1、BRITISH STANDARD BS CECC 30401023: 1979 Incorporating Amendment No.1 Specification for Fixed metallized polyethylene terephthalate film dielectric d.c.capacitors Rectangular insulated non-metallic case, rigid radial terminations Full assessment level UDC 621.319.4.024:621.315.616.96:678.742.066416BS
2、CECC30401023:1979 BSI 08-1999 Committee reference ECL/4 ISBN 0580 10976 3 A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer
3、immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pagesi andii, pages1 to11 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on t
4、he inside front cover. Amendments issued since publication Amd. No. Date of issue Comments 3894 September 1982 Indicated by a sideline in the marginBSCECC30401023:1979 BSI 08-1999 i Contents Page 1 Specified method of mounting for vibration and bump 2 2 Ratings and characteristics 2 3 Additional inf
5、ormation (not for inspection purposes) 2 4 Related documents 3 5 Marking 4 6 Ordering information 4 7 Qualification approval and quality conformance inspection 4 8 Certified test records 4 Table 1 Dimensions 1 Table 2 Values of capacitance and voltage related to case size 3 Table 3 Insulation resist
6、ance 3 Table 4 Test schedule 5ii blankBSCECC30401023:1979 BSI 08-1999 1 Table 1 Dimensions ELECTRONIC COMPONENTS OF ASSESSED QUALITY DETAIL SPECIFICATION IN ACCORDANCE WITH BS E9070:1975, BS CECC30400:1978 MANUFACTURERS TYPE NUMBER See Table 1 below See PD9002 and CECC00200 For ordering information
7、seeclause6 Outline and dimensions First angle projection (See Table 1 below) All dimensions in millimetres Marking information. Seeclause5. FIXED METALLIZED POLYETHYLENE TEREPHTHALATE FILM DIELECTRIC D.C.CAPACITORS TYPICAL CONSTRUCTION: RECTANGULAR INSULATED NON-METALLIC CASE, RIGID RADIAL TERMINATI
8、ONS INTENDED FOR PRINTED CIRCUIT APPLICATIONS. FULL ASSESSMENT Refer to Qualified Product List PD9002 and/or CECC00200 for details of manufacturers approved to this specification. Case size X (max.) Y (max.) Z (max.) S +0.350.7 d Typical mass min. nom. max. 1 2 3 4 5 6 7 8 mm 13.5 13.5 19.0 19.0 27.
9、0 27.0 32.0 32.0 mm 10.5 11.5 12.5 15.0 20.0 20.5 23.0 22.5 mm 5.0 6.5 7.0 9.0 10.0 10.5 13.0 13.5 mm 10.16 10.16 15.24 15.24 22.86 22.86 27.94 27.94 mm 0.75 0.75 0.75 0.75 0.75 0.75 0.75 0.75 mm 0.80 0.80 0.80 0.80 0.80 0.80 0.80 0.80 mm 0.88 0.88 0.88 0.88 0.88 0.88 0.88 0.88 g 0.8 1.0 2.0 3.0 4.0
10、 6.0 13.0 13.0 NOTEThe capacitor shall be capable of seating firmly on the printed wiring board, and the body moulding shall not seal off the holes through which the capacitor leads pass.BSCECC30401023:1979 2 BSI 08-1999 1 Specified method of mounting for vibration and bump For case sizes up to and
11、including6g the capacitors shall be pressed down firmly on to a rigid mounting surface and fixed by soldering the leads. For larger case sizes the capacitor shall be mounted in the same way and the body shall be clamped. 2 Ratings and characteristics 3 Additional information (not for inspection purp
12、oses) These capacitors have been designed for wide general application in electrical and electronic circuits and are suitable for domestic, commercial and high grade professional use. These capacitors are not suitable for connection across supply mains. Capacitance range Capacitance tolerances: Stan
13、dard Special order Rated voltage Category voltage Rated temperature Insulation resistance Tangent of loss angle at1kHz Climatic category Vibration severity Duration Bump Solderability Solder bath method Resistance to soldering heat Low air pressure See Table 2 10%(K) 20%(M), 5%(J) See Table 2 As rat
