BS PD IEC TS 62607-4-2-2016 Nanomanufacturing Key control characteristics Nano-enabled electrical energy storage Physical characterization of cathode nanomaterials density.pdf
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1、Nanomanufacturing Key control characteristics P a r t 4 - 2 : N a n o - e n a b l e d e l e c t r i c a l e n e r g y s t o r a g e P h y s i c a l c h a r a c t e r i z a t i o n o f c a t h o d e n a n o m a t e r i a l s , d e n s i t y m e a s u r e m e n t PD IEC/TS 62607-4-2:2016 BSI Standards
2、 Publication WB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06National foreword This Published Document is the UK implementation of IEC/TS 62607-4- 2:2016. The UK participation in its preparation was entrusted to Technical Committee NTI/1, Nanotechnologies. A list of organizations represented
3、 on this committee can be obtained on request to its secretary. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2016. Published by BSI Standards Limited 2016 ISBN 978 0 580 8
4、9475 6 ICS 07.120 Compliance with a British Standard cannot confer immunity from legal obligations. This Published Document was published under the authority of the Standards Policy and Strategy Committee on 30 November 2016. Amendments/corrigenda issued since publication Date Text affected PUBLISHE
5、D DOCUMENT PD IEC/TS 62607-4-2:2016 IEC TS 62607-4-2 Edition 1.0 2016-10 TECHNICAL SPECIFICATION Nanomanufacturing Key control characteristics Part 4-2: Nano-enabled electrical energy storage Physical characterization of cathode nanomaterials, density measurement INTERNATIONAL ELECTROTECHNICAL COMMI
6、SSION ICS 07.120 ISBN 978-2-8322-3697-0 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication from an authorized distributor. colour inside PD IEC/TS 62607-4-2:2016 2 IEC TS 62607-4-2:2016 IEC 2016 CONTENTS FOREWORD . 4 INTRODUCTI
7、ON . 6 1 Scope 7 2 Normative references 7 3 Terms, definitions, and abbreviated terms . 7 3.1 Terms and definitions 7 3.2 Abbreviated terms . 8 4 Sample preparation methods . 8 4.1 Sieving . 8 4.2 Drying . 8 5 Test methods . 8 5.1 Compacted density . 8 5.1.1 General . 8 5.1.2 Apparatus 9 5.1.3 Measu
8、rement steps . 9 5.1.4 Data analysis / interpretation of results 9 5.1.5 Precision of the method . 10 5.2 Rolling density 10 5.2.1 General . 10 5.2.2 Apparatus 11 5.2.3 Measurement steps . 11 5.2.4 Data analysis / interpretation of results 11 5.2.5 Repeatability of the method . 12 6 Uncertainty 12 A
9、nnex A (informative) Case study 13 A.1 Sample preparation . 13 A.1.1 Schematic figures of die for measuring compacted density and rolling density . 13 A.1.2 Compacted density measurement results for LFP nanomaterial . 15 A.2 Rolling density sample preparation case study 17 A.2.1 Procedures of rollin
10、g density sample preparation . 17 A.2.2 Rolling density measurement results for LFP nanomaterial 18 Bibliography 20 Figure 1 Appearance of die for compacted density measurement . 10 Figure 2 Appearance of die with compressor 10 Figure A.1 Three-dimensional schematic of die for compacted density meas
11、urement . 13 Figure A.2 Engineering schematic of die for compacted density measurement . 14 Figure A.3 Schematic of rolling machine for rolling density measurement. 15 Figure A.4 Results consistency of sample A in Table A.1 . 16 Figure A.5 Results consistency of sample B in Table A.2 . 17 Figure A.6
12、 Procedures of rolling density sample preparation 18 Figure A.7 Results consistency of sample C in Table A.3 . 19 PD IEC/TS 62607-4-2:2016IEC TS 62607-4-2:2016 IEC 2016 3 Table A.1 Measurement method consistency and measurement results of sample A 15 Table A.2 Measurement method consistency and meas
13、urement results of sample B 16 Table A.3 Measurement method consistency and measurement results of sample C 19 PD IEC/TS 62607-4-2:2016 4 IEC TS 62607-4-2:2016 IEC 2016 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ NANOMANUFACTURING KEY CONTROL CHARACTERISTICS Part 4-2: Nano-enabled electrical energy
14、storage Physical characterization of cathode nanomaterials, density measurement FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promo
15、te international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (
16、hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also
17、 participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possib
18、le, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. Whil
19、e all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake t
20、o apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestatio
21、n of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of thi
22、s publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or ind
23、irect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for t
24、he correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. The main task of IEC technical committees is to
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