1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationLiquid crystal display devicesPart 6-3: Measuring methods for liquid crystal display modules Motion artifact measurement of active matrix liquid crystal display modulesBS EN 6174
2、7-6-3:2011National forewordThis British Standard is the UK implementation of EN 61747-6-3:2011. It is identical to IEC 61747-6-3:2011.The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors.A list of organizations represented on this committee can be obtai
3、ned on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. BSI 2011ISBN 978 0 580 60028 9 ICS 31.120 Compliance with a British Standard cannot confer immunity from legal obligations.This
4、British Standard was published under the authority of the Standards Policy and Strategy Committee on 30 September 2011.Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN 61747-6-3:2011EUROPEAN STANDARD EN 61747-6-3 NORME EUROPENNE EUROPISCHE NORM September 2011 CENEL
5、EC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide
6、 for CENELEC members. Ref. No. EN 61747-6-3:2011 E ICS 31.120 English version Liquid crystal display devices - Part 6-3: Measuring methods for liquid crystal display modules - Motion artifact measurement of active matrix liquid crystal display modules (IEC 61747-6-3:2011) Dispositifs daffichage cris
7、taux liquides - Partie 6-3: Mthodes de mesure pour les modules daffichage cristaux liquides - Mesure de lartefact de mouvement dans les modules daffichage cristaux liquides matrice active (CEI 61747-6-3:2011) Flssigkristall-Anzeige-Bauelemente - Teil 6-3: Messverfahren fr Bewegungsartefakte bei Akti
8、v-Matrix-LCD-Modulen (IEC 61747-6-3:2011) This European Standard was approved by CENELEC on 2011-08-17. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alterat
9、ion. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by tran
10、slation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, E
11、stonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. BS EN 61747-6-3:2011EN 61747-6-3:2011 Foreword The text of docu
12、ment 110/296/FDIS, future edition 1 of IEC 61747-6-3, prepared by IEC TC 110, Flat panel display devices, was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 61747-6-3:2011. The following dates are fixed: latest date by which the document has to be implemented at national le
13、vel by publication of an identical national standard or by endorsement (dop) 2012-05-17 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2014-08-17 Attention is drawn to the possibility that some of the elements of this document may be the subject
14、of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 61747-6-3:2011 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliog
15、raphy, the following notes have to be added for the standards indicated: IEC 61747-1:2003 NOTE Harmonized as EN 61747-1:1999 + A1:2003 (not modified). IEC 61747-5:1998 NOTE Harmonized as EN 61747-5:1998 (not modified). ISO 9241-307 NOTE Harmonized as EN ISO 9241-307. ISO 11664-4:2008 NOTE Harmonized
16、 as EN ISO 11664-4:2011 (not modified). BS EN 61747-6-3:2011EN 61747-6-3:2011 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following referenced documents are indispensable for the application of this document. For dated re
17、ferences, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title
18、 EN/HD Year IEC 61747-6 - Liquid crystal and solid-state display devices - Part 6: Measuring methods for liquid crystal modules - Transmissive type EN 61747-6 - BS EN 61747-6-3:201161747-6-3 IEC:2011 CONTENTS 1 Scope . . 6 2 Normative references . 6 3 Terms and definitions . 6 4 Abbreviations . 7 5
19、Standard measuring conditions . 7 5.1 Temperature, humidity and pressure conditions . 7 5.2 Illumination condition . . 7 6 Standard motion-blur measuring methods . 8 6.1 General . 8 6.2 Direct measurement method 8 6.2.1 Standard measuring process . 8 6.2.2 Test patterns . . 8 6.2.3 Analysis method .
20、 . 10 6.3 Indirect measurement method . . 12 6.3.1 Temporal step response . 12 6.3.2 High speed camera 15 7 Test report 16 7.1 General . . 16 7.2 Items to be reported . 16 7.2.1 Environmental conditions 16 7.2.2 Display parameters 16 7.2.3 Measuring method and conditions 16 7.2.4 Analysis method . .
