1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R053-93. 93-01-07 M. A. Frye B Changes in accordance with NOR 5962-R060-94. 93-12-06 M. A. Frye C Changes in accordance with NOR 5962-R041-95. 94-11-30 M. A. Frye D Redrawn with changes. Add case outline X. Tec
2、hnical and editorial changes throughout. 95-03-24 M. A. Frye E Update drawing to current requirements. Editorial changes throughout. - drw 04-11-09 Raymond Monnin THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED REV SHET REV SHET REV STATUS REV E E E E E E E E E E E E E E OF SHEETS SHEET 1
3、 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Rick C. Officer DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Charles E. Besore COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUI
4、T, LINEAR, CMOS QUAD, SPST AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 92-01-13 ANALOG SWITCH, MONOLITHIC SILICON AMSC N/A REVISION LEVEL E SIZE A CAGE CODE 67268 5962-90731 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E014-05 Provided by IHSNot for ResaleNo reproduction or networkin
5、g permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90731 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliabilit
6、y (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is
7、as shown in the following example: 5962 - 90731 01 M E A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked dev
8、ices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device types
9、. The device types identify the circuit function as follows: Device type Generic number Circuit function Switch action 01 DG411 CMOS, quad, SPST analog switch (See figures 2, 3) 02 DG412 CMOS, quad, SPST analog switch (See figures 2, 3) 03 DG413 CMOS, quad, SPST analog switch (See figures 2, 3) 1.2.
10、3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance wi
11、th MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style 2 CQCC1-N20 20 square leadless chip carrier E GDIP1-T16 or CDIP2
12、-T16 16 dual-in-line F GDFP2-F16 or CDFP3-F16 16 flatpack X CDFP4-F16 16 flatpack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted witho
13、ut license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90731 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ V+ to V- 44 V dc Ground to V- 25 V dc Logic supply voltage (VL) to V-. (Ground -0.3 V dc) t
14、o 44 V dc 2/ Digital inputs, VS, VD(V-) -2.0 V dc to (V+) +2.0 V dc or 30 mA, whichever occurs first 2/ Continuous current (any terminal) 30 mA Source or drain current (pulsed, 1.0 ms, 10% duty cycle) 100 mA Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds). +300C Powe
15、r dissipation, TA= +25C (PD): Case E 900 mW 3/ Case F and X 485 mW 4/ Case 2 750 mW 5/ Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 1.4 Recommended operating conditions. Unipolar supply voltage: V+. 12 V dc V- 0 V dc Bipolar supply voltage: V+. 15 V dc V- -15 V dc Logic supply voltag
16、e (VL) . 5.25 V dc Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the
17、issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Sta
18、ndard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or fr
19、om the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, howeve
20、r, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Signals on SX, DX, or INX
21、exceeding V+ or V- will be clamped by internal diodes. Limit forward diode current to maximum current ratings. 3/ Derate above TA= +75C at 12 mW/C. 4/ Derate above TA= +70C at 6.06 mW/C. 5/ Derate above TA= +75C at 10 mW/C.Provided by IHSNot for ResaleNo reproduction or networking permitted without
22、license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90731 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
23、MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-3853
24、5, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for devic
25、e class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth tables. The truth tables shall be as specified on figure 2. 3.2.4 Block diagrams. The block diagrams shall b
26、e as specified on figure 3. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating
27、temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers P
