IEC 60191-6-6-2001 Mechanical standardization of semiconductor devices - Part 6-6 General rules for the preparation of outline drawings of surface mounted semiconductor device pack.pdf

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1、 IEC 60191-6-6 Edition 1.0 2001-03 INTERNATIONAL STANDARD NORME INTERNATIONALE Mechanical standardization of semiconductor devices Part 6-6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages Design guide for fine pitch land grid array (FLGA) Norma

2、lisation mcanique des dispositifs semiconducteurs Partie 6-6: Rgles gnrales pour la prparation des dessins dencombrement des dispositifs semiconducteurs montage en surface Guide de conception des dispositifs FLGA IEC 60191-6-6:2001 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2001 IEC, Geneva,

3、Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the c

4、ountry of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contra

5、ire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions

6、 sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 2

7、0 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC pu

8、blications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Useful links: IEC publications search - www.iec.ch/searchpub The advanced search enables you to find IEC publications by a variety of criter

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10、lso once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as the International Electrotechni

11、cal Vocabulary (IEV) on-line. Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premir

12、e organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition

13、 la plus rcente, un corrigendum ou amendement peut avoir t publi. Liens utiles: Recherche de publications CEI - www.iec.ch/searchpub La recherche avance vous permet de trouver des publications CEI en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Elle donne aussi des informati

14、ons sur les projets et les publications remplaces ou retires. Just Published CEI - webstore.iec.ch/justpublished Restez inform sur les nouvelles publications de la CEI. Just Published dtaille les nouvelles publications parues. Disponible en ligne et aussi une fois par mois par email. Electropedia -

15、www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 30 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International (

16、VEI) en ligne. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 60191-6-6 Edition 1.0 2001-03 INTERNATIONAL STANDARD NORME INTERNATIONALE Mechanical standardization of semiconductor de

17、vices Part 6-6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages Design guide for fine pitch land grid array (FLGA) Normalisation mcanique des dispositifs semiconducteurs Partie 6-6: Rgles gnrales pour la prparation des dessins dencombrement des

18、dispositifs semiconducteurs montage en surface Guide de conception des dispositifs FLGA INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE M ICS 31.080.01 PRICE CODE CODE PRIX ISBN 978-2-83220-590-7 Registered trademark of the International Electrotechnical Commissi

19、on Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. 2 60191-6-6 IEC:2001 INTERNATIONAL ELECTROTECHNICAL

20、COMMISSION _ MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES Part 6-6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages Design guide for fine-pitch land grid array (FLGA) FOREWORD 1) The IEC (International Electrotechnical Commission) is a wo

21、rldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to o

22、ther activities, the IEC publishes International Standards. Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work, International, governmental and non-governmental organizations liaising with t

23、he IEC also participate in this preparation. The IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of the IEC on technical matters express,

24、as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested National Committees. 3) The documents produced have the form of recommendations for international use and are published in the form of standards

25、 technical specifications, technical reports or guides and they are accepted by the National Committees in that sense. 4) In order to promote international unification, IEC National Committees undertake to apply IEC International Standards transparently to the maximum extent possible in their natio

26、nal and regional standards. Any divergence between the IEC Standard and the corresponding national or regional standard shall be clearly indicated in the latter. 5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in c

27、onformity with one of its standards. 6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60191-6-6 has be

28、en prepared by subcommittee 47D: Mechanical standardization of semiconductor devices, of IEC technical committee 47: Semiconductor devices. This bilingual version (2013-01) corresponds to the monolingual English version, published in 2001-03. The text of this standard is based on the following docum

29、ents: FDIS Report on voting 47D/404/FDIS 47D/421/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. The French version of this standard has not been voted upon. This publication has been drafted in accordance with t

30、he ISO/IEC Directives, Part 3. The committee has decided that the contents of this publication will remain unchanged until 2003. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition, or amended. 60191-6-6 IEC:2001 3 INTRODUCTION The demand for area array style

31、packages exists because of the multi-functions and high performance of electrical equipment. The objective of this design guide is to standardize outlines and to get interchangeability of FLGA packages. The terminal pitch and package outlines of these fine-pitch array packages are smaller than those

32、 of LGA packages. 4 60191-6-6 IEC:2001 MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES Part 6-6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages Design guide for fine-pitch land grid array (FLGA) 1 Scope This part of IEC 60191 provides commo

33、n outline drawings and dimensions for all types of structures and composed materials of fine-pitch land grid array (hereinafter called FLGA) whose terminal pitch is less than, or equal to, 0,80 mm and whose package body outline is square. 2 Normative references The following normative documents cont

34、ain provisions which, through reference in this text, constitute provisions of this part of IEC 60191. For dated references, subsequent amendments to, or revisions of, any of these publications do not apply. However, parties to agreements based on this part of IEC 60191 are encouraged to investigate

35、 the possibility of applying the most recent editions of the normative documents indicated below. For undated references, the latest edition of the normative document referred to applies. Members of IEC and ISO maintain registers of currently valid International Standards. IEC 60191 (all parts), Mec

36、hanical standardization of semiconductor devices 3 Definitions For the purposes of this part of IEC 60191, the following definitions, as well as those given in the other parts of this standard, apply. 3.1 flanged type type whose package body size (body length and width) consists of its own flange co