21、 16 Annex A (informative) Subjective test method 18 Annex B (informative) Motion contrast degradation . 19 Annex C (informative) Dynamic modulation transfer function . 21 Bibliography . 23 Figure 1 Examples of edge blur test pattern . 8 Figure 2 Example of a pivoting pursuit camera system . 9 Figure
22、 3 Example of a linear pursuit camera system . 9 Figure 4 Example of luminance cross section profile of blurred edge . . 11 Figure 5 Example of luminance cross section profile of blurred edge . . 11 Figure 6 PBET calculation 12 Figure 7 Set-up to measure the temporal step response 13 Figure 8 Exampl
23、e of a LC response time measurement 14 Figure 9 Example of a motion picture response curve derived from the response measurement presented in Figure 8, and a convolution with a one frame wide window function. 15 Figure 10 Example of measurement data reporting . 17 Figure B.1 Example of motion contra
24、st degradation test pattern . 19 Figure B.2 Example of motion contrast degradation due to line spreading . . 20 Figure C.1 Example of motion contrast degradation 21 BS EN 61747-6-3:201161747-6-3 IEC:2011 Figure C.2 Example of DMTF properties for different motion speeds (V) . 22 Table 1 Step response
25、 data for different luminance transitions . . 10 BS EN 61747-6-3:2011 6 61747-6-3 IEC:2011 LIQUID CRYSTAL DISPLAY DEVICES Part 6-3: Measuring methods for liquid crystal display modules Motion artifact measurement of active matrix liquid crystal display modules 1 Scope This part of IEC 61747 applies
26、to transmissive type active matrix liquid crystal displays. This standard defines general procedures for quality assessment related to the motion performance of LCDs. It defines artifacts in the motion contents and methods for motion artifact measurement. NOTE Motion blur measurement methods and ana
27、lysis methods introduced in this standard could not be universal tools for all different LCD motion enhancement technologies due to its complexity. Users shall be notified of these circumstances. 2 Normative references The following referenced documents are indispensable for the application of this
28、document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 61747-6, Liquid crystal and solid-state display devices Part 6: Measuring methods for liquid crystal modules Transmissive type
29、 3 Terms and definitions For the purposes of this document, the following terms and definitions apply. 3.1 motion picture response curve a curve, representing the convolution of the temporal step response with a moving window function of 1-frame wide. It shows how the luminance is integrated over ti
30、me during smooth pursuit eye tracking and combines the effects of the LCD response time and the hold-type characteristics of the device under test 3.2 motion induced edge profile luminance profile of an intrinsically sharp moving luminance transition when this transition is followed with smooth purs
31、uit eye tracking along its motion trajectory NOTE The profile can be calculated from the motion picture response curve for any given motion speed. 3.3 edge blur blur that becomes visible on an intrinsically sharp transition between two adjacent areas, with a different luminance level, when the trans
32、ition smoothly moves across the display as a function of time. NOTE Preconditions for this type of edge blur are smooth pursuit eye tracking of the object, and no obvious flicker, indicating that luminance integration with a frame period is allowed. This blur phenomenon is mainly caused by a slow re
33、sponse time of the liquid crystal cell in combination with the hold-type characteristics. BS EN 61747-6-3:201161747-6-3 IEC:2011 7 3.4 perceived blurred edge time time-related equivalent of the perceived blurred edge width. The latter one is derived from the motion induced edge profile by means of f
34、iltering the edge profile with the contrast sensitivity function of the human eye 4 Abbreviations For the purpose of this document, the following abbreviations apply. BET blurred edge time BEW blurred edge width CCD charge-coupled device CIE Commission Internationale de lEclairage (international com
35、mission on illumination) CMOS complimentary metal-oxide semiconductor CSF contrast sensitivity function DMTF dynamic modulation transfer function DUT display under test DVI digital visual interface EBET extended blurred edge time FFT fast Fourier transform IEC International Electrotechnical Commissi
