EN 61967-1-2002 en Integrated Circuits - Measurement of Electromagnetic Emissions 150 kHZ to 1 GHz Part 1 General Conditions and Definitions《集成电路 150 kHz至1 GHz电磁辐射的测量 第1部分 一般条件和定义 .pdf
《EN 61967-1-2002 en Integrated Circuits - Measurement of Electromagnetic Emissions 150 kHZ to 1 GHz Part 1 General Conditions and Definitions《集成电路 150 kHz至1 GHz电磁辐射的测量 第1部分 一般条件和定义 .pdf》由会员分享,可在线阅读,更多相关《EN 61967-1-2002 en Integrated Circuits - Measurement of Electromagnetic Emissions 150 kHZ to 1 GHz Part 1 General Conditions and Definitions《集成电路 150 kHz至1 GHz电磁辐射的测量 第1部分 一般条件和定义 .pdf(28页珍藏版)》请在麦多课文档分享上搜索。
1、BRITISH STANDARD Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHi Part 1 : General conditions and de fin it ions The European Standard EN 61967-1:2002 has the status of a British Standard ICs 3 1.200 BS EN 61 967-1 1 2002 IEC 61 967-1 1 2002 present to the responsible E
2、uropean committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. - A list of organizations represented on this committee can be obtained on request to its secreta
3、ry. From 1 January 1997, all IEC publications have the number 60000 added to the old number. For instance, IEC 27-1 has been renumbered as IEC 60027-1. For a period of time during the change over fi-om one numbering system to the other, publications may contain identifiers from both systems. Cros s-
4、r e fer en ces The British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search”faci1ity of the BSI Electronic Catalogue or of
5、 British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprise
6、s a front cover, an inside front cover, the EN title page, pages 2 to 24, an inside back cover and a back cover. The BSI copyright date displayed in this document indicates when the document was last issued. O BSI 2 July 2002 ISBN O 580 39890 O EUROPEAN STANDARD EN 61967-1 NORME EUROPENNE EUROPISCHE
7、 NORM June 2002 ICs 31.200 English version Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 1 : General conditions and definitions (IEC 61 967-1 12002) Circuits intgrs - Mesure des missions lectromagntiques, 150 kHz 1 GHz Partie 1 : Conditions gnrales et dfinitio
8、ns (CE1 61967-1 12002) Integrierte Schaltungen - Mess u n g von el e ktro mag n et isc h e n Aussendungen im Frequenzbereich von 150 kHz bis 1 GHz Teil 1 : Allgemeine Bedingungen und Definitionen (IEC 61967-1 12002) This European Standard was approved by CENELEC on 2002-05-01. CENELEC members are bo
9、und to comply with the CENKENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the C
10、entral Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same
11、 status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CEN
12、ELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels O 2002 CENELEC - All rights of exploitation in any form and by any means reserved w
13、orldwide for CENELEC members. Ref. No. EN 61 967-1 :2002 E Page 2 EN 61967-12002 Foreword The text of document 47A/632/FDIS, future edition 1 of IEC 61967-1, prepared by SC 47A, Integrated circuits, of IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved
14、by CENELEC as EN 61 967-1 on 2002-05-01. The following dates were fixed: - latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement - latest date by which the national standards conflicting with the EN have to be withdrawn
15、 (dop) 2003-02-01 (dow) 2005-05-01 Annexes designated “normative“ are part of the body of the standard. Annexes designated “informative“ are given for information only. In this standard, annex ZA is normative and annexes A, B and C are informative. Annex ZA has been added by CENELEC. Endorsement not
16、ice The text of the International Standard IEC 61967:2002 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated : IEC 61000-4-3 NOTE Harmonized as EN 61000-4-3:1996 (modifie
17、d). IEC 61000-4-6 NOTE Harmonized as EN 61000-4-6:1996 (not modified) IEC 61967-4 NOTE Harmonized as EN 61967-4:2002 (not modified). O BSI 2 July 2002 Page 3 EN 61967-12002 CONTENTS 1 Scope . 5 2 Normative references . 5 3 Definitions . . 6 4 Test conditions . 9 9 4.2 Ambient conditions . O 4.2.1 Am
18、bient temperature . 10 4.2.2 Ambient RF field strength 1 O 4.2.3 Other ambient conditions . 1 O 4.2.4 IC stability over time IO 5 Test equipment . 10 5.1 General . 10 5.2 Shielding . 10 5.3 RF measuring instrument . 5.3.1 Measuring receiver . 5.3.2 Spectrum analyser 5.3.3 Other RBW for narrowband di
19、sturbances 11 5.3.4 Disturbance type, detector type and sweep speed . 11 5.3.5 Video bandwidth 12 5.3.6 Verification of calibration for the RF measuring instrument 12 5.4 Frequency range . 12 5.5 Pre-amplifier or attenuator . 12 5.6 System gain . . 12 5.7 Other components 12 6 Test set-up . 12 6.1 G
20、eneral . 12 6.2 Test circuit . 13 6.3 IC pin loading 13 6.4 Power supply requirements - Test board power supply . 13 6.5 IC specific considerations . . 14 6.5.1 IC supply voltage . 14 6.5.2 IC decoupling . . 14 6.5.3 Activity of IC . 14 6.5.4 Guidelines regarding IC operation 14 7 Test procedure . 1
21、4 7.1 Ambient check . 14 7.2 Operational check . 14 7.3 Specific procedures . 15 O BSI 2 July 2002 Page 4 EN 61967-1:2002 15 15 8 Test report 8.1 General . 8.2 Ambient . 8.3 Description of device . 8.4 Description of set-up . 8.5 Description of software 8.6 Data presentation 8.6.1 Graphical presenta
22、tion 15 8.6.2 Software for data capture 15 8.6.3 Data pro 15 8.8 Interpretation of 16 Comparison between different test methods 15 8.7 RF emission limits 8.8.1 Compari 8.8.2 8.8.3 Correlati 9 General basic test board specification 9.1 Board description - mechanical . 16 9.2 9.3 Ground planes . 9.4 P
23、ins . 9.4.1 DIL pac 9.4.3 PGA, BGA packages 16 17 17 17 Board description - electrical characteristics . 9.4.2 SOP, PLCC, 9.5 Via type . 9.6 Via distance 9.7 Additional components 18 9.7.1 Supply decoupling . 18 9.7.2 I/O load 18 . Annex A (informative) Annex B (informative) Annex ZA (normative) Nor
24、mative references to international publications with their Test method comparison 20 Flow chart of an example counter test code . 21 Annex C (informative) Prescription of a worst-case application software description . 22 corresponding European publications .24 Bibliography . .23 Figure 1 - General
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