1、REVISIONSLTR DESCRIPTION DATE (YR-MO-DA) APPROVEDREVSHEETREVSHEET 15 16 17REV STATUS REVOF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14PMIC N/A PREPARED BYCharles F. SaffleDEFENSE SUPPLY CENTER COLUMBUSSTANDARDMICROCIRCUITDRAWINGCHECKED BYCharles F. SaffleCOLUMBUS, OHIO 43216http:/www.dscc.dla.milT
2、HIS DRAWING IS AVAILABLEFOR USE BY ALLDEPARTMENTSAPPROVED BYThomas M. Hess MICROCIRCUIT, DIGITAL, ADVANCED CMOS,OCTAL D-TYPE LATCH WITH THREE-STATEAND AGENCIES OF THEDEPARTMENT OF DEFENSE DRAWING APPROVAL DATE01-05-24OUTPUTS, MONOLITHIC SILICONAMSC N/A REVISION LEVEL SIZEACAGE CODE67268 5962-01524SH
3、EET 1 OF 17DSCC FORM 2233APR 97 5962-E 438-01DISTRIBUTION STATEMENT A . Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-01524DEFENSE SUPPLY CENTER COLUMBUSC
4、OLUMBUS, OHIO 43216-5000 REVISION LEVEL SHEET 2DSCC FORM 2234APR 971. SCOPE1.1 Scope . This drawing documents two product assurance class levels consisting of high reliability (device classes Q andM) and space application (device class V). A choice of case outlines and lead finishes are available an
5、d are reflected in thePart or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in thePIN.1.2 PIN . The PIN is as shown in the following example:5962 - 01524 01 V X XFederalstock classdesignatorRHAdesignator(see 1.2.1)Devicetype(see 1.2.2)D
6、eviceclassdesignatorCaseoutline(see 1.2.4)Leadfinish(see 1.2.5) / (see 1.2.3)/Drawing number1.2.1 RHA designator . Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels andare marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-P
7、RF-38535, appendix Aspecified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.1.2.2 Device type(s) . The device type(s) identify the circuit function as follows:Device type Generic number Circuit function01 54AC573 Octal D-type latch with three-st
8、ate outputs1.2.3 Device class designator . The device class designator is a single letter identifying the product assurance level asfollows:Device class Device requirements documentationM Vendor self-certification to the requirements for MIL-STD-883compliant, non-JAN class level B microcircuits in a
9、ccordance withMIL-PRF-38535, appendix AQ or V Certification and qualification to MIL-PRF-385351.2.4 Case outline(s) . The case outline(s) are as designated in MIL-STD-1835 and as follows:Outline letter Descriptive designator Terminals Package styleX See figure 1 20 Flat pack1.2.5 Lead finish . The l
10、ead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,appendix A for device class M.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-01524DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS,
11、OHIO 43216-5000 REVISION LEVEL SHEET 3DSCC FORM 2234APR 971.3 Absolute maximum ratings . 1 / 2 / 3 /Supply voltage range (V CC ) . -0.5 V dc to +7.0 V dcDC input voltage range (V IN ) . -0.5 V dc to V CC + 0.5 V dcDC output voltage range (V OUT ) -0.5 V dc to V CC + 0.5 V dcDC input clamp current (I
12、 IK ) (V IN V CC ) . 20 mADC output clamp current (I OK ) (V IN V CC ) 20 mAContinuous output current (I OUT ) (V OUT = 0 to V CC ) . 50 mAContinuous current through V CC or GND 400 mAMaximum power dissipation (P D ) 500 mWStorage temperature range (T STG ) -65 C to +150 CLead temperature (soldering
13、, 10 seconds) . +300 CThermal resistance, junction-to-case ( JC ) See MIL-STD-1835Junction temperature (T J ) . +175 C 4 /1.4 Recommended operating conditions . 2 / 3 / 5 /Supply voltage range (V DD ) . +2.0 V dc to +6.0 V dcInput voltage range (V IN ) . +0.0 V dc to V CCOutput voltage range (V OUT
14、) . +0.0 V dc to V CCCase operating temperature range (T C ) -55 C to +125 CInput rise or fall time rate ( t/ V),V CC = 3.6 V, V CC = 5.5 V . 0 to 8 ns/VMinimum setup time, Dn to LE ( t s ):T C = +25 C, V CC = 3.0 V . 3.0 nsT C = -55 C to +125 C, V CC = 3.0 V . 3.5 nsT C = +25 C, V CC = 4.5 V . 2.5
15、nsT C = -55 C to +125 C, V CC = 4.5 V . 3.0 nsMinimum hold time, Dn to LE ( t h ):T C = +25 C, V CC = 3.0 V . 3.0 nsT C = -55 C to +125 C, V CC = 3.0 V . 3.5 nsT C = +25 C, V CC = 4.5 V . 2.5 nsT C = -55 C to +125 C, V CC = 4.5 V . 3.0 nsMinimum pulse width LE ( t w ):T C = +25 C, V CC = 3.0 V . 4.0
16、 nsT C = -55 C to +125 C, V CC = 3.0 V . 4.5 nsT C = +25 C, V CC = 4.5 V . 3.5 nsT C = -55 C to +125 C, V CC = 4.5 V . 4.0 ns1 / Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at themaximum levels may degrade performance and affect reliability
17、.2 / Unless otherwise n oted, all voltages are referenced to GND.3 / The limits for the parameters specified herein shall apply over the full specified VCC range and case temperature range of-55 C to +125 C. Unused inputs must be held high or low.4 / Maximum junction temperat ure shall not be exceed