36、on ISO International Organization for Standardization JND just noticeable difference LCD liquid crystal display LMD light measuring device LVDS low-voltage differential signaling MCD motion contrast degradation MPRC motion picture response curve MTF modulation transfer function PBET perceived blurre
37、d edge time PBEW perceived blurred edge width TN-LCD twisted nematic liquid crystal display VA-LCD vertically-aligned liquid crystal display 5 Standard measuring conditions 5.1 Temperature, humidity and pressure conditions The standard environmental condition for the motion artifact measurement is (
38、25 3) C for temperature, 25 % to 85 % for relative humidity, and 86kPa to 106kPa for air pressure. All visual inspection tests shall be tested in (25 5) C. 5.2 Illumination condition The illuminance at the measuring spot of the DUT shall be below 1 lx (standard dark room condition as defined in IEC
39、61747-6). BS EN 61747-6-3:2011 8 61747-6-3 IEC:2011 6 Standard motion-blur measuring methods 6.1 General Motion induced object blur is the result of a slow response of the liquid crystal cells and a stationary representation of the temporal image (related to the hold time of the display), in combina
40、tion with smooth pursuit eye-tracking of an object over the display surface. When an object moves across the display and the eye is tracking this object, a spatiotemporal integration of the object luminance is taken place at the human retina. There are several ways to measure and characterize this s
41、patiotemporal integration, via a direct measurement or via an indirect measurement technique. For direct measurements a pursuit camera system can be used, and the indirect measurement is based on measuring the temporal response curves and from those curves the motion induced object blur that will oc
42、cur on the retina can be calculated. Both direct and indirect measurements will be described in this standard. 6.2 Direct measurement method 6.2.1 Standard measuring process 6.2.2 Test patterns There are several patterns that can be used to measure motion induced object blur, such as full test patte
43、rn, box test pattern, and line bar test pattern (see Figure 1). The details of the used test pattern(s) shall be reported. When using a pursuit system, the width of the test pattern should be sufficiently wide, e.g. 5 time the advancement (step-width) per frame, to capture the total temporal respons
44、e of the display. It is recommended that a minimum of seven gray shades, including black and white, are used for gray level of each part of a test pattern in Figure 1. The lightness function, specified in CIE 1976 (L*u*v*) and CIE 1976 (L*a*b*) color spaces, can be used to space the intermediate gra
45、y shades equally on the lightness scale. One of gray level data that are available at the LCD modules input, e.g. 0 to 255 for an 8-bit LCD module, also can be used as this gray level. (A) Full test pattern (B) Box test pattern (C) Line bar test pattern IEC 1605/11 Figure 1 Examples of edge blur tes
46、t pattern 6.2.2.1 Pursuit detection system Measuring edge blur of the LCD module should be done by using CCD camera with the pursuit measurement system shown in Figure 2 and Figure 3. Relevant literature on these systems can be found in the bibliography, references 11to 5. _ 1Figures in square brack
47、ets refer to the Bibliography. BS EN 61747-6-3:201161747-6-3 IEC:2011 9 Pursuing speed (v) LMD with pursuing system Captured image on CCD Moving pattern scroll speed (v) IEC 1606/11 Figure 2 Example of a pivoting pursuit camera system Moving test pattern Linear pursuing LMD system Captured image LCD
48、 module IEC 1607/11 Figure 3 Example of a linear pursuit camera system The following guidelines are recommended when implementing the pursuit measuring system: a) LMD: CCD or CMOS type surface measurement devices (CCD camera), with preferably an integrated CIE 1931 photopic luminous sensitivity func
49、tion (measuring luminance). b) Scroll speed: the scroll speed of test pattern and the pursuing speed of LMD shall be synchronized accurately to prevent integration errors. c) Pursuing system: either pivoting or linear pursuit system shown in Figure 2 and Figure 3, respectively. The angular rotation shall be limited to avoid viewing-angle related dependencies (less than 5). BS EN 61747-6-3:2011 10 61747-6-3 IEC:2011 6.2.2.2 Specified condit