14、ed voltage 85 C see Table 3 C R 14F: tan$u 0.01 C R u 14F: tan$u 0.008 40/085/21 BS2011-2.1Fc, Procedure B4,0.75mm or98m/s 2 (10Hz to500Hz) 6h 390m/s 2 (40g n )1000bumps 230 C with heat screen 260 C 2 kPa (20 mbar a ) a a1mbar=10 2 N/m 2 =100pa. Typical capacitance change 40 C to+20 C:5.0% as a func
15、tion of temperature +20 C to+85 C:3.0%BSCECC30401023:1979 BSI 08-1999 3 Table 2 Values of capacitance and voltage related to case size Table 3 Insulation resistance 4 Related documents BS2011, Basic environmental testing procedures (IEC68). BS2488, Schedule of preferred numbers for the resistance of
16、 resistors and the capacitance of capacitors for telecommunication equipment (IEC63). BS6001, Sampling procedures and tables for inspection by attributes. BSE9000, General requirements for electronic components of assessed quality harmonized with the CENELEC Electronic Components Committee System. B
17、S E9070, Harmonized system of quality assessment for electronic components: Generic specification: Fixed capacitors. BSCECC30400, Harmonized system of quality assessment for electronic components: Sectionalspecification: Fixed metallized polyethylene-terephthalate film dielectric d.c.capacitors. PD9
18、002, BS9000 component selection guide. CECC00200, Qualified products list. Capacitance 4F Rated voltage U R 63V d.c. 100V d.c. 250V d.c. 400V d.c. 630V d.c. 0.01 0.015 0.022 0.033 0.047 0.068 0.1 0.15 0.22 0.33 0.47 0.68 1.0 1.5 2.2 3.3 4.7 6.8 10.0 1 1 1 2 2 3 3 4 4 5 5 6 7 1 1 1 2 2 3 3 4 4 5 5 6
19、7 8 1 1 1 2 2 3 3 4 5 5 5 7 7 8 1 1 1 2 3 3 4 4 5 5 5 7 8 8 1 2 2 3 4 4 5 5 5 7 8 8 Minimum R Cproduct R=Insulation resistance between the terminations C=Rated capacitance s Minimum insulation resistance between the terminations M7 Minimum insulation resistance between the terminations and case M7 R
20、ated capacitance0.334F u 0.334F Rated voltage100V u 100V 100V u 100V 10000 5000 30000 15000 30000 NOTEThe capacitance values are within the E6 series (BS2488).BSCECC30401023:1979 4 BSI 08-1999 5 Marking The following information shall be given on the capacitor in accordance with1.4 of BS CECC30400:
21、a) rated capacitance; b) rated voltage; c) tolerance on rated capacitance; d) manufacturers code. 6 Ordering information Orders for components complying with the requirements of this specification shall include the following minimum information: a) quantity; b) BS CECC specification number, issue nu
22、mber and date, i.e.BS CECC30401 023 Issue1; c) capacitance value and tolerance; d) rated voltage. 7 Qualification approval and quality conformance inspection 7.1 For qualification approval test and quality conformance inspection the test schedule, severities and requirements given in the sectional s
23、pecification BS CECC30400 apply. 7.2 A complete schedule is given in Table 3. The details in7.2.1 to7.2.5 apply. 7.2.1 For qualification testing, see3.3 of BS CECC30400, subgroups A1 and A2 are combined together to form group0. All subgroups of group C are required with numbers of samples and permis
24、sible defectives as shown in Table 1 of BS CECC30400. 7.2.2 The samples required for qualification testing will be in accordance with3.3.1 of BS CECC30400. 7.2.3 Samples submitted to tests marked D shall not be accepted for release under BS E9000. 7.2.4 The requirement for visual examination for int
25、ermediate or final measurement is as follows. There shall be no damage that will affect the usability of the capacitor for its intended purpose. 7.2.5 Drying in accordance with4.2 of BSE9070 is not required. 8 Certified test records Certified test records shall be prepared in accordance with3.2 of B