28、IN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q
29、 and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for dev
30、ice class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device cla
31、ss M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the
32、 manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535
33、 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing
34、is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made a
35、vailable onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 82 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without
36、 license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90731 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A su
37、bgroups Device type Limits Unit Min Max Drain-to-source ON rDS(ON)VIN= 0.8 V 1, 3 01 0 35 resistance 2 0 45 VIN= 2.4 V 1, 3 02 0 35 V+ = 13.5 V, V- = -13.5 V, IS= -10 mA, VD= 8.5 V 2 0 45 VIN= 0.8 V or 1, 3 03 0 35 2.4 V 2/ 2 0 45 VIN= 0.8 V 1, 3 01 0 80 2 100 VIN= 2.4 V 1, 3 02 0 80 V+ = 10.8 V, V-
38、 = 0 V, IS= -10 mA, VD= 3.0 V and 8.0 V 2 0 100 VIN= 0.8 V or 1, 3 03 0 80 2.4 V 2/ 2 0 100 Source OFF leakage IS(OFF)VIN= 0.8 V 1 01 -0.25 +0.25 nA current 2, 3 -20 +20 VIN= 2.4 V 1 02 -0.25 +0.25 V+ = 16.5 V, V- = -16.5 V, VD= -15.5 V VS= 15.5 V 2, 3 -20 +20 VIN= 0.8 V or 1 03 -0.25 +0.25 2.4 V 2/
39、 2, 3 -20 +20 VIN= 0.8 V 1 01 -0.25 +0.25 2, 3 -20 +20 VIN= 2.4 V 1 02 -0.25 +0.25 V+ = 16.5 V, V- = -16.5 V, VD= 15.5 V VS= -15.5 V 2, 3 -20 +20 VIN= 0.8 V or 1 03 -0.25 +0.25 2.4 V 2/ 2, 3 -20 +20 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted w
40、ithout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90731 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise sp
41、ecified Group A subgroups Device type Limits Unit Min Max Drain OFF leakage ID(OFF)VIN= 2.4 V 1 01 -0.25 +0.25 nA current 2, 3 -20 +20 VIN= 0.8 V 1 02 -0.25 +0.25 V+ = 16.5 V, V- = -16.5 V, VD= -15.5 V VS= 15.5 V 2, 3 -20 +20 IN= 0.8 V or 1 03 -0.25 +0.25 2.4 V 2/ 2, 3 -20 +20 VIN= 2.4 V 1 01 -0.25
42、+0.25 2, 3 -20 +20 IN= 0.8 V 1 02 -0.25 +0.25 V+ = 16.5 V, V- = -16.5 V, VD= 15.5 V VS= -15.5 V 2, 3 -20 +20 VIN= 0.8 V or 1 03 -0.25 +0.25 2.4 V 2/ 2, 3 -20 +20 Channel ON ID(ON)VIN= 0.8 V 1 01 -0.4 +0.4 nA leakage current + 2, 3 -40 +40 IS(ON)V+ = 16.5 V, V- = -16.5 V, VS= VD= 15.5 V VIN= 2.4 V 1
43、02 -0.4 +0.4 2, 3 -40 +40 IN= 0.8 V or 1 03 -0.4 +0.4 2.4 V 2/ 2, 3 -40 +40 Input current with VINlow IILInput under test = 0.8 V, all others = 2.4 V 1, 2, 3 All -0.5 +0.5 A Input current with VINhigh IIHInput under test = 2.4 V, all others = 0.8 V 1, 2, 3 All -0.5 +0.5 A Turn ON time tONSee figure
44、4, RL= 300, 9, 11 All 0 175 ns CL= 35 pF, VS= 10 V 10 0 240 See figure 4, RL= 300, 9, 11 All 0 250 ns V+ = 12 V, V- = 0 V, CL= 35 pF, VS= +8 V 10 0 400 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCU
45、IT DRAWING SIZE A 5962-90731 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Un
46、it Min Max Turn OFF time tOFFSee figure 4, RL= 300, 9, 11 All 0 145 ns CL= 35 pF, VS= 10 V 10 0 160 See figure 4, RL= 300, 9, 11 All 0 125 V+ = 12 V, V- = 0 V, CL= 35 pF, VS= +8 V 10 0 140 Charge injection 3/ Q VGEN= 0 V, RGEN= 0, TA= +25C, CL= 10 nF, See figure 5 9 All -100 +100 pC VGEN= 6.0 V, RGE
47、N= 0, CL= 10 nF, V+ = 12 V, V- = 0 V, TA= +25C, See figure 5 9 All -100 +100 Positive supply current I+ V+ = 16.5 V, V- = -16.5 V, 1 All +1.0 A VIN= 0 V or 5.0 V 2, 3 +5.0 V+ = 13.2 V, V- = 0 V, 1 All +1.0 VIN= 0 V or 5.0 V, VL= 5.25 V 2, 3 +5.0 Negative supply current I- V+ = 16.5 V, V- = -16.5 V,
48、1 All -1.0 A VIN= 0 V or 5.0 V 2, 3 -5.0 V+ = 13.2 V, V- = 0 V, 1 All -1.0 VIN= 0 V or 5.0 V, VL= 5.25 V 2, 3 -5.0 Logic supply current ILV+ = 16.5 V, V- = -16.5 V, 1 All +1.0 A VIN= 0 V or 5.0 V 2, 3 +5.0 V+ = 13.2 V, V- = 0 V, 1 All +1.0 VIN= 0 V or 5.0 V, VL= 5.25 V 2, 3 +5.0 Ground current IGNDV+ = 16.5 V, V- = -16.5 V, 1 All -1.0 A VIN= 0 V or 5.0 V 2, 3 -5.0 V+ = 13.2 V, V- = 0 V, 1 All -1.0 VIN= 0 V or 5.0 V, VL= 5.25 V 2, 3 -5.0 Functional tests See figure 2 and 4.4.1b 7, 8 All 1/ V+ = 15 V, V- = -15 V, VL= 5 V and GND = 0 V, unless otherwise specifi
