IEEE C37 118 1A-2014 en Synchrophasor Measurements for Power Systems Amendment 1 Modification of Selected Performance Requirements《电力系统相位同步器测量 修改件1 选定的性能要求的修改》.pdf

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1、 IEEE Standard for Synchrophasor Measurements for Power Systems Amendment 1: Modification of Selected Performance Requirements Sponsored by the Power System Relaying Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std C37.118.1a-2014(Amendment to IEEE Std

2、C37.118.1-2011) IEEE Std C37.118.1a-2014 (Amendment to IEEE Std C37.118.1-2011) IEEE Standard for Synchrophasor Measurements for Power Systems Amendment 1: Modification of Selected Performance Requirements Sponsor Power System Relaying Committee of the IEEE Power and Energy Society Approved 27 March

3、 2014 IEEE-SA Standards Board Abstract: Modifications in this amendment include some performance requirements with related text updates to correct inconsistencies and remove limitations introduced by IEEE Std C37.118.1-2011. It was discovered that a few requirements were not achievable with the publ

4、ished models as was intended and others were extremely difficult to meet with available hardware. This amendment modifies requirements in Table 4 through Table 10. Text was modified to support the requirement modification. Testing described in 5.5.9 was clarified, and Table 11 (formerly Table 12) wa

5、s modified to match. Annex C was modified to keep it consistent with the rest of the document. Keywords: data concentrator, FE, frequency error, IEEE C37.118.1, IEEE C37.118.1a, IRIG-B, PDC, phasor, phasor measurement, phasor measurement unit, PMU, RFE, ROCOF, ROCOF error, synchronized phasor, synch

6、rophasor, total vector error, TVE The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 30 April 2014. Printed in the United States of Americ

7、a. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: results; and workmanlike effort. IEEE standards docume

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9、ermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. In publishing and making its standards available, IEEE is not suggesting or rendering profes

10、sional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by any other person or entity to another. Any person utilizing any IEEE Standards document, should rely upon his or her own independent judgment in the exercise of reasonable care in

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13、 STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. Translations The IEEE consensus development process involves the review of documents in English only. In the event that an IEEE standard is translated, only the English version publish

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19、etation requests. Any person who would like to participate in revisions to an IEEE standard is welcome to join the relevant IEEE working group. Comments on standards should be submitted to the following address: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regul

20、ations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to t

21、he applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights IEEE draft and approved standards are copyrighted by IEEE under U.S. and i

22、nternational copyright laws. They are made available by IEEE and are adopted for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods.

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25、f any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Updating of IEEE Standards documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be ame

26、nded from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. Every IEEE standard is subjected to review at least eve

27、ry ten years. When a document is more than ten years old and has not undergone a revision process, it is reasonable to conclude that its contents, although still of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edi

28、tion of any IEEE standard. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/ieeexplore.ieee.org/xpl/standards.jsp or contact IEEE at the address listed p

29、reviously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.h

30、tml. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the e

31、xistence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of

32、 Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Ess

33、ential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licen

34、sing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of

35、 such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2014 IEEE. All rights reserved. vi Participants At the time this IEEE standard was completed, the Synchrophasor Measurements for Power Systems Working Group had the

36、following membership: Kenneth Martin, Chair Allen Goldstein, Vice Chair Mark Adamiak Galina Antonova Gabriel Benmouyal William Dickerson Yi Hu Mladen Kezunovic Harold Kirkham Ashish Kulshrestha Jalali Mansour Rene Midence Jay Murphy Krish Narendra Dean Ouellette Mahendra Patel Veselin Skendzic Gerar

37、d Stenbakken Eric Udren Zhiying Zhang The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Mohamed Abdel Khalek William Ackerman Mihaela Albu Jay Anderson Jason Bank Philip Beaumont Kenneth Behrendt Rob

38、ert Beresh Gustavo Brunello Paul Cardinal Stephen Conrad Luis Coronado Randall Crellin Randall Cunico Ratan Das William Dickerson Gary Donner Michael Dood Douglas Dorr Dan Dwyer Fredric Friend Frank Gerleve Vasudev Gharpure Jalal Gohari Roman Graf Stephen Grier Randall Groves Keith Harley Roger Hedd

39、ing Werner Hoelzl Yi Hu C. Huntley Brian Johnson Innocent Kamwa Bogdan Kasztenny Yuri Khersonsky James Kinney Joseph L. Koepfinger Jim Kulchisky Marc Lacroix Chung-Yiu Lam Raluca Lascu Shanshan Luo Kenneth Martin John McDonald Harish Mehta John Miller Brian Mugalian Bruce Muschlitz Michael Newman Ja

40、mes OBrien Gearold O. H. Eidhin Dean Ouellette Lorraine Padden Subhash Patel Charles Petras Ulrich Pohl Iulian Profir Farnoosh Rahmatian Michael Roberts Charles Rogers Miriam Sanders Steven Sano Sergio Santos Bartien Sayogo Thomas Schossig Veselin Skendzic James Smith Gerard Stenbakken Scott Sternfe

41、ld Gary Stoedter Charles Sufana William Taylor John Tengdin Michael Thompson Timothy Tibbals Demetrios Tziouvaras Joe Uchiyama Eric Udren John Vergis Ilia Voloh Karl Weber Philip Winston Sergio Zimath Copyright 2014 IEEE. All rights reserved. vii When the IEEE-SA Standards Board approved this standa

42、rd on 27 March 2014, it had the following membership: John Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Peter Balma Farooq Bari Ted Burse Clint Chaplin Stephen Dukes Jean-Philippe Faure Gary Hoffman Michael Janezic Jeffrey Katz Joseph

43、 L. Koepfinger* David J. Law Hung Ling Oleg Logvinov Ted Olsen Glenn Parsons Ron Petersen Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Don Wright Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative M

44、ichael Janezic, NIST Representative Julie Alessi IEEE-SA Content Publishing Erin Spiewak IEEE-SA Technical Community Programs Copyright 2014 IEEE. All rights reserved. viii Introduction This introduction is not part of IEEE Std C37.118.1a-2014, IEEE Standard for Synchrophasor Measurements for Power

45、Systems Amendment 1: Modification of Selected Performance Requirements. This amendment for IEEE Std C37.118.1-2011 was initiated to address issues brought up by users attempting to develop PMUs that meet the new performance requirements. The first issue was that the description for the latency measu

46、rement was not consistent with the latency test. The second issue was that the ramp test did not have a long enough exclusion interval for the M-class filters and could give different results depending on implementation. The third and major issue was that users found that frequency and rate of chang

47、e of frequency (ROCOF) requirements were very difficult to meet with available hardware and with the reference model provided in Annex C. At the time of publication, these requirements were new and largely untested with practical PMUs. New implementations that focused on ROCOF requirements had degra

48、ded phasor and/or frequency measurement results. The Working Group decided the best approach was to relax or suspend ROCOF and/or frequency requirements to be sure PMU implementations would satisfy all requirements. Analysis of each test showed how errors in phasors, frequency, and ROCOF affected ea

49、ch other. Performance requirements were modified to assure they are consistent for each test and between tests. This amendment also corrects a few typographic errors in the standard. Annex C was updated to match the modified requirements. Copyright 2014 IEEE. All rights reserved. ix Contents 4. Synchrophasor measurement 2 4.3 Measurement time synchronization . 2 5. Synchrophasor measurement requirements and compliance verification . 2 5.5 Measurement compliance 2 Annex C (informative) Reference signal processing models . 9 C.1 Introduction . 9 C.4 Positive sequence,

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