1、SQD-5962-94523 REV A m 9999996 0089Li38 708 m DEFENSE LOGISTICS AGENCY DEFENSE SUPPLY CENTER COLUMBUS 3990 EAST BROAD STREET COLUMBUS, OH 4321 6-5000 IN REPLY REFER TO: DSCC-VAC (Mr. Gauder/(DSN)8504545/614-6924545) OCT 2 3 l996 SUBJECT: Notice of Revision (NOR) 59624209-96 for Standard Microcircuit
2、 Drawing (SMD) 5962-94523. Military/Industry Distribution The enclosed NOR is approved for use effective as of the date of the NOR. In accordance with MIL-STD-100 SMD holders should, as a minimum, handwrite those changes described in the NOR to sheet 1 of the subject SMD. After completion, the NOR s
3、hould be attached to the subject SMD for future reference. Those companies who were listed as approved sources of supply prior to this action have agreed to actions taken on devices for which they had previously provided DSCC a certificate of compliance. This is evidenced by an existing active curre
4、nt certificate of compliance on file at DSCC with a DSCC record Df verbal coordination. The certificate of compliance for these devices is considered concurrence with the new revision unless DSCC is otherwise notified. If you have comments or questions, please contact Larry T. Gauder at (DSN)8504545
5、/(614)6924545. 1 Encl Monica L. Poeikhg Chief, Custom Microelectroncs Branch Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-94523 REV A m 999999b 0089437 b44 m I I 3. TITLE OF DOCUMENT MICROCIRCUIT, DIGITAL, CMOS, 16 X 16 BIT PARALLEL MULTI
6、PLIER, MONOLITHIC SILICON IO. REVISION LETTER a. CURRENT b. NEW Initial A NOTICE OF REVISION (NOR) 11. ECP NO. 1. DATE I (WMMDD) b. ACTIVITY AUTHORIZED TO APPROVE CHANGE FOR GOVERNMENT DSCC-VAC 96-09-25 I OMB Ni 0704-0188 THIS REVISION DESCRIBED BELOW HAS BEEN AUTHORIED FOR ME DOCUMENT LISTED. I c.
7、TYPED NAME (First, Middle Initial, Last) Monica L. Poelking 3990 East Broad Street Columbus, OH 43216-5000 I. TYPED NAME (First, Middle Initial, Last) b. REVISION COMPLETED (Signature) Larry T. Gauder 7. CAGE CODE 8. DOCUMENT NO. I 67268 I 5962-94523 c. DATE SIGNED (YYMMD 0) 96-09-25 Sheet 1: Revisi
8、ons ltr colum; add iiA1i. Revisions description coluni; add “Changes in accordance ui th NOR 5962-R2D9-96”. Revisions date colum; add 11%-09-251B. Revision Level block; add Rev status of sheets; for sheet 1 and 6, add IBAa4. TABLE I, Clutput voltage, high VOH, delete Il3.5 V Minll and substitute “2.
