搜索
麦多课文库
收藏
下载资源
加入VIP,免费下载
IEC 60235-8A-1974 Measurement of the electrical properties of microwave tubes Part 8 Backward-wave oscillator tubes - 0 type.《微波管电性能的测量 第8部分 O型返波振荡管 补充1》.pdf
上传人:
towelfact221
文档编号:1234122
上传时间:2019-08-24
格式:PDF
页数:2
大小:255.50KB
下载
相关
举报
第1页 / 共2页
第2页 / 共2页
亲,该文档总共2页,全部预览完了,如果喜欢就下载吧!
资源描述
展开
阅读全文
相关资源
IEC TS 62492-1-2008 Industrial process control devices - Radiation thermometers - Part 1 Technical data for radiation thermometers《工业过程控制装置 辐射温度计 第1部分 辐射温度计的技术数.pdf
IEC TR2 61464-1998 Insulated bushings - Guide for the interpretation of dissolved gas analysis (DGA) in bushings where oil is the impregnating medium of the mai.pdf
IEC TR 61241-2-2-1993 Electrical apparatus for use in the presence of combustible dust part 2 test methods section 2 method for determining the electrical resis.pdf
IEC TR 60972-1989 Classification and interpretation of new lighting products《新型照明产品的分类和说明》.pdf
IEC TR 60943 Edition 21-2009 Guidance concerning the permissible temperature rise for parts of electrical equipment in particular for terminals《特殊终端中电气设备部件用关于允许.pdf
IEC TR 60943 AMD 1-2008 Guidance concerning the permissible temperature rise for parts of electrical equipment in particular for terminals Amendment 1《电气设备部件(特别.pdf
IEC TR 60919-2-2008 Performance of high-voltage direct current (HVDC) systems with line-communicated converters - Part 2 Faults and switching《带线性通信转换器的高压直流(HVDC.pdf
IEC TR 60870-6-505 Edition 11-2006 Telecontrol equipment and systems - Part.6-505 Telecontrol protocols compatible with ISO standards and ITU-T recommendations .pdf
IEC TR 60344 CORR1-2012 Calculation of d c resistance of plain and coated copper conductors of low-frequency cables and wires - Application guide Corrigendum 1《.pdf
IEC 62560 CORR1-2012 Self-ballasted LED-lamps for general lighting services by voltage 50 V - Safety specifications Corrigendum 1《普通照明用50 V以上自镇流LED灯 安全要求 勘误表1》.pdf
猜你喜欢
DIN EN 60749-17-2003 Semiconductor devices - Mechanical and climatic test methods - Part 17 Neutron irradiation (IEC 60749-17 2003) German version EN 60749-17 2003《半导体器件 机械和气候试验方法 .pdf
DIN EN 60749-18-2003 Semiconductor devices - Mechanical and climatic test methods - Part 18 Ionizing radiation (total dose) (IEC 60749-18 2002) German version EN 60749-18 2003《半导体器.pdf
DIN EN 60749-19-2011 Semiconductor devices - Mechanical and climatic test methods - Part 19 Die shear strength (IEC 60749-19 2003 + A1 2010) German version EN 60749-19 2003 + A1 20.pdf
DIN EN 60749-2-2003 Semiconductor devices - Mechanical and climatic test methods - Part 2 Low air pressure (IEC 60749-2 2002) German version EN 60749-2 2002《半导体器件 机械和气候试验方法 第2部分 低气.pdf
DIN EN 60749-20-1-2009 Semiconductor devices - Mechanical and climatic test methods - Part 20-1 Handling packing labelling and shipping of surface-mount devices sensitive to the co.pdf
DIN EN 60749-20-2010 Semiconductor devices - Mechanical and climatic test methods - Part 20 Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering.pdf
DIN EN 60749-21-2012 Semiconductor devices - Mechanical and climatic test methods - Part 21 Solderability (IEC 60749-21 2011) German version EN 60749-21 2011《半导体设备 机械和气候试验方法 第21部分 .pdf
DIN EN 60749-22-2003 Semiconductor devices - Mechanical and climatic test methods - Part 22 Bond strength (IEC 60749-22 200 + Corr 1 2003) German version EN 60749-22 2003《半导体器件 机械和.pdf
DIN EN 60749-23-2011 Semiconductor devices - Mechanical and climatic test methods - Part 23 High temperature operating life (IEC 60749-23 2004 + A1 2011) German version EN 60749-23.pdf
相关搜索
IEC602358A1974MEASUREMENTOFTHEELECT
当前位置:
首页
>
标准规范
>
国际标准
>
IEC
copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:
苏ICP备17064731号-1
登录
首页
资源分类
专题
通知公告