1、 IEEE Standard Test Methods for Surge Protectors and Protective Circuits Used in Information and Communications Technology (ICT) Circuits, and Smart Grid Data Circuits Sponsored by the Surge Protective Devices Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEE
2、E Std C62.36-2016 (Revision of IEEE Std C62.36-2014) IEEE Std C62.36-2016 (Revision of IEEE Std C62.36-2014) IEEE Standard Test Methods for Surge Protectors and Protective Circuits Used in Information and Communications Technology (ICT) Circuits, and Smart Grid Data Circuits Sponsor Surge Protective
3、 Devices Committee of the IEEE Power and Energy Society Approved 16 May 2016 IEEE-SA Standards Board Copyright 2016 IEEE. All rights reserved. 2Abstract: Surge protectors for application on multiconductor balanced or unbalanced information and communications technology (ICT) circuits and smart grid
4、data circuits are addressed in this standard. These surge protectors are designed to limit voltage surges, current surges, or both. The surge protectors covered are generally multiple-component series or parallel combinations of linear or nonlinear elements, packaged or organized for the purpose of
5、limiting voltage, current, or both. The methods of testing and criteria (where appropriate) for the characteristics and ratings of surge protectors used in ICT circuits and smart grid data circuits are also described in this standard. Packaged single gas tube, air gap, varistor, or avalanche junctio
6、n surge-protective components are not covered by this standard, but rather are covered by IEEE Std C62.31, IEEE Std C62.32, IEEE Std C62.33, and IEEE Std C62.35, respectively. Specifically excluded from this standard are test methods for low-voltage power circuit applications. For protection of wire
7、-line communication facilities under the specialized conditions found at power stations, consult IEEE Std 487. Keywords: ICT surge protection, IEEE C62.36, signal line surge protection, smart grid surge protection, SPD, surge-protective circuits, surge protector, telecommunication line protector uni
8、t, transient overvoltage protector 1The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2016 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 2 November 2016. Printed in the United States of Am
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36、gal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determinat
37、ion of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2016 IEEE. All rights reserved. 6 Participants At the time this draft standard was submitted
38、 to the IEEE-SA Standards Board for approval, the 3.6.7 LV Data, Communications and Signaling Circuit Surge Protective Devices Working Group had the following participants: Albert Martin, Chair Ernie Gallo, Vice Chair Tim Ardley Robert Ashton Frank Basciano Nisar Chaudhry Leonard Drewes Ernie Gallo
39、Bogey Klobassa Peter Kobsa Albert Martin Michael Maytum Wolfgang Oertel Alan Rebeck Thomas Tran Bill Travis The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Robert Ashton Frank Basc
40、iano William Bloethe Kenneth Brown William Byrd Suresh Channarasappa Frank Gerleve Randall Groves Ronald Hotchkiss Noriyuki Ikeuchi Yuri Khersonsky Jim Kulchisky Saumen Kundu Albert Martin Michael Maytum William McBride Michael Newman Gary Nissen Wolfgang Oertel Thomas Phipps Iulian Profir Michael R
41、oberts Thomas Rozek Bartien Sayogo Veselin Skendzic Jeremy Smith Jerry Smith Roger Verdolin John Vergis Matthew Wakeham Kenneth White James Wilson When the IEEE-SA Standards Board approved this standard on 16 May 2016, it had the following membership: Jean-Philippe Faure, Chair Ted Burse, Vice Chair
42、 John D. Kulick, Past Chair Konstantinos Karachalios, Secretary Chuck Adams Masayuki Ariyoshi Stephen Dukes Jianbin Fan Ronald W. Hotchkiss J. Travis Griffith Gary Hoffman Michael Janezic Joseph L. Koepfinger* Hung Ling Kevin Lu Gary Robinson Annette D. Reilly Mehmet Ulema Yingli Wen Howard Wolfman
43、Don Wright Yu Yuan Daidi Zhong*Member Emeritus Copyright 2016 IEEE. All rights reserved. 7 Introduction This introduction is not part of IEEE Std C62.36-2016, IEEE Standard Test Methods for Surge Protectors and Protective Circuits Used in Information and Communications Technology (ICT) Circuits, and
44、 Smart Grid Data Circuits. This standard applies to surge protectors for application on multiconductor balanced or unbalanced information and communications technology (ICT) circuits and smart grid data circuits. These surge protectors are designed to limit voltage surges, current surges, or both. T
45、he surge protectors covered are generally multiple-component series or parallel combinations of linear or nonlinear elements, packaged or organized for the purpose of limiting voltage, current, or both. This standard describes the methods of testing and criteria (where appropriate) for the character
46、istics and ratings of surge protectors used in ICT circuits and smart grid data circuits. This standard is not intended to cover packaged single gas tube, air gap, varistor, or avalanche junction surge-protective components (SPCs), which are covered by IEEE Std C62.31 B20, IEEE Std C62.32 B21, IEEE
47、Std C62.33 B22, and IEEE Std C62.35 B23, respectively. Specifically excluded from this standard are test methods for low-voltage power circuit applications. For protection of wire-line communication facilities under the specialized conditions found at power stations, consult IEEE Std 487 B16.1, 21Th
48、e IEEE standards or products referred to in this introduction are trademarks owned by The Institute of Electrical and Electronics Engineers, Incorporated. 2Numbers in brackets correspond to the numbers of the bibliography in Annex I. Copyright 2016 IEEE. All rights reserved. 8 Contents 1. Scope .10
49、2. Normative references .11 3. Definitions, acronyms, and abbreviations .11 3.1 Definitions 11 3.2 Acronyms and abbreviations 12 4. Service conditions .13 4.1 Normal service conditions 13 4.2 Unusual service conditions .14 4.3 Radiation .15 5. Basic configurations 15 6. Standard design test procedure 17 6.1 Standard design test criteria 17 6.2 Statistical procedures 17 6.3 Test conditions 17 6.4 Test measurements .17 7. Surge protector characteristics .17 7.1 General .17 7.2 DC series resistance 18 7.3 Capacitance .19 7.4 Inductance .24 7.5 Insulation