9、4 V Mint1. Revision level block; add IaA4l. Sheet 6: 14. THIS SECTION FOR GOVERNMENT USE ONLY (1) Existing document supplemented by the NOR may be used in manufacture. (2) Revised document must be received before manufacturer may incorporate this change. (3) Custodian of master dowment shall make ab
10、ove revision and furnish revised document. d. TITLE Chief, Custom Microelectronics 15a. ACTIVITY ACCOMPLISHING REVISION DSCC-VAC DD Form 1695, APR 92 e. SIGNATURE Monica L. Poelking f. DATE SIGNED (YYMMDD) I 96-09-25 Provided by IHSNot for ResaleNo reproduction or networking permitted without licens
11、e from IHS-,-,-LTR DESCRIPTICN PREPARED BY Thomas M. Hess “ED WTE (YR-MO-DA) CHECKED BY Thomas M. Hess REV S?r Fw =ET APPROVED BY Monica L. Poelking 11 56 DRAUING APPROVAL DATE 94 - 04 - 27 REVISION LEVEL MICROCIRCUIT, DIGITAL, 16 X 16 BIT PARALLEL MULTIPLIER MONOLITHIC SILICON A IZ2z I 5962-94523 S
12、HEET 1 OF 16 5962-EO these tests shall have been fault graded in accordance with MIL-STD-883, test method 5012 (see 1.5 herein). Subgroup 4 (Cnr measurements) shall be measured only for the initial test and after design changes which may affect capacitance. For device classes c. A minimun sarrple si
13、ze of 5 devices with zero rejects shall be required. 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table 11 herein. 4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883: a. Test condi
14、tion A, 6, C, or D. The test circuit shall be maintained by the manufacturer under docunent revision level control and shall be made available to the preparing or acquiring activity upon request. test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accorda
15、nce with the intent specified in test method 1005. The b. TA = +125C, minim. c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. SIZE 5962-94523 A DAYTON, OHIO 45444 I 14 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-S
16、MD-5962-94523 9999996 O060888 945 M i nt er i m e 1 ec t r i ca 1 parameters (see 4.2) Final electrical parameters (see 4.2) TABLE II. Electrical test reauirements. I I I I 1,7,9 18789 18789 1/ 1/ 11 8 2, 38 78 88 1, 2, 3, 7, 9, 10, 11 9, 10, 11 8, 9, 10,ll 1, 2, 3, 7# 8 Test requirements Group A te
17、st requirements (see 4.4) Subgroups (in accordance with (in accordance uith MIL-STO-883, MIL-1-38535, table III) Devi ce Device Device class M class 9 class V 1, 2. 3, 4, 7, 1, 2, 3, 4, 7, 1, 2. 3. 4, 7 8, 9, 10, 11 8, 9, 10, 11 8, 9, 10, 11 Group C end-point electrical parameters (see 4.4) I I I I
18、I l I 1.7,9 18789 1.7,9 Group E end-point electricat parameters (see 4.4) I I I I I I I I 1,7,9 1,7,9 1#789 I I I I I I I Group D end-point electrical 1,7,9 I 1,7,9 I 1,7,9 I parameters (see 4.4) 4.4.2.2 Additional criteria for device classes P and V. The steady-state life test duration, test condit
19、ion and test temperature, or approved alternatives shall be as specified in the device manufacturers Pn plan in accordance uith MIL-1-38535. manufacturers TRB, in accordance with MIL-1-38535, and shall be made available to the acquiring or preparing activity upon request. accordance uith the intent
20、specified in test method 1005. The test circuit shall be maintained der docunent revision level control by the device The test circuit shall specify the inputs, outputs, biases, and pouer dissipation, as applicable, in 4.4.3 Grour, D inspection. The group D inspection end-point electrical parameters
21、 shall be as specified in table II herein. 4.4.4 Grour, E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). M shall be M and D. RHA levels for device classes P and V shall be M, D, R, and H and for device class a. b. End-p
22、oint electrical parameters shall be as specified in table II herein. For device class M, the devices shall be subjected to radiation hardness assured tests as specified in MIL-1-38535, appendix A, for the RHA Level being tested. vehicle shall be subjected to radiation hardness assured tests as speci
23、fied in MIL-1-38535 for the RHA level being tested. defined in table I at TA = +25“C t5“C, after exposure, to the subgroups specified in table II herein. When specified in the purchase order or contract, a copy of the RHA delta limits shall be supplied. For device classes P and V, the devices or tes
24、t All device classes must meet the postirradiation end-point electrical parameter limits as c. STANDARD1 ZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FOFM 1934 Ju 91 5962-94523 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from
25、 IHS-,-,-SND-5962-94523 W 9999996 0060889 88L 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with UIL-STD-883 (see 3.1 herein) for device class U and UIL-1-38535 for device classes P and V. 6. NOTES 6.1 Intended use. Uicrocircuits conforming to this dr
