1、SHD-5b2-922b7 REV B b 0090398 T84 m DEFENSE LOGISTICS AGENCY DEFENSE SUPPLY CENTER, COLUMBUS POST OFFICE BOX 3990 COLUMBUS, OH 43216-5000 NOV i 3 l996 IN REPLY REFER TO DSCC-VAC (Mr. T. Nguyen/(DSN)850-067 1/614-692-067 l/tvn) SUBJECT: Notice of Revision (NOR) 5962-R029-97 for Standard Microcircuit
2、Drawing (SMD) 5962-92267 Mi1itaqdIndusb-y Distribution The enclosed NOR is approved for use effective as of the date of the NOR. In accordance with MIL-STD- 100 SMD holders should, as a minimum, handwrite those changes described in the NOR to sheet 1 of the subject SMD. After completion, the NOR sho
3、uld be attached to the subject SMD for future reference. Those companies who were listed as approved sources of supply prior to this action have agreed to actions taken on devices for which they had previously provided DSCC a certificate of compliance. This is evidenced by an existing active current
4、 certificate of compliance on file at DSCC with a DSCC record of verbal coordination. The certificate of compliance for these devices is considered concurrence with the new revision unless DSCC is otherwise notified. If you have comments or questions, please contact Thanh Nguyen at (DSN)850-0671/(61
5、4)692-0671. 1 Encl MONICA L. POELKING Chief, Custom Microelectronics Team Federal Recycling Program Printed on Recycled Paper Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-92267 REV B 999999b 0090399 910 W NOTICE OF REVISION (NOR) THIS REV
6、ISION DESCRIBED BELOW HAS BEEN AUTHORIZED FOR THE DOCUMENT LISTED. 1. DATE (YYMMDD) Form Approved 96-1 0-1 7 OMB No, 07060188 andmakitan mdatnneeded andng add “B. Revisions desuiption column; add “Changes in accordance with NOR 5962-R029-97“. Revisions date column; add “96-10-1 7“. Revision level bl
7、ock; change from “A“ to “W. Rev status of sheets; for sheet 1. change from “A“ to “B. For sheet 6, add “B. Table I, output short circuit current, 10s; change maximum limit from “-225 mA“ to “-250 mA“. Revision level block: add “B. e. SIGNATURE f. DATE SIGNED (YYMMDD) Monica L. Poelking 96-1 0-1 7 b.
8、 REVISION COMPLETED (Signature) c. DATE SIGNED (YYMMDD) Thanh V. Nguyen 96-1 0-1 7 I DD Fom 1695, APR 92 Previous editions are obsolete. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE LOGISTICS AGENCY DEFENSE ELECTRONICS SUPPLY CENTER DAYTON
9、. OH 45444-5765 e. %h7 gr o 68- 28 UCT 1994 I RERY REFER ,o DESC-ELDC (Mr. Nguyen/(AV 986) 513-2966023/tvn) SUBJECT: Notice of Revision (NOR) 5962-R284-94 for Standardized Military Drawing (SMD) 5962-92267 Military/Industry Distribution The enclosed NOR is approved for use effective as of the date o
10、f the NOR. In accordance with MIL-STD-100 SMD holders should, as a minimum, handwrite those changes described in the NOR to sheet 1 of the subject SMD. After completion, the NOR should be attached to the subject SMD for future reference. Those companies who were listed as approved sources of supply
11、prior to this action have agreed to actions taken on devices for which they had previously provided DESC a certificate of compliance. This is evidenced by an existing active current certificate of compliance on file at DESC along with a DESC record of verbal coordination. The certificate of complian
12、ce for these devices is considered concurrence with the new revision unless DESC is otherwise notified. If you have comments or questions, please contact Thanh Nguyen at (AV)986-6023 or (513)296-6023. 1 Encl J MONICA L. POELKING Chief, Custom Microelectronics Branch Provided by IHSNot for ResaleNo r
13、eproduction or networking permitted without license from IHS-,-,-9999996 005b849 740 NOTICE OF REVISION (NOR) This revision described belou has been authorized for the document listed. Form Approved MB No. 07044188 I. DATE (YYMMDD) 94-10-13 ACTIVITY NUMBER LISTED IN ITEH 2 OF THIS FORH. 9. TITLE OF
14、DOCUMENT MICROCIRCUIT, DIGITAL, FAST CMOS, 20-BIT NONINVERTING BUFFER/LINE DRIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SUING, MONOLITHIC SILICON 2. PROCURING ACTIVITY NO. I 11. ECP NO. IO. REVISION LETTER a. CURRENT b. NEU N/A Initial A 3. DODMC r a. (X one) b.