18、ed except for allowable short duration burn-in screening conditions inaccordance with method 5004 of MIL-STD-883.5 / Operation from 2.0 V to 3.0 V dc is provided for compatibility with data retention and battery back-up systems. D ataretention implies no input transition and no stored data loss with
19、 the following conditions: V IH 70% V CC , V IL 30% V CC ,V OH 70% V CC -20 A, V OL 30% V CC 20 A.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-01524DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000 REVI
20、SION LEVEL SHEET 4DSCC FORM 2234APR 972. APPLICABLE DOCUMENTS2.1 Government specification, standards, and handbooks . The following specification, standards, and handbooks form apart of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those l
21、isted inthe issue of the Department of Defense Index of Specifications and Standards ( DoDISS) and supplement thereto, cited in thesolicitation.SPECIFICATIONDEPAR TMENT OF DEFENSEMIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.STANDARDSDEPARTMENT OF DEFENSEMIL-STD-883 -
22、 Test Method Standard Microcircuits.MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.HANDBOOKSDEPARTMENT OF DEFENSEMIL-HDBK-103 - List of Standard Microcircuit Drawings.MIL-HDBK-780 - Standard Microcircuit Drawings.(Unless otherwise indicated, copies of the specification, standar
23、ds, and handbooks are available from the StandardizationDocument Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)2.2 Non-Government publications . The following documents form a part of this document to the extent specified herein. Unless otherwise specified, the issues of
24、the documents which are DoD adopted are those listed in the issue of the DoDISScited in the solicitation. Unless otherwise specified, the issues of documents not listed in the DoDISS are the issues of thedocuments cited in the solicitation.ELECTRONIC INDUSTRIES ALLIANCE (EIA)JEDEC Standard No. 20 -
25、Standardized for Description of 54/74ACXXXX and 54/74ACTXXXX Advanced High-SpeedCMOS Devices.(Applications for copies should be addressed to the Electronics Industries Alliance, 2 001 Eye Street, NW,Washington, DC 20006.)(Non-Government standards and other publications are normally available from th
26、e organizations that prepare or distributethe documents. These documents may also be available in or through libraries or other informational services.)2.3 Order of precedence . In the event of a conflict between the text of this drawing and the references cited herein, the textof this drawing takes
27、 precedence. Nothing in this document, however, supersedes applicable laws and regulations unless aspecific exemption has been obtained.3. REQUIREMENTS3.1 Item requirements . The individual item requirements for device classes Q and V shall be in accordance withMIL-PRF-38535 and as specified herein
28、or as modified in the device manufacturers Quality Management (QM) plan. Themodification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements fordevice class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B
29、devices and as specifiedherein.3.2 Design, construction, and physical dimensions . The design, construction, and physical dimensions shall be as specifiedin MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.Provided by IHSNot for ResaleNo
30、reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-01524DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000 REVISION LEVEL SHEET 5DSCC FORM 2234APR 973.2.1 Case outlines . The case outlines shall be in accordance with 1.2.4 herein and figure
31、on 1.3.2.2 Terminal connections . The terminal connections shall be as specified on figure 2.3.2.3 Truth table . The truth table shall be as specified on figure 3.3.2.4 Logic diagram . The block or logic diagram shall be as specified on figure 4.3.2.5 Switching waveforms and test circuit . The switc
32、hing waveforms and test circuit shall be as specified on figure 5.3.3 Electrical performance characteristics and postirradiation parameter limits . Unless otherwise specified herein, theelectrical performance characteristics and postirradiation parameter limits are as specified in table I and shall
33、apply over the fullcase operating temperature range.3.4 Electrical test requirements . The electrical test requirements shall be the subgroups specified in table II. The electricaltests for each subgroup are defined in table I.3.5 Marking . The part shall be marked with the PIN listed in 1.2 herein.
