1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Redraw. Update drawing to current requirements. - drw 09-01-26 Robert M. Heber REV SHET REV SHET REV STATUS REV A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY Sandra Rooney CHECKED BY Sandra Rooney DEFENSE SUPPLY CENTER
2、COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY Michael A. Frye STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 94-06-27 MICROCIRCUIT, LINEAR, HIGH SPEED 6-BIT A/D CONVERTER, MONO
3、LITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-89900 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E101-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89900 DEFENSE SUPPLY CENTER COLUMBUS
4、COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN
5、is as shown in the following example: 5962-89900 01 E A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type. The device type identifies the circuit function as follows: Device type Generic number Circuit function 01 AD9000S 6-bit high speed A/D conv
6、erter 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line 3 CQCC1-N28 28 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-
7、38535, appendix A. 1.3 Absolute maximum ratings. 1/ Positive supply voltage (+VS). -0.3 V dc to +6.0 V dc Negative supply voltage (-VS) -6.0 V dc to +0.3 V dc Analog-to-digital ground voltage differential. 0.5 V dc Analog input voltages (AIN, +VREF, -VREF) 2/. 3 V dc Differential reference voltage (
8、+VREFto -VREF) 3/ . 6 V dc ENCODE input voltage -VSto 0 V HYSTERESIS control voltage 0 V dc to +3.0 V dc Digital output current 20 mA Power dissipation (PD) . 745 mW Storage temperature range -65C to +125C Junction temperature (TJ) +175C Lead temperature (soldering, 10 seconds) +300C Thermal resista
9、nce, junction-to-ambient (JA): Case outline 3 62C/W Case outline E 67C/W Thermal resistance, junction-to-case (JC). See MIL-STD-1835 1.4 Recommended operating conditions. Ambient operating temperature range . -55C to +125C _ 1/ Stresses above the absolute maximum rating may cause permanent damage to
10、 the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Under normal operating conditions, the analog input voltages should not exceed nominal 2 V operating range, nor the supply voltages (+VSand VS), whichever is smaller. 3/ Under normal operating co
11、nditions, the differential reference voltage may range from 0.5 V to 2 V; +VREF -VREF. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89900 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION L
12、EVEL A SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those c
13、ited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outli
14、nes. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Bu
15、ilding 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific ex
16、emption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML)
17、 certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as docu
18、mented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-3853
19、5 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 her
20、ein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperatu
21、re range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PI
22、N listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance
23、 indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo
24、 reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89900 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C T
25、A+125C Group A subgroupsDevice type Limits Unit unless otherwise specified Min Max Resolution RES 1, 2, 3 01 6 Bits Differential linearity DNL 1 01 0.5 LSB 2, 3 1.0 Integral linearity INL 1 01 0.5 LSB 2, 3 1.0 INITIAL OFFSET ERROR Top of reference ladder EOT1 01 0.875 LSB 2, 3 1.5 Bottom of referenc
26、e ladder EOB1 01 0.875 LSB 2, 3 1.5 AMALOG INPUT Input bias current (sampling) IBINSAIN= +VREF1, 2, 3 01 800 A Input bias current (latched) IBINLAIN= +VREF1, 2, 3 01 20 A Input capacitance CAINSee 4.3.1c 4 01 50 pF REFERENCE INPUT Reference ladder resistance RREF2/, 3/ 1 01 80 200 DYNAMIC PERFORMANC
27、E 4/ Conversion rate tCONV1 01 75 ns Conversion time (+1 clock) tC1 01 13.3 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89900 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHI
28、O 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions 1/ -55C TA+125C Group A subgroupsDevice type Limits Unit unless otherwise specified Min Max DYNAMIC PERFORMANCE continued. 4/ Output propagation delay tPD5/
29、 9 01 8 12 ns Output hold time tOH6/ 9 01 8 14 ns Output rise time tR7/ 9 01 4.5 ns Output fall time tF7/ 9 01 4.5 ns ENCODE INPUT Logic “1” voltage VE11, 2, 3 01 -1.1 V Logic “0” voltage VE01, 2, 3 01 -1.5 V Logic “1” current IE11, 2, 3 01 100 A Logic “0” current IE01, 2, 3 01 100 A Input capacitan
30、ce CEIN4 01 5.0 pF ENCODE pulse width high tPWH9 01 6.6 ns ENCODE pulse width low tPWL9 01 6.6 ns AC LINEARITY Signal to noise ratio 7/ SNR 1 01 31 dB Signal to noise ratio 8/ SNR 1 01 40 dB See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without l
31、icense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89900 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions 1/ -55C TA+125C Group A subgroupsDevice type
32、 Limits Unit unless otherwise specified Min Max DIGITAL OUTPUTS 4/ Logic “1” voltage VD11, 2, 3 01 -1.1 V Logic “0” voltage VD01, 2, 3 01 -1.5 V POWER SUPPLY 9/ Positive supply current +IS+VS= +5.0 V 1 01 70 mA 2, 3 75 Negative supply current -IS-VS= -5.2 V 1 01 80 mA 2, 3 85 1/ Supply voltages are:
33、 +VS= +5.0 V and VS= -5.2 V and differential reference voltage = 2.0 V unless otherwise stated. 2/ Under normal operating conditions, the analog input voltages should not exceed nominal 2 V operating range, nor the supply voltages (+VSand VS), whichever is smaller. 3/ Under normal operating conditio
34、ns, the differential reference voltage may range from 0.5 V to 2 V; +VREF -VREF. 4/ Output terminated with 100 resistors to -2.0 V. 5/ Measured from the leading edge of ENCODE to data out on bit 1 (MSB). 6/ Measured from the trailing edge of ENCODE to data out on bit 1 (MSB). 7 RMS signal to RMS noi
35、se, with 540 kHz analog input signal. 8/ Peak-to-peak signal to RMS noise, with 540 kHz analog input signal. 9/ Supply voltage should remain stable within 5% for normal operation. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT
36、DRAWING SIZE A 5962-89900 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Case outline E 3 Device type 01 Terminal number Terminal symbol 1 -VS-VS2 AGND NC 3 VHAGND 4 ENCODE NC 5 -VREFNC 6 AINVH7 +VSENCODE 8 +VREFNC 9 BIT 6 (LSB) NC 10 BIT 5 -V
37、REF11 BIT 4 NC 12 BIT 3 NC 13 BIT 2 NC 14 BIT 1 (MSB) AIN15 OVERFLOW +VS16 DGND +VREF17 - - - NC 18 - - - NC 19 - - - BIT 6 (LSB) 20 - - - BIT 5 21 - - - BIT 4 22 - - - BIT 3 23 - - - BIT 2 24 - - - BIT 1 (MSB) 25 - - - OVERFLOW 26 - - - NC 27 - - - NC 28 - - - DGND FIGURE 1. Terminal connections. P
38、rovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89900 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. A certificate of com
39、pliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements
40、 of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA s
41、hall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of
42、the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance ins
43、pection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upo
44、n request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except
45、 interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Final electric
46、al test parameters (method 5004) 1*, 2, 3, 4, 9 Group A test requirements (method 5005) 1, 2, 3, 4, 9 Groups C and D end-point electrical parameters (method 5005) 1 * PDA applies to subgroup 1. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD
47、 MICROCIRCUIT DRAWING SIZE A 5962-89900 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D in
48、spections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 5, 6, 7, 8, 10 and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 4 (CAINmeasurement only) shall be measured only for the initial test and after process or design changes which may affect analog input capacitance. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in t
