1、 IEC 61180 Edition 1.0 2016-06 INTERNATIONAL STANDARD NORME INTERNATIONALE High-voltage test techniques for low-voltage equipment Definitions, test and procedure requirements, test equipment Techniques des essais haute tension pour matriel basse tension Dfinitions, exigences et modalits relatives au
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19、ents - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 61180 Edition 1.0 2016-06 INTERNATIONAL STANDARD NORME INTERNATIONALE High-voltage test techniques for low-voltage equipment Definitions, test and
20、 procedure requirements, test equipment Techniques des essais haute tension pour matriel basse tension Dfinitions, exigences et modalits relatives aux essais, matriel dessai INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE ICS 19.080 ISBN 978-2-8322-3366-5 Registe
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22、ur agr. colour inside 2 IEC 61180:2016 IEC 2016 CONTENTS FOREWORD . 5 1 Scope 7 2 Normative references. 7 3 Terms and definitions 8 3.1 General terms . 8 3.2 Definitions related to disruptive discharge and test voltages . 8 3.3 Characteristics related to the test equipment . 9 3.4 Characteristics re
23、lated to direct voltage tests . 9 3.5 Characteristics related to alternating voltage tests . 10 3.6 Characteristics related to impulse tests (see Figure 1) . 11 3.7 Definitions relating to tolerance and uncertainty . 12 4 General requirements 13 4.1 General . 13 4.2 Atmospheric conditions for test p
24、rocedures and verification of test equipment 14 4.3 Procedures for qualification and use of measuring systems 14 4.3.1 General principles 14 4.3.2 Schedule of performance tests . 15 4.3.3 Requirements for the record of performance . 15 4.3.4 Uncertainty 15 4.4 Tests and test requirements for an appr
25、oved measuring system and its components 16 4.4.1 Calibration Determination of the scale factor 16 4.4.2 Influence of load 18 4.4.3 Dynamic behaviour 18 4.4.4 Short-term stability . 19 4.4.5 Long-term stability . 19 4.4.6 Ambient temperature effect 20 4.4.7 Uncertainty calculation of the scale facto
26、r . 20 4.4.8 Uncertainty calculation of time parameter measurement (impulse voltages only) 22 5 Tests with direct voltage 25 5.1 General . 25 5.2 Test voltage 25 5.2.1 Requirements for the test voltage . 25 5.2.2 Generation of the test voltage 25 5.2.3 Measurement of the test voltage . 25 5.3 Test p
27、rocedures 26 5.3.1 Withstand voltage tests 26 6 Tests with alternating voltage . 27 6.1 Test voltage 27 6.1.1 Requirements for the test voltage . 27 6.1.2 Generation of the test voltage 27 6.1.3 Measurement of the test voltage . 28 6.2 Test procedures 30 6.2.1 Withstand voltage tests 30 7 Tests with
28、 impulse voltage . 30 IEC 61180:2016 IEC 2016 3 7.1 Test voltage 30 7.1.1 General . 30 7.1.2 Requirements for the test voltage . 31 7.1.3 Generation of the test voltage 31 7.1.4 Measurement of the test voltage and determination of impulse shape 32 7.2 Test procedures 32 7.2.1 Verification of impulse
29、 voltage waveshape 32 7.2.2 Impulse voltage tests . 32 7.3 Measurement of the test voltage 32 7.3.1 Requirements for an approved measuring system . 32 7.3.2 Uncertainty contributions 33 7.3.3 Dynamic behaviour 33 7.3.4 Requirements for measuring instrument 33 8 Reference measurement systems 33 8.1 R
30、equirements for reference measuring systems . 33 8.1.1 Direct voltage. 33 8.1.2 Alternating voltage . 33 8.1.3 Impulse voltages 33 8.2 Calibration of a reference measuring system 33 8.2.1 General . 33 8.2.2 Reference method: comparative measurement . 34 8.3 Interval between successive calibrations o
31、f reference measuring systems 34 8.4 Use of reference measuring systems . 34 Annex A (informative) Uncertainty of measurement . 35 A.1 General . 35 A.2 Terms and definitions in addition to 3.7 35 A.3 Model function 36 A.4 Type A evaluation of standard uncertainty . 36 A.5 Type B evaluation of standa
32、rd uncertainty . 37 A.6 Combined standard uncertainty . 38 A.7 Expanded uncertainty 39 A.8 Effective degrees of freedom . 40 A.9 Uncertainty budget 40 A.10 Statement of the measurement result 41 Annex B (informative) Example for the calculation of measuring uncertainties in high- voltage measurement
33、s 43 Annex C (informative) Atmospheric correction 47 C.1 Standard reference atmosphere . 47 C.2 Atmospheric correction factor 47 C.2.1 General . 47 C.2.2 Humidity correction factor k 2. 47 C.2.3 Air density correction factor k 148 Bibliography . 49 Figure 1 Full impulse voltage time parameters 11 Fi
34、gure 2 Calibration by comparison over the full voltage range 17 Figure 3 Uncertainty contributions of the calibration (example with a minimum of 5 voltage levels) 18 4 IEC 61180:2016 IEC 2016 Figure 4 Shaded area for acceptable normalised amplitude-frequency responses of measuring systems intended f
35、or single fundamental frequencies f nom(to be tested in the range (1.7) f nom ) . 29 Figure 5 Shaded area for acceptable normalised amplitude-frequency responses of measuring systems intended for a range of fundamental frequencies f nom1to f nom2(to be tested in the range f nom1 to 7 f nom2 ) 29 Fig
36、ure 6 1,2/50 s standard impulse voltage . 31 Figure A.1 Normal probability distribution p(x) . 42 Figure A.2 Rectangular probability distribution p(x) . 42 Table 1 Tests required for an approved direct voltage measuring system 26 Table 2 Minimum currents of the test circuit 27 Table 3 Tests required
37、 for an approved alternating voltage measuring system . 30 Table 4 Tests required for an approved impulse voltage measuring system . 33 Table A.1 Coverage factor k for effective degrees of freedom eff(p = 95,45 %) 40 Table A.2 Schematic of an uncertainty budget 41 Table B.1 Result of the comparison
38、measurement up to 500 V at a single voltage level . 44 Table B.2 Summary of results for h = 5 voltage levels (V Xmax= 500 V) . 45 Table B.3 Uncertainty budget of the assigned scale factor F X. 46 IEC 61180:2016 IEC 2016 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ HIGH-VOLTAGE TEST TECHNIQUES FOR L
39、OW-VOLTAGE EQUIPMENT Definitions, test and procedure requirements, test equipment FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to pro
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49、 the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61180 has been prepared by IEC technical committee 42: High- voltage and high-current test techniques. This 1 stedition of IE
