types of tests are specified. The oscillatory and fast transient SWC tests are defined as distinct tests. However, it is not intended to prohibit a combined test, provided all requirements of the individual SWC tests are

43、met. The application of SWC tests to equipment other than relays and relay systems is the responsibility of those specifying the testing. 1.2 Purpose This standard establishes a common and reproducible basis for evaluating the performance of relays and relay systems when subjected to repetitive tran

44、sients on supply, signal, control, and communication lines or connections. This standard establishes that an evaluation is performed during both normal (non-tripped) and abnormal (tripped) relay operating conditions. IEEE Std C37.90.1-2012 IEEE Standard for Surge Withstand Capability (SWC) Tests for

45、 Relays and Relay Systems Associated with Electric Power Apparatus Copyright 2012 IEEE. All rights reserved. 2 2. Normative references The following referenced documents are indispensable for the application of this document (i.e., they must be understood and used, so each referenced document is cit

46、ed in text and its relationship to this document is explained). For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies. IEEE Std C37.90, IEEE Standard Relays and Relay Systems Associ

47、ated with Electric Power Apparatus.1, 23. Definitions For the purposes of this document, the following terms and definitions apply. The IEEE Standards Dictionary Online should be consulted for terms not defined in this clause.3calibration: The adjustment of a device to have the designed operating ch

48、aracteristics, and the subsequent marking of the positions of the adjusting means, or the making of adjustments necessary to bring operating characteristics into substantial agreement with standardized scales or marking. common (longitudinal) -mode voltage: The voltage common to all conductors of a

49、group as measured between that group at a given location and an arbitrary reference (usually earth). communications interface equipment: A portion of a relay system which transmits or receives information from a communications system; e.g., audio tone equipment or carrier transmitter-receiver included as an integral part of the relay system. communications system: Any system which transfers protection or other data to or from the relay interface to or from another location. current circuit: An input circuit to which is applied a current of greater than or equal

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