1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add device types 02 and 03. Add case outline C. -rrp 98-05-01 R. MONNIN B Change the limits of test “Input voltage common mode rejection” for device type 03 on table I. Drawing updated to reflect current requirements. - lgt 01-12-28 R. MONNIN C U
2、pdate drawing as part of 5 year review. rrp 06-10-02 R. MONNIN D For device type 03 only, CMRR test, delete 75 dB and replace with 80 dB as specified under Table I. For device type 01 only, case 2 package, pin 5, delete “INPUT” and replace with “INPUT 1” as specified under figure 1. Update boilerpla
3、te paragraphs to current MIL-PRF-38535 requirements. - ro 11-10-06 C. SAFFLE REV SHET REV SHET REV STATUS REV D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY RICK OFFICER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIR
4、CUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAJESH PITHADIA APPROVED BY RAYMOND MONNIN MICROCIRCUIT, LINEAR, DUAL JFET-INPUT OPERATIONAL AMPLIFIER,MONOLITHIC SILICON DRAWING APPROVAL DATE 97-11-04 AMSC N/A REVISION LEVEL D SI
5、ZE A CAGE CODE 67268 5962-98515 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E453-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98515 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2
6、DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying N
7、umber (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 98515 01 Q C A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outlin
8、e (see 1.2.4) Leadfinish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A spe
9、cified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 TL082 Dual JFET-input operational amplifier 02 TL081 Dual JFE
10、T-input operational amplifier 03 TL084 Dual JFET-input operational amplifier 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirement
11、s for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Ter
12、minals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by
13、IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98515 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ Positive supply voltage (+VS) +18 V
14、 Negative supply voltage (-VS) . -18 V Differential input voltage 30 V 3/ Input voltage (VIN) . 15 V 4/ Duration of output short circuit . Unlimited 5/ Total power dissipation (PD) 680 mW 6/ Junction temperature (TJ) +150C Storage temperature range . -65C to +150C Case temperature for 60 seconds (ca
15、se 2 only) 260C Lead temperature 1.6 mm (1/16 inch) from case for 60 seconds +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case C . 120C/W Case P . 180C/W Case 2 . 65C/W 1.4 Recommended operating conditions. Positive supply voltage (+V
16、S) +15 V Negative supply voltage (-VS) . -15 V Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Un
17、less otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits
18、. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or
19、from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ All volta
20、ge values, except differential voltages, are with respect to the midpoint between +VSand -VS. 3/ Differential voltages are at +INPUT with respect to -INPUT. 4/ The magnitude of the input voltage must never exceed the magnitude of the supply or 15 V, whichever is less. 5/ The output may be shorted to
21、 ground or to either supply. Temperature and/or supply voltages must be limited to ensure that the dissipation rating is not exceeded. 6/ For operation above TA= +69C, the derating factor for case P is 8.4 mW/C. For operation above TA= +88C, the derating factor for cases C and 2 is 11.0 mW/C. Provid
22、ed by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98515 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the t
23、ext of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for dev
24、ice classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device
25、class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V o
26、r MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics and postirradiation parameter
27、 limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the s
28、ubgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN is not feasible due to space
29、 limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MI
30、L-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For dev
31、ice classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approve
32、d source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-3853
33、5 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of mic
34、rocircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification a
35、nd review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the
36、reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 49 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCI
37、RCUIT DRAWING SIZE A 5962-98515 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C VS= 15 V Group A subgroups Device type Limits Unit unless otherwise specified Min Ma
38、x Input offset voltage VIORS= 50 , VO= 0 V, 1 01, 02 6 mV 2,3 9 1 03 9 2,3 15 Input offset current 2/ IIOVO= 0 V 1 All 100 pA 2,3 20 nA Input bias current 2/ IIBVO= 0 V 1 All 200 pA 2,3 50 nA Common mode input voltage range VICR1 All 11 V Maximum peak-to-peak VOMRL= 10 k 1 All 12 V output voltage sw
39、ing RL 10 k 2,3 12 RL 2 k 10 Supply current (per amplifier) ISNo load, VO= 0 V 1 All 2.8 mA Large signal differential AVDRL 2 k, VO= 10 V 4 All 25 V/mV voltage amplification 5,6 15 Common mode rejection ratio CMRR VIC= VICRmin, 1 01, 02 80 dB RS= 50 , VO= 0 V 03 80 Supply voltage rejection ratio ( V
40、S/VIO) kSVRVS= 15 V to 9 V, RS= 50 , VO= 0 V 1 All 80 dB Slew rate at unity gain 3/ SR RL= 2 k, CL= 100 pF, VIN= 10 V, measured at 4 All 8 V/s 25 % and 75 % points, VOUT= 2.5 V, see figure 2 5,6 5 1/ Unless otherwise specified, all characteristics are measured under open-loop conditions with zero co
41、mmon-mode input voltage. 2/ Input bias currents of a FET-input operational amplifier are normal junction reverse currents, which are temperature sensitive. Pulse techniques must be used to maintain the junction temperature as close to the ambient temperature as is possible. 3/ If not tested, shall b
42、e guaranteed to the limits specified herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98515 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 Device types 0
43、1 02 03 Case outlines P 2 P 2 C 2 Terminal number Terminal symbol 1 OUTPUT 1 NC OFFSET N1 NC OUTPUT 1 NC 2 -INPUT 1 OUTPUT 1 -INPUT OFFSET N1 -INPUT OUTPUT 1 3 +INPUT 1 NC +INPUT NC +INPUT 1 -INPUT 1 4 -VSNC -VSNC +VS+INPUT 1 5 +INPUT 2 -INPUT 1 OFFSET N2 -INPUT +INPUT 2 NC 6 -INPUT 2 NC OUTPUT NC -
44、INPUT 2 +VS7 OUTPUT 2 +INPUT 1 +VS+INPUT OUTPUT 2 NC 8 +VSNC NC NC OUTPUT 3 +INPUT 2 9 - NC - NC -INPUT 3 -INPUT 210 - -VS- -VS+INPUT 3 OUTPUT 2 11 - NC - NC -VSNC 12 - +INPUT 2 - OFFSET N2 +INPUT 4 OUTPUT 3 13 - NC - NC -INPUT 4 -INPUT 314 - NC - NC OUTPUT 4 +INPUT 3 15 - -INPUT 2 - OUTPUT - NC 16
45、- NC - NC - -VS17 - OUTPUT 2 - +VS- NC 18 - NC - NC - +INPUT 4 19 - NC - NC - -INPUT 420 - +VS- NC - OUTPUT 4 NC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962
46、-98515 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 FIGURE 2. Slew rate waveform. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98515 DLA LAND AND MARITIME
47、COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The
48、modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with meth