26、S CECC30400. Attributes information shall be given for subgroups C1, C2, C3 and C4 without reference to the parameter with which a defect occurred. Variables information for the change in capacitance, in the tangent of loss angle, and in the insulation resistance after the endurance test (subgroup C
27、3) and after the charge and discharge tests(subgroup C4). BSCECC30401023:1979 BSI 08-1999 5 Table 4 Test schedule Groups A and B Inspection(Lot-by-lot): Full Assessment Level Examination or test D/ND BS CECC 30400 Ref. Test method and severity IL a AQL b Performance requirements GROUP A INSPECTION T
28、o be applied on a sampling basis, lot-by-lot(7.2.1) Subgroup A1 Visual examination Marking Dimensions ND 4.2 S4 2.5 See(7.2.4) Seeclause5 As Table 1 Subgroup A2 (7.2.1) Voltage proof (testpointA1.1) Capacitance Tangent of loss angle Insulation resistance (testpoint A1.1 only) ND 4.3 4.4 4.5 4.6 1.6U
29、 R C R 0.334F U R 100V U R u 100V C R u 0.334F U R 100V U R u 100V II 1.0 There shall be no breakdown or flashover. Self-healing is permitted. Within the specified selection tolerance C R u 14Fu 0.008 C R 14Fu 0.01 RCW 10000s RCW 5000s R ins W 30000M7 R ins W 15000M7 GROUP B INSPECTION To be applied
30、 on a sampling basis, lot-by-lot Subgroup B1 Solderability ND 4.9.2 Test Ta, solder bath method with heat screen depth of immersion as in4.9.2 of BSCECC30400 3 2.5 3.2.3 of test Ta NOTESee7.2.1 to7.2.5 for references shown in parentheses. a IL=Inspection level b AQL=Acceptance quality levelBSCECC304
31、01023:1979 6 BSI 08-1999 Table 4 Test schedule Group C Inspection, Periodic Tests (7.2.1): Full Assessment Level Examination or test D/ND BS CECC 30400 Ref. Test method and severity P a n b C c Performance requirements GROUP C INSPECTION To be conducted on a sampling basis plus periodically at the m
32、onthly interval shown in column P Subgroup C1 Initial measurements Capacitance Tangent of loss angle D 4.8.1 4.4 4.5 6 27 2 Within the specified selection tolerance C R u 14F;u 0.008 at1kHz record reading for information at10kHz Subgroup C1(a) Part of sample Robustness of terminations Visual examina
33、tion Resistance to soldering heat Final measurements Visual examination Capacitance Tangent of loss angle D 4.8.2 4.2 4.8.3 4.8.4 4.2 4.4 4.5 Test Ua, Tensile10N/10s Test Tb, method1A260 C with heat screen 6 9 1 See(7.2.4) See(7.2.4) %Cu2% Increase of tan C R 14F;u 0.002 at1kHz C R u 14F;u 0.003 at1
34、0kHz NOTESee7.2.1 to7.2.5 for references shown in parentheses. a P=periodicity(months). b n=sample size. c C=permissible defectives.BSCECC30401023:1979 BSI 08-1999 7 Table 4 Test schedule Examination or test D/ND BS CECC 30400 Ref. Test method and severity P a n b C c Performance requirements Sub gr
35、oup C1(b) Other part of sample Rapid change of temperature Visual examination Vibration Visual examination Bump Final measurements Visual examination Capacitance Tangent of loss angle Insulation resistance D 4.9.3 4.2 4.9.4 4.2 4.9.5 4.9.6 4.2 4.4 4.5 4.6 Test Na,5 cycles of30min at40 C and30min at8
36、5 C. Period of recovery not less than1h Test Fc, procedure B410Hz to500Hz. Duration6h. For method of mounting, seeclause2 Test Eb, 390m/s 2 (40g n ) 1000bumps. For method of mounting, seeclause2 6 18 1 See(7.2.4) See(7.2.4) See(7.2.4) %Cu5% Increase of tan C R 14F;u 0.002 at1kHz C R u 14F;u 0.003 at
