1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing. 06-07-17 Raymond Monnin REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY M
2、ichael C. Jones POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, DIGITAL-LINEAR, 12-BIT, ANALOG TO DIGITAL CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPR
3、OVAL DATE 95-11-22 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-92039 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E557-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92039 DEFENSE SUPPLY CENTER COLU
4、MBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Id
5、entifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 92039 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.
6、2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
7、 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 CLC935B 12-bit A/D converter, 15 MSPS 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All l
8、evels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This lev
9、el is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-
10、Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exc
11、eption(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class
12、 Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 4
13、0 Dual-in-line 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92039 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISIO
14、N LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltages: +VCC. -0.5 V dc to +7.0 V dc -VEE+0.5 V dc to -7.0 V dc V1-0.5 V dc to +18.0 V dc V2+0.5 V dc to -18.0 V dc Analog input voltage range -VEEto +VCCGain and offset adjust voltage range . -VEEto +VCC Digital input
15、 voltage range . +0.5 V to -VEEOutput short circuit duration (pin 1 to GND). Infinite Differential voltage between any two GNDs. 200 mV Power dissipation (PD) . 5.5 W Thermal resistance (case-to-ambient): (CA, still air) 16C/W (CA, 500 LFPM air flow). 7C/W Junction temperature (TJ) +175C Junction-ca
16、se temperature rise 16C Storage temperature -65C to +150C Lead temperature (soldering, 10 seconds) +300C 1.4 Recommended operating conditions. Supply voltages: +VCC. +4.75 V dc to +5.25 V dc -VEE-4.94 V dc to -5.46 V dc V1+14.25 V dc to +15.75 V dc V2-14.25 V dc to -15.75 V dc Analog input voltage r
17、ange full scale . 1.0 V Digital input voltage range . -2.0 V to 0 Differential input voltage between any two GNDs 10 mV Case operating temperature range (TC). -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and han
18、dbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STA
19、NDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are avai
20、lable online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references
21、cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the max
22、imum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92039 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 22
23、34 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Q
24、uality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modificat
25、ion in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outlin
26、e(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Timing diagram(s). The timing diagram(s) shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified
27、 herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup
28、 are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requ
29、irements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manu
30、ally tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from
31、a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required i
32、n MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modificat
33、ion in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall
34、 be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specifi
35、ed in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the ma
36、nufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92039 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance charac
37、teristics. Limits Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Device type Min Max Unit +ICC +VCC= +5.0 V, no load, 15 MSPS 2/ 1,2,3 01 175 mA -IEE -VEE= -5.2 V, no load, 15 MSPS 2/ 1,2,3 01 -750 mA I1 V1= +15.0 V, no load, 15 MSPS 2/ 1,2,3 01 20 mA Supply cur
38、rents I2 V2= -15.0 V, no load, 15 MSPS 2/ 1,2,3 01 -35 mA Digital input current logic low IIL VIL= -1.5 V 3/ 1,2,3 01 1.0 mA Digital input current logic high IIH VIH= -1.1 V 3/ 1,2,3 01 1.0 mA Digital output voltage logic low VOLIOL= 1 mA 3/ 1,2,3 01 -1.5 V Digital output voltage logic high VOHIOH=
39、1 mA 3/ 1,2,3 01 -1.1 V Digital input voltage logic low VINLIOL= 1 mA 3/ 1,2,3 01 -1.5 V Digital input voltage logic high VINHIOH= 1 mA 3/ 1,2,3 01 -1.1 V 1 25 Analog input bias current IIB3/ 2,3 01 45 A Differential linearity error DLE DC, FS 3/ 4,5,6 01 1 LSB Integral linearity error INL DC, FS 3/
40、 4,5,6 01 3 LSB 4 15 Offset error magnitude VIO3/ 5,6 01 30 mV Gain error AE 3/ 4,5,6 01 5.0 % FS See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92039 DEFENSE SUPPLY CENTER COL
41、UMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Device type Min Max Unit 4 63 SNR2 f = 4.98 MHz, FS - 1 dB, 15 MSPS
42、2/ 5,6 01 61 dB 4 63 Signal-to-noise ratio SNR3 f = 7.22 MHz, FS - 1 dB, 15 MSPS 2/ 5,6 01 61 dB 4 -70 IBH2 f = 4.98 MHz, FS - 1 dB, 15 MSPS 2/ 5,6 01 -64 dBc 4/ 4 -68 In-band harmonics IBH3 f = 7.22 MHz, FS - 1 dB, 15 MSPS 2/ 5,6 01 -62 dBc 4/ Missing codes MC 3/ 4,5,6 01 0 codes Maximum conversion
43、 rate CRMAX3/ 9,10,11 01 15 MSPS 2/ Minimum conversion rate CRMIN3/ 9,10,11 01 0 MSPS 2/ 9 4 Data hold time tHLD3/ 10,11 01 3 ns 1/ +VCC= +5 V dc, V1= +15 V dc, V2= -15 V dc, and -VEE= -5.2 V dc, unless otherwise specified. 2/ MSPS is defined as megasamples per second. 3/ Parameter shall be tested a
44、s part of device initial characterization and after design and process changes which will affect this parameter. Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. 4/ dBc is a standard reference for a signal, referenced to an input signal level. Pr
45、ovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92039 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Case outline X. FIGURE 1. Case outline(s). Provided
46、by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92039 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Case outline X - Continued. Millimeters Inches Notes Symbol
47、 Min Max Min Max A 5.03 6.49 .198 .252 A1 4.01 4.88 .158 .192 b 0.41 0.51 .016 .020 b1 1.02 1.52 .040 .060 c 0.23 0.30 .009 .012 D 52.71 53.72 2.074 2.115 D1 48.13 48.39 1.895 1.905 D2 0.13 .005 e 2.54 BSC .100 BSC 4 E 27.81 28.07 1.095 1.105 E1 27.71 27.96 1.091 1.101 5 L 4.32 4.57 .170 .180 L1 4.7
48、0 6.35 .185 .250 Q 0.38 1.78 .015 .070 8 NOTES: 1. The U. S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units will shall rule. 2. Pin numbers are for reference only. 3. Index area; a notch or a pin one identification mark shall be located adjacent to pin one and shall be located within the sh