26、awing are intended for use for Govermient microcircuit applications (original equipnent), design applications, and logistics purposes. contractor-prepared specification or drawing. 6.1.1 Repiaceability. Uicrocircuits covered by this drawing will replace the same generic device covered by a 6.1.2 Sub
27、stitutability. 6.2 Configuration control of SUDS. All proposed changes to existing SUDS will be coordinated with the users of record for the individual docunents. This coordination will be accomplished in accordance with UIL-STD-973 using DD Form 1692, Engineering Change Proposal. application requir
28、es configuration control and which SUDS are applicable to that system. DESC will maintain a record of users and this list will be used for coordination and distrikition of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DESC-EC, telephone (513) 2
29、96-6047. Comnents on this drawing should be directed to DESC-EC, Dayton, Ohio 45444-5270, or telephone Device class P devices will replace device class U devices. 6.3 Record of users. Military and industrial users shall inform Defense Electronics Supply Center when a system 6.4 Comnents. (513) 296-5
30、377. 6.5 Abbreviations, smbols. and definitions. The abbreviations, symbols, and definitions used herein are defined in UIL-1-38535 and UIL-STD-1331. 6.6 One part - one Dart nhr system. lhe one part - one part nhr system described below has been developed to allow for transitions between identical g
31、eneric devices covered by the three major microcircuit requirements docwnts (MIL-H-38534, MIL-1-38535, and 1.2.1 of MIL-STD-883) without the necessity for the generation of unique PINS. The three military requirements docunents represent different class levels, and previously when a device manufactu
32、rer upgraded military product from one class level to another, the benefits of the upgraded product were unavailable to the Original Equipment Manufacturer (OEM), that was contractually locked into the original unique PIN. establishing a one part nunber system covering all three documents, the OEU c
33、an acquire to the highest class level available for a given generic device to meet system needs without modifying the original contract parts selection criteria. By Military docunentation format Example PIN Manufacturing Docwnt under new system source listing listing Neu MIL-H-38534 Standardized Uil
34、itary 5962-XXXXXZZ(H or K)YY PUL-38534 Drawings Neu MIL-1-38535 Standardized Uilitary 5962-XXXXXZZ(Q or WYY PML-38535 Draui ngs U i L- BUL- 1 O3 U I L-BUL- 103 Neu 1.2.1 of MIL-STD-883 Standardized 5962-XXXXXZZ(M)YY UIL-BUL-103 U1 L -BUL- 1 O3 Military Drawings 6.7 Sources of supply. 6.7.1 QML-38535
35、. have agreed to this drauing. Sources of supply for device classes Q and V. Sources of supply for device classes P and V are listed in The vendors listed in UL-38535 have submitted a certificate of conpliance (see 3.6 herein) to DESC-EC and 6.7.2 Approved sources of supcly for device class M. Appro
36、ved sources of supply for class M are Listed in MIL-BUL-103. herein) has been submitted to and accepted by DESC-EC. The vendors listed in UIL-BUL-103 have agreed to this drawing and a certificate of compliance (see 3.6 STNDARLlI ZED SIZE 5962-94523 MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTE
37、R DAYTON, OHIO 45444 WlSiaULR/EL WET 16 Esc m 193 Ju 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- SMD-5962-94523 = 9999996 0060890 5T3 STANDARDIZED MILITARY DRAWING SOURCE APPROVAL BULLETIN DATE: 94-04-27 Approved sources of supply for SMD 596
38、2-94523 are listed below for imnediate acquisition only and shall be added to MIL-BUL-103 during the next revision. The vendors listed below have agreed to this drawing and a certificate of corrpliance has been submitted to and accepted by DESC-EC. MIL-BUL-103 will be revised to include the addition
39、 or deletion of sources. This bulletin is superseded by the next dated revision of MIL-BUL-103. Standardized Vendor Vendor ;I:itary drawing 1 Er simi lar PIN lJ 5962-9452301MXX 65896 LMU18UB45 - I/ Caution. Do not use this nuber for item acquisition. may not satisfy the performance requirements of t
40、his drawing. items acquired to this nunber Vendor CAGE nunber 65896 Vendor name and address Logic Devices Incorporated 628 E. Evelyn Avenue Sunnyvale, CA. 94086 The information contained herein is disseminated for convenience only and the Govermnt assunes no liability uhatsoever for any inaccuracies in this information bulletin. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-