37、10kHz Within initial limit NOTESee7.2.1 to7.2.5 for references shown in parentheses. a P=periodicity(months). b n=sample size. c permissible defectives.BSCECC30401023:1979 8 BSI 08-1999 Table 4 Test schedule Examination or test D/ND BS CECC 30400 Ref. Test method and severity P n C Performance requi
38、rements Subgroups C1(a) and C1(b) combined Climatic sequence Dryheat Capacitance Insulation resistance Damp heat, cyclic, firstcycle Capacitance Cold Capacitance Low air pressure 4.10 4.10.2 4.4 4.6 4.10.3 4.4 4.10.4 4.4 4.10.5 Test Ba,16h. While still at the upper category temperature(85 C) and at
39、the end of the period of high temperature conduct the following tests: Test point A1.1 C R 0.334FU R 100V U R u 100V C R 0.334FU R 100V U R u 100V Test point B1.2 Test Db Test Aa,2h. While still at the lower category temperature(40 C) and at the end of the period of low temperature the capacitance s
40、hall be measured Test M,20mbar. The test shall be carried out at a temperature of15 C to35 C, duration1h. U Rto be applied, test point A1.1 part of sample and test point B1.2 of other part of sample, during the last5min 6 27 2 %Cu5% RCW 100s RCW 50s R ins W 300M7 R ins W 150M7 R ins W 300M7 Referenc
41、e value %Cu 7 % No breakdown or flashover. Selfhealing is permittedBSCECC30401023:1979 BSI 08-1999 9 Table 4 Test schedule Examination or test D/ND BS CECC 30400 Ref. Test method and severity P n C Performance requirements Subgroups C1(a) and C1(b) combined (contd) Visual examination Damp heat, cycl
42、ic, remaining cycles Final measurements Visual examination Capacitance Tangent of loss angle Insulation resistance 4.2 4.10.6 4.10.7 4.2 4.4 4.5 4.6 Test Db, 1cycle. U Rto be applied, test point A1.1 for1min within15min after removal See(7.2.4) See(7.2.4) %C14F,50% of the initial limit Subgroup C2 I
43、nitial measurements Capacitance Tangent of loss angle Damp heat, steady state Voltage proof Final measurements Visual examination Capacitance Tangent of loss angle D 4.11.1 4.4 4.5 4.11 4.11.2 4.3 4.11.3 4.2 4.4 4.5 Test Ca,21 days, no voltage applied U rwithin15min after removal from the chamber. R
44、ecovery1h to2h Within2h after recovery 6 15 1 Within the specified selection tolerance C R u 14Fu 0.008 at1kHz C R 14Fu 0.01 at1kHz No breakdown or flashover, selfhealing is permitted See(7.2.4) %Cu5% Increase of tan u 0.005BSCECC30401023:1979 10 BSI 08-1999 Table 4 Test schedule Examination or test
45、 D/ND BS CECC 30400 Ref. Test method and severity P n C Performance requirements Subgroup C3 Initial measurements Capacitance Tangent of loss angle Endurance Final measurements Visual examination Capacitance Tangent of loss angle D 4.12.1 4.4 4.5 4.12 4.12.5 4.2 4.4 4.8.1 Duration2000h. The sample s
46、hall be divided in two parts,1 part1.25Uc to be applied at85 C. 1part2v. dc to be applied at85 C 3 21 1 Within the specified selection tolerance C R u 14F;u 0.008 at1kHz record reading for information at10kHz C R W 14F;u 0.01 at1kHz See(7.2.4) %Cu 5% Increase of tan C R 14F;u 0.002 at1kHz C R u 14F;
47、u 0.003 at10kHzBSCECC30401023:1979 BSI 08-1999 11 Table 4 Test schedule Examination or test D/ND BS CECC 30400 Ref. Test method and severity P n C Performance requirements Subgroup C4 Initial measurements Capacitance Tangent of loss angle Charge and discharge Final measurements Capacitance Tangent o
48、f loss angle D 4.13.1 4.4 4.5 4.13 4.13.3 4.4 4.5 z 3 9 1 Within the specified selection tolerance C R u 1 4F;u 0.008 at1kHz record reading at10kHz C R 14F;u 0.01 at1kHz %Cu 3% Increase of tan C R 14F;u 0.002 at1kHz C R u 14F;u 0.003 at10kHzBS CECC 30401023: 1979 BSI 389 Chiswick High Road London W4
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