34、 In addition, the manufacturers PIN may also bemarked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to spacelimitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, theRHA design
35、ator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A.3.5.1 Certification/compliance mark . The certification mark for device classes Q and V shall be a “QML“ or “Q“ a
36、s required inMIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A.3.6 Certificate of compliance . For device classes Q and V, a certificate of compliance shall be required from a QML-38535listed manufacturer in order to supply to the requireme
37、nts of this drawing (see 6.6.1 herein). For device class M, a certificate ofcompliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved sou
38、rce of supply for thisdrawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.3.7 Certificate of conformance . A certificate of conformance as re
39、quired for device classes Q and V in MIL-PRF-38535 or fordevice class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.3.8 Notification of change for device class M . For device class M, notification to DSCC-VA of change of product (see 6.2her
40、ein) involving devices acquired to this drawing is required for any change as defined in MIL-PRF-38535, appendix A.3.9 Verification and review for device class M . For device class M, DSCC, DSCCs agent, and the acquiring activity retainthe option to review the manufacturers facility and applicable r
41、equired documentation. Offshore documentation shall be madeavailable onshore at the option of the reviewer.3.10 Microcircuit group assignment for device class M . Device class M devices covered by this drawing shall be inmicrocircuit group number 39 (see MIL-PRF-38535, appendix A).Provided by IHSNot
42、 for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-01524DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000 REVISION LEVEL SHEET 6DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics .Test andMIL-STD-883test metho
43、d 1 /Symbol Test conditions 2 /-55 C T C +125 C+3.0 V V CC +5.5 VDevicetypeandV CC Group AsubgroupsLimits 3 / Unitunless otherwise specified DeviceclassMin MaxPositive inputclamp voltage3022V IC+ For input under test, I IN = 1.0 mA AllV0.0 V 1 0.4 1.5 VNegative inputclamp voltage3022V IC- For input
44、under test, I IN = -1.0 mA AllVOpen 1 -0.4 -1.5 VHigh level inputvoltageV IH AllAll3.0 V 1, 2, 3 2.1 V4 / AllAll4.5 V 1, 2, 3 3.15AllAll5.5 V 1, 2, 3 3.85Low level inputvoltageV IL AllAll3.0 V 1, 2, 3 0.9 V4 / AllAll4.5 V 1, 2, 3 1.35AllAll5.5 V 1, 2, 3 1.65High level outputvoltageV OH V IN = V IH m
45、inimum or V ILmaximumAllAll3.0 V 1, 2, 3 2.9 V3006 5 / I OH = -50 A AllAll4.5 V 1, 2, 3 4.4AllAll5.5 V 1, 2, 3 5.4V IN = V IH minimum or V ILmaximumAllAll3.0 V 1 2.56I OH = -12 mA 2, 3 2.40V IN = V IH minimum or V IL All 4.5 V 1 3.86maximum All 2, 3 3.70I OH = -24 mA All 5.5 V 1 4.86All 2, 3 4.70V I
46、N = V IH minimum or V ILmaximumI OH = -50 mAAllAll5.5 V 1, 2, 3 3.85Low level outputvoltageV OL V IN = V IH minimum or V ILmaximumAllAll3.0 V 1, 2, 3 0.1 V3007 5 / I OL = 50 A AllAll4.5 V 1, 2, 3 0.1AllAll5.5 V 1, 2, 3 0.1V IN = V IH minimum or V ILmaximumAllAll3.0 V 1 0.36I OL = 12 mA 2, 3 0.50V IN
47、 = V IH minimum or V IL All 4.5 V 1 0.36maximum All 2, 3 0.50I OL = 24 mA All 5.5 V 1 0.36All 2, 3 0.50V IN = V IH minimum or V ILmaximumI OL = 50 mAAllAll5.5 V 1, 2, 3 1.65See footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,
48、-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-01524DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000 REVISION LEVEL SHEET 7DSCC FORM 2234APR 97Table I. Electrical performance characteristics - Continued.Test andMIL-STD-883test method 1 /Symbol Test conditions 2 /-55 C T C +125 C+3.0 V V CC +5.5 VDev
49、icetypeandV CC Group AsubgroupsLimits 3 / Unitunless otherwise specified DeviceclassMin MaxInput leakagecurrent lowI IL V IN = 0.0 V AllAll5.5 V 1 -0.1 A3009 2, 3 -1.0Input leakagecurrent highI IH V IN = 5.5 V AllAll5.5 V 1 0.1 A3010 2, 3 1.0Quiescent supplycurrent, outputI CCH V IN = V CC or GND AllAll5.5 V 1 4 Ahigh30052,