37、mposed around the encapsulation or lid 3.2 type of real chip size type whose package body size (body length and width) consists of an encapsulation around the real chip only 3.3 FLGA packages with metal lands or metal bumps of which the terminal height is less than, or equal to, 100 m, and whose ter

38、minal pitch is less than, or equal to, 0,80 mm, positioned in an array on the base plane of the package as external terminals This package structure makes it possible to surface-mount the packages to the printed circuit board 60191-6-6 IEC:2001 5 3.4 material designation FLGA packages are classified

39、 according to the following two material designations: 3.4.1 plastic type (P-FLGA) plastic-type classification is assigned to packages which consist of resin substrate as interposer material (for example, glass-epoxy, poly-imid) 3.4.2 ceramic type (C-FLGA) ceramic-type classification is assigned to

40、packages which consist of ceramic substrate as interposer material 6 60191-6-6 IEC:2001 Design guide for fine-pitch land grid array family IEC 300/01 60191-6-6 IEC:2001 7 NOTE 1 Zone of a visible index on the top surface. NOTE 2 Datum A and B are the axes defined by the terminal positions indicated

41、with datum targets. NOTE 3 Primary datum S and seating plane to be defined by the method of least squares of spherical crowns of terminals. 8 60191-6-6 IEC:2001 Table 1 Group 1: Dimensions appropriate to mounting and interchangeability Ref. Limits to be observed Recommended values for the dimensions

42、 mm Note Min. Nom. Max. n X 1, 2 nD X 1 nE X A X A max. = 1,20, 1,70, 2,00 Includes heat slug Includes package warpage and tilt A 1X A 1max. = 0,10 b X X X At ceramic FLGA (C-FLGA) Min. Nom. Max. at e = 0,80 0,45 0,50 0,55 at e = 0,65 0,35 0,40 0,45 at e = 0,50 0,25 0,30 0,35 at e = 0,40 0,20 0,25 0

43、30 At plastic FLGA (P-FLGA) Min. Nom. Max. at e = 0,80 0,35 0,40 0,45 at e = 0,65 0,28 0,33 0,38 at e = 0,50 0,20 0,25 0,30 at e = 0,40 0,15 0,20 0,25 D X At flanged type D = 4,0, 5,0, 6,0, 7,0, 8,0, 9,0, 10,0, 11,0, 12,0, 13,0, 14,0, 15,0, 16,0, 17,0, 18,0, 19,0, 20,0, 21,0 At type of real chip si

44、ze D = from 3,1 to 21,0 Dimension range shows nominal value E X At flanged type E = 4,0, 5,0, 6,0, 7,0, 8,0, 9,0, 10,0, 11,0, 12,0, 13,0, 14,0, 15,0, 16,0, 17,0, 18,0, 19,0, 20,0, 21,0 At type of real chip size E = from 3,1 to 21,0 Dimension range shows nominal value e X e = 0,80, 0,65, 0,50, 0,40 v

45、 X v = 0,15 Includes burrs w X at e = 0,80 w = 0,20 at e = 0,65 w = 0,20 at e = 0,50 w = 0,20 at e = 0,40 w = 0,15 x X at e = 0,80 x = 0,08 at e = 0,65 x = 0,08 at e = 0,50 x = 0,05 at e = 0,40 x = 0,05 60191-6-6 IEC:2001 9 Table 1 (continued) Ref. Limits to be observed Recommended values for the di

46、mensions mm Note Min. Nom. Max. y X at e = 0,80 y = 0,10 at e = 0,65 y = 0,10 at e = 0,50 y = 0,08 at e = 0,40 y = 0,08 y 1X y 1 = 0,2 NOTE 1 The values stipulated by the mathematical expression should be applied to the individual overall dimensional standards. NOTE 2 Symbol n refers to the total nu

47、mber of terminal positions. Table 2 Group 2: Dimensions appropriate to mounting and gauging Ref. Limits to be observed Recommended values for the dimensions mm Note Min. Nom. Max. b2 X At ceramic FLGA (C-FLGA) at e = 0,80 b2 = 0,63 at e = 0,65 b2 = 0,53 at e = 0,50 b2 = 0,40 at e = 0,40 b2 = 0,35 At

48、 plastic FLGA (P-FLGA) at e = 0,80 b2 = 0,53 at e = 0,65 b2 = 0,46 at e = 0,50 b2 = 0,35 at e = 0,40 b2 = 0,30 e X e = 0,80, 0,65, 0,50, 0,40 eD X eD = e x (nD 1) 1 aeE X eE = e x (nE 1) aSee note 1 of table 1. 10 60191-6-6 IEC:2001 Table 3 Group 3: Dimensions appropriate to automated handling Ref.

49、Limits to be observed Recommended values for the dimensions mm Note Min. Nom. Max. A X A max. = 1,20, 1,70, 2,00 Includes heat slug Includes package warpage and tilt D X D/E = 4,0, 5,0, 6,0, 7,0, 8,0, 9,0, 10,0, 11,0, 12,0, 13,0, 14,0, 15,0, 16,0, E X 17,0, 18,0, 19,0, 20,0, 21,0 y 1X y 1= 0,2 Table 4 Group 4: Dimensions for information only Ref. Limits to be observed Recommended

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