1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Added CMRR test to table I. Updated document to current MIL-H-38534 requirements. Editorial changes throughout. 92-01-21 A. Barone B Changes in accordance with NOR 5962-R244-97. 97-03-13 Kendall A. Cottongim C Added vendor CAGE 1HBD3. Removed ven
2、dor CAGE 62839. Made corrections to table I. Editorial changes throughout. -sld 00-06-06 Raymond Monnin D Update drawing. 06-03-01 Raymond Monnin REV SHEET REV SHEET REV STATUS REV D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLU
3、MBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Robert M. Heber POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY William K. Heckman MICROCIRCUIT, HYBRID, LINEAR, HIGH SPEED, WIDEBAND, OPERATIONAL AMPLIFIER AND AGENCI
4、ES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-12-06 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-89910 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E290-06Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING S
5、IZE A 5962-89910 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents one product assurance class, class H (high reliability) and a choice of case outlines and lead finishes are available and are reflected
6、in the Part or Identifying Number (PIN). 1.2 PIN. The PIN shall be as shown in the following example: 5962-89910 01 X X Drawing number Device type Case outline Lead finish (see 1.2.1) (see 1.2.2) (see 1.2.3) 1.2.1 Device type(s). The device type(s) shall identify the circuit function as follows: Dev
7、ice type Generic number 1/ Circuit function 01 CLC200A, KH200A High speed, wideband, operational amplifier 1.2.2 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 12 Can package 1.2
8、.3 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 2/ Supply voltage (VCC) . 20 V dc Output current . 100 mA Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) . +175C Power dissipation
9、 (PD) 3/ Thermal resistance, case-to-ambient (CA) 65C/W 4/ Thermal resistance, junction-to-case: JC(circuit) 32C/W 5/ JC(output) 100C/W 6/ 1/ The CLC200A is not available from an approved source of supply. 2/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Exten
10、ded operation at the maximum levels may degrade performance and affect reliability. 3/ The power dissipation can be determined based on the application and junction temperature verified to be TJ +175C and using the thermal resistance values given. 4/ Still air, no heat sink. 5/ Thermal resistance of
11、 circuit; PCIRCUIT= 2(VCC) ICC. 6/ Thermal resistance of output transistors; POUTPUT= VCE(IE) x (% duty cycle). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89910 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, O
12、HIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Supply voltage range. 5 V dc to 15 V dc Gain range. 1 to 50 Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The
13、 following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General
14、Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit D
15、rawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between
16、the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance req
17、uirements for device class H shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for applicable device class. The manufacturer may eliminate
18、, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class
19、. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein and figure 1. 3.2.2 Terminal connections. The terminal connect
20、ions shall be as specified on figure 2. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89910 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3.3 Electr
21、ical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups s
22、pecified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be m
23、arked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Al
24、so, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of com
25、pliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificat
26、e of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89910 DE
27、FENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Min Max Unit 4, 6 85 Small signal bandwidth (-
28、3 dB bandwidth) SSBW VOUT25 MHz 6 01 0.8 dB 4 0.4 Gain flatness rolloff GFR f = 50 MHz 5, 6 01 0.6 dB Linear phase deviation 2/ LPD f 5.0 MHz 7, 8A,8B 01 -150 dBm (1 Hz) Integrated noise 2/ INV f = 5.0 MHz to 100 MHz 7, 8A,8B 01 70 V Input offset voltage VIO1, 2, 3 01 25 mV Input offset voltage 2/ t
29、emperature coefficient VIO T 1, 2, 3 01 120 V/C 1 30 + Input bias current +IIBInput resistance is 100 2, 3 01 40 A + Input bias current 2/ temperature coefficient +IIB T 1, 2, 3 01 125 nA/C 1 50 - Input bias current -IIBInput resistance is 100 2, 3 01 70 A - Input bias current 2/ temperature coeffic
30、ient -IIB T 1, 2, 3 01 250 nA/C Power supply rejection ratio PSRR VCC= 0.5 V 1, 2, 3 01 45 dB See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89910 DEFENSE SUPPLY CENTER COLUMBU
31、S COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Min Max Unit Supply current ICCNo load 1 01 34 mA 2, 3 36 Com
32、mon mode rejection 2/ ratio CMRR VCM= 1 V 4, 5, 6 01 40 dB 1/ Unless otherwise specified, RL= 200 ohms, RF= 2,000 ohms, VCC= 15 V, AV= +20. 2/ Parameter shall be tested as part of device initial characterization and after design and process changes which may affect this parameter. Parameter shall be
33、 guaranteed to the limits specified in table I for all lots not specifically tested. 3/ dBc is a standard reference for a signal referenced to a carrier signal level. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE
34、A 5962-89910 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 Case outline X. Inches Millimeters Symbol Min Max Min Max Notes A .148 .181 3.76 4.60 b .016 .019 0.41 0.48 D .595 .608 15.11 15.44 D1 .545 .555 13.84 14.10 e .400 BSC 10.16 BSC 5 e1
35、.200 BSC 5.08 BSC 5 e2 .100 BSC 2.54 BSC 5 F .030 0.76 k .026 .036 0.66 0.91 k1 .026 .036 0.66 0.91 4 L .310 .340 7.87 8.64 45 BSC 45 BSC 5 NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. 3. The product may be measured by direct methods or by gauge.
36、4. Measured from the maximum diameter of the product. 5. Leads having a maximum diameter .019 (0.48 mm) measured in gauging plane .054 (1.37 mm) +.001 (0.03 mm), -.000 (0.00 mm) below the base plane of the product shall be within .007 (0.18 mm) of their true position relative to a maximum width tab.
37、 FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89910 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 9 DSCC FORM 2234 APR 97 Device type 01 Case ou
38、tline X Terminal number Terminal symbol 1 +VCC(supply voltage) 2 Bias control 3 GND (case and bias) 4 Compensation (optional) 5 -VIN 6 +VIN7 GND (case and bias) 8 Rf(internal feedback) 9 -VCC(supply voltage) 10 -VCC(collector supply) 11 VOUT12 +VCC(collector supply) NOTE: Pin 8 provides access to a
39、2 k feedback resistor which can be connected to the output or left open if an external feedback resistor is desired. FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89910 DEFEN
40、SE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 10 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters 1 Final electrical parameters 1*,
41、 2, 3, 4, 7 Group A test requirements 1, 2, 3, 4, 5, 6, 7, 8A, 8B Group C end-point electrical parameters 1 * PDA applies to subgroup 1. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturer
42、s Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test co
43、ndition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as appl
44、icable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to bur
45、n-in are optional at the discretion of the manufacturer. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with
46、 MIL-PRF-38534 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 9, 10, and 11 shall be omitted. 4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534. Provided by IHSNot for ResaleNo reproduction or networking permitted without lic
47、ense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89910 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 11 DSCC FORM 2234 APR 97 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows: a. End-point electric
48、al parameters shall be as specified in table II herein. b. Steady-state life test, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissi
