1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. -ro 01-03-30 R. MONNIN B Update drawing as part of 5 year review. -rrp 06-04-20 R. MONNIN C Update drawing as part of 5 year review. -jt 13-01-22 C. SAFFLE THE ORIGINAL FIRST PAGE OF THIS DRAWING H
2、AS BEEN REPLACED REV SHEET REV SHEET REV STATUS REV C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY RICK C. OFFICER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY
3、ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY CHARLES E. BESORE APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, PRECISION VOLTAGE REFERENCE, MONOLITHIC SILICON DRAWING APPROVAL DATE 89-12-28 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-89728 SHEET 1 OF 11 DSCC FORM
4、2233 APR 97 5962-E170-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89728 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing d
5、escribes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-89728 01 E X Drawing number Device type (see 1.2.1) Case outline
6、 (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device types. The device types identify the circuit function as follows: Device type Generic number Circuit function 01 AD588S Pin programmable voltage reference 02 AD588T Pin programmable voltage reference 1.2.2 Case outlines. The case outlines are as desi
7、gnated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. 1/
8、Positive supply voltage (+VS) . +18 V dc Negative supply voltage (-VS) . -18 V dc Power dissipation (PD) at TA= +25C . 600 mW Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) . +175C Thermal resistance, junction-to-case (JC) . See MIL
9、-STD-1835 Thermal resistance, junction-to-ambient (JA) 90C/W 1.4 Recommended operating conditions. Positive supply voltage (+VS) . +15 V dc Negative supply voltage (-VS) . -15 V dc Ambient operating temperature range (TA) . -55C to +125C 1/ All outputs may be shorted to ground. Provided by IHSNot fo
10、r ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89728 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks.
11、The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufa
12、cturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard M
13、icrocircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this dra
14、wing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance
15、 with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535
16、may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall n
17、ot affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design
18、, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Logic diagram. The logi
19、c diagram shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The
20、electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufac
21、turers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,
22、-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89728 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Uni
23、t Min Max Output voltage error VOUTOutputs: +10 V, -10 V, 1 01,02 5.0 mV TA= +25C 12 02 3.0 Outputs: +5.0 V, -5.0 V, 1 01,02 5.0 TA= +25C 12 02 3.0 Symmetry error SeTracking mode: 5.0 V, TA= +25C 1 All 1.5 mV Output voltage drift dVO/ dT 2,3 01 6.0 ppm/C 12 02 4.0 Line regulation VRLN2/ 1,2,3 All 20
24、0 V/V Load regulation VRLD+10 V output, 0 mA IOUT 10 mA 1,2,3 All 50 V/mA -10 V output, -10 mA IOUT 0 mA 50 Supply current ICC1,2,3 All 10 mA Output current IOUTAmplifiers A3, A4 3/ 1,2,3 All -10 +10 mA 1/ Unless otherwise specified, +VS= 15 V dc, -VS= -15 V dc. Test conditions using +10 V output, +
25、5.0 V and 5.0 V outputs, and 10 V output, with 5.0 V tracking are as specified on figure 3. 2/ Test conditions: +10 V output -VS= -15 V dc, 13.5 V dc +VS 18 V dc -10 V output +VS= +15 V dc, -18 V dc -VS -13.5 V dc 5.0 V output +VS= +18 V dc, -VS= -10.8 V dc +VS= +10.8 V dc, -VS= -10.8 V dc 3/ Parame
26、ters shall be tested as part of device initial characterization and after design and process change. Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-
27、,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89728 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. Th
28、e compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved sou
29、rce of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certi
30、ficate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this
31、drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4.
32、 VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The fol
33、lowing additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The te
34、st circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electric
35、al parameter tests prior to burn-in are optional at the discretion of the manufacturer. c. Subgroup 12 test is used for grading and part selection at TA= +25C. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A
36、, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, 8, 9,10,11 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 12 test is used for grading and part selecti
37、on at TA= +25C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89728 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 Device types 01 and 02 Case outlines E 2 Te
38、rminal number Terminal symbol 1 A3 OUT FORCE NC 2 +VSA3 OUT FORCE 3 A3 OUT SENSE +VS4 A3 +IN A3 OUT SENSE 5 GAIN ADJ A3 +IN 6 VHIGHNC 7 NOISE REDUCTION GAIN ADJ 8 VLOWVHIGH9 GND SENSE +IN NOISE REDUCTION 10 GND SENSE IN VLOW11 VCTNC 12 BAL ADJ GND SENSE +IN 13 A4 +IN GND SENSE IN 14 A4 OUT SENSE VCT
39、15 A4 OUT FORCE BAL ADJ 16 -VSNC 17 - A4 +IN 18 - A4 OUT SENSE 19 - A4 OUT FORCE 20 - -VSNC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89728 DLA LAND AND M
40、ARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 NOTE: Terminal numbers within the parentheses symbol represent the case 2 package. FIGURE 2. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICR
41、OCIRCUIT DRAWING SIZE A 5962-89728 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 FIGURE 3. Test conditions. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-897
42、28 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 NOTE: Terminal numbers within the parentheses symbol represent the case 2 package. FIGURE 3. Test conditions Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without licen
43、se from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89728 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 10 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Inter
44、im electrical parameters (method 5004) 1 Final electrical test parameters (method 5004) 1*, 2, 3, 12 Group A test requirements (method 5005) 1, 2, 3, 12 Groups C and D end-point electrical parameters (method 5005) 1 * PDA applies to subgroup 1. 4.3.2 Groups C and D inspections. a. End-point electric
45、al parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or a
46、cquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-S
47、TD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89728 DLA LAND AND MARITI
48、ME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 11 DSCC FORM 2234 APR 97 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SM