15、ADDRESS (Street, City, State, Zip Code) 6. NOR No. 5%2-R284-94 8. DOCUMENT NO. 5962-92267 4. ORIGINATOR Defense Electronics Supply Center 1507 Uilmington Pike Dayton, OH 45444-5765 a. TYPED NAHE (First, Middle Initial, Last) X (1) Existing document supplemented by the NOR may be used in manufacture.
16、 (2) Revised document must be received before manufacturer may incorporate this change. (3) Custodian of master document shall make above revision and furnish revised document. DESC-ELDC Sheet 1: Revisions ltr column; add “A“. Revisions description column; add “Changes in accordance with NOR 5962-R2
17、84-94“. Revisions date column; add “94-10-13“. Revision level block; add “A“. Rev status of sheets; for sheets 1, 7, and IO, add “A“. Table I, lou level ground bounce noise, VoLp, maxiauai limits column; add “2300“. Table I, low level ground bounce noise, VoLv, maximum limits column; add “-2650“. Ta
18、ble I, high level Vcc bounce noise, Vwp, maximum limits column; add “950“. Table I, high level Vcc bounce noise, VOHV, maximum limits column; add “-700“. Revision level block; add “A“. Sheet 7: Sheet IO: Table I, footnote E/; delete last paragraph. Revision level block; add “A“. Monica L. Poelking d
19、. TITLE Chief, Custom Hicroelectronics 15a. ACTIVITY ACCOHPLISHING REVISION DESC-ELDC e. SIGNATURE f. DATE SIGNED (YYMMDD) Honica L. Poelking 94-10-13 b. REVISION COMPLETED (Signature) c. DATE SIGNED ( YYMHDD ) Thanh V. Nguyen 94-10-13 DD Fori 1695, APR 92 Previous editions are obsolete Provided by
20、IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-LTR DESCRIPTION DATE (YR-MO-DA) SHEET REV STATUS OF SHEETS APPROVED PMIC N/A STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A )ES
21、C FORM 193 JUL 91 DISTRIBUTION STATEMENT A. PREPARED BY Thanh V. Nguyen CHECKED BY Thanh V. Nguyen APPROVED BY tbnica L. Poelking DRAWING APPROVAL DATE 94-09-01 REVISION LEVEL DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 MICROCIRCUIT, DIGITAL, FAST CMOS, 20-BIT NONINVERTING BUFFER/LINE TTL C
22、OMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON DRIVER WITH THREE-STATE OUTPUTS, I SIZE I CAGE CODE A 67268 5962-92267 SHEET 1 OF 19 Approved for public release; distribution is unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from
23、 IHS-,-,-W 9999996 0056851 3T9 W SIZE STANDARD A MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL 1- SCOPE 5962-92267 SHEET 2 1.1 m. This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). TWO product assurance classes
24、consisting of military high reliability (device classes Q and Hl and space application (device class VI, and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunctio
25、n with compliant non-JAN devices“. available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. Device class M microcircuits represent non-JAN class E microcircuits in accordance with When 1.2 m. The PIN shall be as shown in the following example: I T I T I T 92267 I +Y
26、- I I I Case Lead Devi ce Devi ce RHA Federa 1 stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) I Drawing number 1.2.1 RHA desimator. Device class M RHA marked devices shall meet the MIL-2-38535 appendix A specified
27、RHA levels and shall be marked with the appropriate RHA designator. MIL-1-38535 specified RHA levels and shall be marked with the appropriate RHA designator. non-RHA device. Device classes Q and V RHA marked devices shall meet the A dash (-1 indicates a 1.2.2 Device type(s). The device typds) shall
28、identify the circuit function as follows: Device type Generic number Circuit function o1 54FCT16827AT 20-bit noninverting buffer/line driver with three-state outputs, TTL compatible inputs and Limited output voltage swing 02 54FCT16827BT 20-bit noninverting buffer/line driver with three-state output
29、s, TTL compatible inputs and limited output voltage swing 03 54FCT16827CT 20-bit noninverting buffer/line driver with three-state outputs, TTt compatible inputs and limited output voltage suing 1.2.3 Device class desiqnator. The device class designator shall be a single letter identifying the produc
30、t assurance level as follows: Device class Device requirements documentation n Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-999
31、.1996 005bh52 235 = SIZE STANDARD A MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL 1.3 Absolute maximum ratings. I/ g/ I/ 1 5962-92267 SHEET 3 Supply voltage range (V c) - - - - - - - - - - - - - - - - - - DC input voltage range VIN) - - - - - - - - - - - -
32、- - - - - DC output voltage range (Vo T) - - - - - - - - - - - - - - - - DC input clamp current (I Y (VIN = -0.5 V 1 - - - - - - - - - DC output clamp current (i and the absolute value of the magnitude, not the sign, is relative to the minimum and maximum limits, as applicable, listed herein. limits
33、 specified in table I at 4.5 VI Vcc 55.5 V. $1 This parameter is guaranteed, if not tested, to the limits specified in table I herein. - 5/ Three-state output conditions are required. e/ This test may be performed using VIH = 3.0 V. I/ Not more than one output should be tested at a time. g/ For IoFF
34、 testing, test each input and output. ?/ ICCD may be verified by the following equation: All devices shall meet or exceed the When VI, = 3.0 V is used, the test is guaranteed for VIH = 2.0 V. The duration of the test should not exceed one second. STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUP
35、PLY CENTER DAYTON, OHIO 45444 ICCT - Icc - DHNTAICC fCp/2 + fiMi ICCD = SIZE A 5962-92267 REVISION LEVEL SHEET 9 where ICCT, Icc (Icc or ICCH in table I), and AIc device under test, when tested as described in tabfe I, herein. The values for DH, NT, fCp, fi, and Ni shall be as listed in the test con
36、ditions column for ICCT in table I, herein. - IO/ This test may be performed either one input at a time (preferred method) or with all input pins simultaneousty at VIV = Vcc - 2.1 V (alternate method). using the alternate test method, the maximum limit is equal to the number of inputs at a high TTL
37、input level times 1.5 mA; and the preferred method and limits are guaranteed. shall be the measured values of these parameters, for the Classes Q and V shalt use the preferred method. When the test is performed - Il/ ICCT is calculated as follows: ICCT = Icc + D H N T AI cc + ICCD(CP/ + fiNi) where
38、I Dkc= Duty cycle for TTL inputs at 3.4 V N = Number of TTL inputs at 3.4 V AIcc = Quiescent supply current delta, TTL inputs at 3.4 V IccD-= Dynamic power supply current caused by an input transition pair (HLH or LHL) fCP - Clock frequency for registered devices (fCp = O for nonregistered devices)
39、fi = Input frequency Ni = Number of inputs at fi = Quiescent supply current (any IccL or ICCH) G/ This test is required only for group A testing; see 4.4.1 herein. JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-9999996 0056859 b9T SIZE STANDA
40、RD A MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISXON LEVEL TABLE I. Electrical performance characteristics - Continued. output and are used to measure the magnitude of insuced noise caused by other simultaneously switching outputs. The test is performed on a low no
41、ise bench test fixture. with SOCK2 of load resistance and a minimurn of 50 pF of load capacitance (see figure 4). resistors shall be used. It is suggested, that henever possible, this distance be kept to less than 0.25 inches. shall be placed in parallel from Vcc to ground. the device manufacturer.
42、a 1 GHz minimum bandwidth oscilloscope with a 5062 input impedance. The device inputs shall be conditioned such that all outputs are at a high nominal VOH level. The device inputs shall then be conditioned such that they switch simultaneously and the output under test remains at V other outputs poss
43、ible are switched from VoH to VOL: Vm and VOHP are then measured from the nominafHVo, level to the largest negative and positive peaks, respectively Ysee figure 4). outputs not under test switching from VOL to VoH. The device inputs shall be conditioned such that all outputs are at a lou nominal VOL
44、 level. shail then be conditioned such that they switch simultaneously and the output under test remains at V other outputs possible are switched from VOL to VOH: VoLp and vOLv are then measured from the nominaPLVOL level to the largest positive and negative peaks, respectively (see figure 4). outpu
45、ts not under test switching from VOH to VOL- The Vcc and ground bounce tests were not completed at the date of this drawing. shall be added by revision no more than 90 days from the date of this drawing. - 13/ This test is for qualification only. Ground and V bounce tests are performed on a non-swit
46、ching (quiescent) For the device under test, all outputs shall be loaded Only chip capacitors and The output load components shall be located as close as possible to the device outputs. Decoupling capacitors The values of these decoupling capacitors shall be deternined by The low and high level grou
47、nd and Vcc bounce noise is measured at the quiet wtput using as all This is then repeated with the same The device inputs as all This is then repeated with the same The limits for these parameters - 141 Tests shall be performed in sequence, attributes data only. Functional tests shall include the tr
48、uth table and All possible input to output logic patterns per function other logic patterns used for fault detection. minimum, test all functions of each input and output. shall be guaranteed, if not tested, to the truth table in figure 2 herein. sequence as approved by the qualifying activity on qu
49、alified devices. propagation defay time limits for Vc = 4.5 V and 5.5 V are guaranteed, if not tested, to the fimits specified in table I, herein. The test vectors used to verify the truth table shall, at a Functional tests shall be performed in For outputs, L 1.5 V, H 2 1.5 V. - 151 AC limits at V = 5.5 V are equal to the limits at Vcc = 4.5 V and guaranteed by testing at V 1 4.5 V. Minimum For propagation defay tests, all p
