1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing to the latest requirements. -sld 07-11-02 Robert M. Heber B Table II, add note to Group C end-point test parameters. Update boilerplate paragraphs. -gz 10-01-22 Charles F. Saffle C Corrected dimensions for symbols D, D2, and L1 for
2、 case outline U. Corrected dimensions for symbols D2, L, and L1 for case outline X. Corrected dimensions for symbols D, L, and L1 for case outline Y. Corrected dimensions for symbols D, D2, and L1 for case outline Z. Updated drawing paragraphs. -sld 13-03-05 Charles F. Saffle REV SHEET REV SHEET REV
3、 STATUS REV C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Steve Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPART
4、MENTS APPROVED BY Raymond Monnin MICROCIRCUIT, HYBRID, LINEAR, 5 VOLT, DUAL CHANNEL, DC/DC CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 02-11-21 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-02563 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E160-13 Provided by IHSNo
5、t for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02563 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as
6、 defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in th
7、e following example: 5962 - 02563 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices
8、 shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 AFL5005D/CH DC/DC conve
9、rter, 80 W, 5 V outputs 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing
10、(Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-s
11、pace high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not
12、 test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquis
13、ition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outl
14、ines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style U See figure 1 12 Y case configuration with leads bent upwards X See figure 1 12 Straight leads with end mounting through holes Y See figure 1 12 Straight leads wit
15、h side mounting through holes Z See figure 1 12 Y case configuration with leads bent downwards 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SI
16、ZE A 5962-02563 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Input voltage range -0.5 V dc to +100 V dc Lead temperature (soldering, 10 seconds) +300C Storage temperature -65C to +135C 1.4 Recommended operating condit
17、ions. Input voltage range +30 V dc to +80 V dc Output power 2/ 3/ . 80 W Case operating temperature range (TC) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the exte
18、nt specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Mic
19、rocircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch
20、/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document,
21、 however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall
22、include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined
23、 in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended op
24、eration at the maximum levels may degrade performance and affect reliability. 2/ Derate output power linearly above case temperature +125C to 0 at +135C. 3/ Output load must be distributed so that a minimum of 20% of the total output power is being provided by one of the outputs. Provided by IHSNot
25、for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02563 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3.2 Design, construction, and physical dimensions. The design, construction, a
26、nd physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics.
27、Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electric
28、al tests for each subgroup are defined in table I. 3.5 Marking of devices. Marking of devices shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the ge
29、neral performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary
30、of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certifica
31、te of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate
32、of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device
33、 manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883
34、. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases,
35、 and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electric
36、al parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02563 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C S
37、HEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C VIN= 50 V dc 5%, CL= 0 unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output voltage VOUTIOUT= 8 A, each output 1 01 4.95 5.05 V 2,3 4.90 5.10 Output curre
38、nt 1/ 2/ IOUTVIN = 30, 50, and 80 V dc, either output 1,2,3 01 12.8 A Output ripple voltage VRIPVIN = 30, 50, and 80 V dc, B.W. = 10 MHz, IOUT= 8 A, both outputs 1,2,3 01 60 mV p-p Line regulation 3/ VRLINEVIN = 30, 50, and 80 V dc, IOUT= 0, 4, and 8 A, both outputs 1,2,3 01 40 mV Load regulation 3/
39、 VRLOADVIN = 30, 50, and 80 V dc, IOUT= 0, 4, and 8 A, both outputs 1,2,3 01 80 mV Cross regulation 4/ VRCROSSVIN = 30, 50, and 80 V dc Positive output Negative output 1,2,3 01 80 mV 640 Input current IINIOUT = no load 1 01 50 mA 2,3 60 Enable 1, (pin 4) shorted to Input return (pin 2) 1,2,3 5 Enabl
40、e 2, (pin 12) shorted to Output return (pin 8) 1,2,3 5 Input ripple current IRIPIOUT = 8 A, B.W. = 10 MHz 1,2,3 01 60 mA p-p Efficiency EFFIOUT = 8 A 1,2,3 01 78 % Isolation ISO Input to output or any pin to case (except pin 3) at 500 V dc, TC = +25C 1 01 100 M Maximum capacitive load 5/ CLNo effect
41、 on dc performance, each output, TC= +25C 4 01 10,000 F Power dissipation load fault PDOverload 1,2,3 01 32 W Short circuit 32 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02
42、563 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC +125C VIN= 50 V dc 5%, CL= 0 unless otherwise specified Group A subgroups Device type Limits Unit Min Max Cur
43、rent limit point 6/ ICLVOUT = 90% VNOM , each output 1 01 9.20 10.00 A 2 8.40 9.20 3 10.00 11.20 Switching frequency FSIOUT= 8 A 1,2,3 01 500 600 kHz Sync frequency range FSYNCIOUT = 8 A 1,2,3 01 500 700 kHz Output response to step transient load changes 7/ 8/ VOTLOAD50% to/from 100% 4,5,6 01 -450 +
44、450 mV pk 10% to/from 50% -450 +450 Recovery time, step transient load changes 7/ 8/ TTLOAD50% to/from 100% 4,5,6 01 200 s 10% to/from 50% 400 Output response to transient step line changes 5/ 7/ 9/ VOTLINEInput step, 30 V to/from 80 V dc, IOUT = 8 A 4,5,6 01 -500 +500 mV pk Recovery time transient
45、step line changes 5/ 7/ 9/ TTLINEInput step, 30 V to/from 80 V dc, IOUT= 8 A 4,5,6 01 500 s Turn on overshoot 10/ VTonOSIOUT= 0 and 8 A 4,5,6 01 250 mV pk Turn on delay 10/ TonDIOUT= 0 and 8 A 4,5,6 01 120 ms Load fault recovery 10/ TrLF4,5,6 01 120 ms 1/ Parameter verified as part of another test.
46、2/ Output load must be distributed so that a minimum of 20% of the total output power is being provided by one of the outputs. 3/ Load current split equally between +VOUTand -VOUT. 4/ Cross regulation measured with load on tested output at 20% while changing the load on other output from 20% to 80%.
47、 5/ Parameter not 100% tested but are guaranteed to the limits specified in the table. 6/ Current limit point is that condition of excess load causing output voltage to drop to 90% of nominal. 7/ Recovery time is measured from the initiation of the transient to where VOUThas returned to within 1% of
48、 VOUTat 50% load. 8/ Load transient transition time 10 s. 9/ Line transient transition time 100 s. 10/ Turn-on delay is measured with an input voltage rise time of between 100 and 500 volts per millisecond. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02563 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 Case outline U. Millimet
