1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHEET REV SHEET REV STATUS REV OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY Steve Duncan STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY R
2、obert M. Heber MICROCIRCUIT, HYBRID, LINEAR, VOLTAGE REGULATOR, 1.5A OUTPUT CURRENT DRAWING APPROVAL DATE 08-03-04 SIZE A CAGE CODE 67268 5962-08225 THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A REVISION LEVEL SHEET 1 OF 9 DSCC FORM 2233 APR
3、97 5962-E279-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08225 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing doc
4、uments five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.
5、1.2 PIN. The PIN shall be as shown in the following example: 5962 - 08225 01 K 4 X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assura
6、nce (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Cir
7、cuit function 01 SAT117AKT-ADJ 1.5 A, 1%, ADJUSTABLE REGULATOR 02 SAT117KT-ADJ 1.5 A, 2%, ADJUSTABLE REGULATOR 03 SAT117AHT-ADJ 1.5 A, 1%, ADJUSTABLE REGULATOR 04 SAT117HT-ADJ 1.5 A, 2%, ADJUSTABLE REGULATOR 1.2.3 Device class designator. This device class designator shall be a single letter identif
8、ying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highes
9、t reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This l
10、evel uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of
11、the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance.
12、 D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE
13、 A 5962-08225 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style 4 See figure 1 3 Flange Mount
14、 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ DC input-output differential max input voltage Vin-Vin(max) 40 V DC output voltage range (VO). +1.2 V to +37 V Output Current (IO) . 1.5 A Power Dissipation (PD) TC= +25C 50 W Thermal Resista
15、nce, Junction to Case (JC). 2.5C/W Storage temperature -65 to +150C Maximum Junction Temperature (TJ) . +175C Package weight 5 grams Lead temperature (soldering, 10 seconds). +300C 1.4 Recommended operating conditions. Input voltage range +3.7 V to +37 V Output current range 50 mA to 1.5 A Case oper
16、ating temperature range. -55 to +125C Dropout voltage (VIN-VOUT) 1.5 V 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the iss
17、ues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electr
18、onic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil;quicksearch/ or www.dodssp.daps.mil or from the Standardiza
19、tion Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) _ 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo
20、 reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08225 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawin
21、g and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device cl
22、asses D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminat
23、e, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device clas
24、s. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connec
25、tions shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The el
26、ectrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition,
27、 the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A
28、 lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing acti
29、vity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requi
30、rements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accor
31、dance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDAR
32、D MICROCIRCUIT DRAWING SIZE A 5962-08225 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Min Max
33、 Unit VDIFF= 3.25 V, IL= 10 mA 1,2,3 01,03 1.238 1.262 VDIFF= 40 V, IL= 10 mA 1,2,3 01,03 1.225 1.270 VDIFF= 3.25 V, IL= 10 mA 1,2,3 02,04 1.225 1.275 Reference voltage accuracy VREFVDIFF= 40 V, IL= 10 mA 1,2,3 02,04 1.200 1.300 V Line regulation VLINE VOUT=VREF, IL= 10 mA, 3.0 V VDIFF 40 V 1,2,3 Al
34、l -5 5 mV VDIFF= 5.25 V, 10 mA IL 1.5 A 1,2,3 All -15 15 Load regulation VLOADVDIFF= 3.25 V, 10 mA IL 1.5 A 1 All -15 15 mV Adjust-pin current IADJVDIFF= 3.3 V - 40 V, ILOAD= 10 mA 1,2,3 All 100 A Adjust-pin current change IADJVDIFF= 5.25 V - 40 V, 10 mA IL 1.5 A 1 All -5 5 A Ripple Rejection PSRR F
35、 = 120 Hz, IOUT= 50 mA 1 All 65 dB Short circuit current IOSVDIFF= 10 V 1 All 1.5 A Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08225 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVE
36、L SHEET 6 DSCC FORM 2234 APR 97 Inches Millimeters Symbol Min Max Min Max A .200 5.08 b .025 .035 0.64 0.89 c .025 .035 0.64 0.89 D .580 .610 14.73 15.49 D1 .420 TYP 10.67 TYP e .100 BSC 2.54 BSC e1 .200 BSC 5.08 BSC E .420 MAX 10.67 MAX L .090 .110 2.29 2.79 q .115 .125 2.92 3.17 FIGURE 1. Case out
37、line. 1 2 311qLc CASEAEDD eebProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08225 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 7 DSCC FORM 2234 APR 97 Device types All Case o
38、utline 4 Terminal number Terminal symbol Terminal Description 1 ADJ/Gnd Adjust pin or ground for fixed versions 2 OUT Output voltage 3 INP Input voltage N/A CASE No connection, Isolated FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without licen
39、se from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08225 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test tabl
40、e) Interim electrical parameters 1 Final electrical parameters 1*, 2,3 Group A test requirements 1,2,3 Group C end-point electrical parameters 1 End-point electrical parameters for Radiation Hardness Assurance (RHA) devices N/A * PDA applies to subgroup 1. 4.2 Screening. Screening shall be in accord
41、ance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the a
42、cquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim
43、and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in
44、 accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, 8, 9, 10 and 11 shall be omitted. 4.3.2 Group B inspection (
45、PI). Group B inspection shall be in accordance with MIL-PRF-38534. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08225 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 9 DSCC FO
46、RM 2234 APR 97 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test ci
47、rcuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the int
48、ent specified in test method 1005 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1005 of MIL-STD-883. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534. 4.3.5 Radiation Hardness Assurance (RHA) inspection. RHA inspection is no
