1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing to current requirements of MIL-PRF-38534. 05-07-26 Raymond Monnin B Updated drawing paragraphs to MIL-PRF-38534 requirements. -sld 13-12-10 Charles F. Saffle REV B B B B B B B B B B B SHEET 35 36 37 38 39 40 41 42 43 44 45 REV B B
2、B B B B B B B B B B B B B B B B B B SHEET 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Steve L. Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmari
3、time.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, MIL-STD-1553/1760 PROTOCOL, DUAL REDUNDANT, REMOTE TERMINAL UNIT, +5 VOLT SUPPLY AND AGENCIES OF THE DEPARTMENT
4、OF DEFENSE DRAWING APPROVAL DATE 98-08-06 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-95539 SHEET 1 OF 45 DSCC FORM 2233 APR 97 5962-E077-14 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95539 DLA
5、 LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in
6、the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 95539 01 H X C Federal RHA Device Device Case Lead stock class designator type class outline finish desi
7、gnator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a n
8、on-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 RTM1760 MIL-STD-1553/1760 protocol, dual redundant, +5 volt supply, monolithic transceivers, remote terminal with 4k x 16 RAM 02 RTS1760 MIL-STD-1553/1760
9、protocol, dual redundant, +5 volt supply, monolithic transceivers, remote terminal with DMA controller 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require
10、 QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military
11、quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, man
12、ufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exceptio
13、n(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML cer
14、tified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95539 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 AP
15、R 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 96 Flat package Y See figure 1 100 Pin grid array 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
16、1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) -0.3 V dc to +7.0 V dc Storage temperature range -65C to +150C Lead soldering temperature (10 seconds) . +265C Receiver differential voltage . 19.0 V p-p Power dissipation (PD) TC = +125C 680 mA (100% duty cycle) 1.4 Recommended operating c
17、onditions. Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Minimum high level input voltage (VIH) +2.2 V dc Maximum low level input voltage (VIL) . +0.7 V dc Case operating temperature range (TC). -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The fol
18、lowing specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Spec
19、ification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawi
20、ngs. (Copies of these documents are available online at http:/quicksearch.dla.mil/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references c
21、ited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maxi
22、mum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95539 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97
23、3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Manag
24、ement (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the Q
25、M plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall b
26、e in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Block diagram. The block diagram shall be as specified on figure 3. 3.2.4 Timing waveform(s). The timing waveform(s) shall be as specified on figure 4. 3.3 El
27、ectrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgrou
28、ps specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also
29、be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein
30、. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request.
31、3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of
32、MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with
33、MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRC
34、UIT DRAWING SIZE A 5962-95539 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TC +125C +4.5 V dc VCC +5.5 V dc unless otherwise specified Group A subgroups Device type Limit
35、s Unit Min Max Input voltage high 2/ 4/ VIH VCC = 5.5 V, IIH 30 A 1,2,3 All 2.2 V Input voltage low 2/ 4/ VIL VCC = 5.5 V, IIL 30 A 1,2,3 All 0.7 V Low level output current 2/ 5/ IOL VCC = 5.5 V, VOL 0.4 V 1,2,3 All 6 mA High level output current 2/ 5/ IOH VCC = 5.5 V, VOH 2.7 V 1,2,3 All 6 mA Suppl
36、y current 6/ ICCA/B Standby 25% duty cycle 50% duty cycle 3/ 100% duty cycle 3/ 1,2,3 All 5 70 140 300 50 220 375 750 mA Supply current 7/ ICCC Standby or transmitting 1,2,3 All 5 60 mA Supply current 8/ ICCD Standby or transmitting 1,2,3 01 10 750 A RECEIVER Differential input 2/ impedance ZINDIFF
37、Measured through transformer (stub coupled ) in accordance with MIL-STD-1553 4,5,6 All 1 k Input threshold VTH1 Transformer coupled, (across 70 load) 4,5,6 All 0.86 Vp-p Input threshold 3/ VTH2 Direct coupled, (across 35 load) 4,5,6 All 1.2 Vp-p Common mode voltage 3/ VCM Measured through transforme
38、r in accordance with MIL-STD-1553 4,5,6 All 10 V TRANSMITTER Differential output voltage VODIFF1 Transformer coupled, (across 70 load) 4,5,6 All 20 27 Vp-p Differential output voltage 3/ VODIFF2 Direct coupled, (across 35 load) 4,5,6 All 6 9 Vp-p Output offset VOFF Measured 2.5 s after last zero cro
39、ssing 4,5,6 All 250 mV Output rise and fall times tr, tf Transformer coupled, (across 70 load), 10% to 90% of full waveform pk-pk 9,10,11 All 100 300 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRC
40、UIT DRAWING SIZE A 5962-95539 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TC +125C +4.5 V dc VCC +5.5 V dc unless otherwise specified Group A subgroups Devic
41、e type Limits Unit Min Max LOGIC ADDRESS valid to CS low setup time 2/ 9/ td1 Host write or read to/from RAM or control blocks 9,10,11 01 0 ns R/W valid to CS low setup time 2/ td2 Host write or read to/from RAM or control blocks 9,10,11 01 0 ns CS low to DATA in valid 2/ td3 Host write to RAM or co
42、ntrol blocks 2/ 9,10,11 01 35 ns CS low to DTACK low td4 Host write or read to/from RAM - no contention 2/ 9,10,11 01 120 240 ns Host write or read to/from RAM - internal controller performing RAM access, BURST pin = high 3/ 120 690 ns Host write or read to/from RAM - internal controller performing
43、RAM access, BURST pin = low 3/ 0.12 12.0 s DTACK low to CS high hold time 2/ td5 Host write or read to/from RAM or control blocks 9,10,11 01 0 2.0 s DTACK low to ADDRESS invalid hold time 2/ 9/ td6 Host write or read to/from RAM or control blocks 9,10,11 01 0 ns DTACK low to R/W invalid hold time 2/
44、 td7 Host write or read to/from RAM or control blocks 9,10,11 01 0 ns DTACK low to DATA in invalid hold time 2/ td8 Host write to RAM or control blocks 9,10,11 01 0 ns CS high to DTACK high 2/ td9 Host write or read to/from RAM or control blocks 9,10,11 01 40 120 ns DATA out valid to DTACK low td10
45、Host read from RAM or control blocks 2/ 9,10,11 01 20 ns CS high to DATA out invalid hold time 2/ td11 Host read from RAM or control blocks 9,10,11 01 35 ns CS low to DTACK low 2/ td12 Host write or read to/from control blocks 9,10,11 01 90 180 ns See footnotes at end of table. Provided by IHSNot fo
46、r ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95539 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditi
47、ons 1/ -55C TC +125C +4.5 V dc VCC +5.5 V dc unless otherwise specified Group A subgroups Device type Limits Unit Min Max DMAREQ low to DMAGNT low (write) t1 DMA write access 2/ 9,10,11 02 3.5 s DMAGNT low to DMAACK low t2 DMA write or read access 2/ 9,10,11 02 185 ns DMAACK low to DMAGNT high hold
48、time t3 DMA write or read access 2/ 9,10,11 02 0 ns DMAACK low to R/W output enabled t4 DMA write or read access 2/ 9,10,11 02 30 ns DMAACK low to ADDRESS outputs enabled t5 DMA write or read access 2/ 9,10,11 02 35 ns DMAACK low to DATA outputs enabled t6 DMA write access 2/ 9,10,11 02 35 ns DMAACK low to STROBE low (write) t7 DMA write access 2/ 9,10,11 02 110 140 ns STROBE low pulse width (write) t8 DMA write access 2/ 9,10,11 02 235 265 ns STROBE high
