1、DEUTSCHE NORM Mav 1998 I GPS - Surface texture: Profile method Motif parameters - (IS0 12085 : 1996) Enalish version of DIN EN IS0 12085 IEN IS0 12085 ICs 17.040.20 Descriptors: GPS, surface texture, stylus instruments, parameters. Geometrische Produktspezifikationen (GPS) - Oberflchen- beschaffenhe
2、it: Tastschnittverfahren - Motifkenngren (IS0 12085 : 1996) European Standard EN IS0 12085 : 1997 has the status of a DIN Standard. A comma is used as the decimal marker. National foreword This standard has been published in accordance with a decision taken by CEN/TC 290 to adopt, without alteration
3、, International Standard IS0 12085 as a European Standard. The responsible German body involved in its preparation was the Normenausschu Technische Grundlagen (Fundamentals in Technology Standards Committee), Technical Committee Geometrische Produkt- Spezifikation und -Prfung. The DIN Standards corr
4、esponding to the International Standards referred to in clause 2 of the EN are as follows: IS0 1302 DIN IS0 1302 IS0 3274 IS0 4288 DIN EN IS0 3274 DIN EN IS0 4288 National Annex NA Standards referred to (and not included in Normative references) DIN EN IS0 3274 GPS - Surface texture: Profile method
5、- Nominal characteristics of contact (stylus) in- struments (IS0 3274 : 1996) DIN EN IS0 4288 GPS - Surface texture: Profile method - Rules and procedures for the assessment of surface texture (IS0 4288 : 1996) EN comprises 20 pages. No pari of this standard may be reproduced without the prior permi
6、ssion of Ref. No. DIN EN IS0 12085 : 1998-0 V Deutsches Institut fr Nonung e. V., Berlin. Luth Verlag GmbH, D-10772 Berlin, has the exclusive right of sale for German Standards (DIN-Normen). English price group 12 Sales No. 11 12 10.98 EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN IS012085 De
7、cember 1997 ICs 17.040.20 Descriptors: GPS, surface texture, stylus instruments, parameters. English version Geometrical Product Specification (GPS) Motif parameters (IS0 12085 : 1996) Surface texture: Profile method Spcification gomtrique des Geometrische Produktspezifikationen produits (GPS) - Eta
8、t de surface: Mthode du profil - Paramtres lis aux motifs (IS0 12085 : 1996) (GPS) - Oberflchenbeschaffenheit: Tastschnittverfahren - Motifkenn- gren (IS0 12085 : 1996) This European Standard was approved by CEN on 1997-1 1-02. CEN members are bound to comply with the CENKENELEC Internal Regulations
9、 which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national stand- ards may be obtained on application to the Central Secretariat or to any CEN member. The Europea
10、n Standards exist in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CEN member into its own language and notified to the Central Secretariat has the same status as the official versions. CEN members are the nationa
11、l standards bodies of Austria, Belgium, the Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, the Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and the United Kingdom. CEN European Committee for Standardization Comit Europen de Normalisation
12、 Europisches Komitee fr Normung Central Secretariat: rue de Stassart 36, 8-1050 Brussels O 1997. CEN -All rights of exploitation in any form and by any means reserved worldwide for CEN national members. Ref. No. EN IS0 12085 : 1997 E Page 2 EN IS0 12085 : 1997 Foreword International Standard IS0 120
13、85 : 1996 Geometrical Product Specification (GPS) - Surface texture: Profile method - Motif param- eters, which was prepared by ISO/TC 57 Metrology and properties of surfaces of the International Organization for Standardization, has been adopted by Technical Committee CEN/TC 290 Dimensional and geo
14、metrical prod- uct specification and verification, the Secretariat of which is held by DIN, as a European Standard. This European Standard shall be given the status of a national standard, either by publication of an identical text or by endorsement, and conflicting national standards withdrawn, by
15、June 1998 at the latest. In accordance with the CENKENELEC Internal Regulations, the national standards organizations of the follow- ing countries are bound to implement this European Standard: Austria, Belgium, the Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy,
16、Luxembourg, the Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and the United Kingdom. Endorsement notice The text of the International Standard IS0 12085 : 1996 was approved by CEN as a European Standard without any modification. Contents 1 Scope 2 Normative references . 3 Definitions .
17、 3.1 General definitions . 3.2 Parameter definitions . 4 Theoretically exact operator of the motif method . 4.1 General . 4.2 Conventional limits of motifs 4.3 Depth discrimination 4.4 Identification of roughness and waviness motifs through the combination of motifs . 4.5 Procedure for parameter c 5
18、 Measuring conditions of parameters 5.1 Convention concerning traversing the primary profile . 5.2 Recommended measurement conditions. . 5.3 Profile quantization step 5.4 Rule for acceptance 5.5 Use of motifs method for analysis of multiprocecc surfaces 5.6 Indications on the drawings . Annexes A Ca
19、lculation method for combination of motifs . B Relation between motif parameters and function of surfaces . C Relation to the GPS matrix model D Bibliography Page 3 3 3 3 5 7 7 7 7 10 12 14 14 14 14 14 14 14 15 18 19 20 Page 3 EN IS0 12085 : 1997 Introduction This International Standard is a Geometr
20、ical Product Specification (GPS) standard and is to be regarded as a General GPS standard (see ISO/TR 14638). It influences links 2, 3 and 4 of the surface texture chain of standards on roughness profile and waviness profile. For more detailed information of the relation of this International Standa
21、rd to other GPS standards, see annex C. The approach described in this International Standard facilitates the de- termining roughness and waviness parameters from the primary profile by finding those motifs which characterize the surface under consideration. This method is independent of any profile
22、 filter and results in parameters which are based on the depth and spacing of the motifs. These par- ameters, which are complementary to those defined in IS0 4287, can be used to describe the functional properties of workpieces as indicated in Annex 8. 1 Scope This International Standard defines ter
23、ms and parameters used for determining surface texture by the motif method. It also describes the corresponding ideal operator and measuring conditions. 2 Normative references The following standards contain provisions which, through reference in this text, constitute provisions of this Inter- natio
24、nal Standard. At the time of publication, the editions indicated were valid. All standards are subject to revision, and parties to agreements based on this International Standard are encouraged to investigate the possibility of ap- plying the most recent editions of the standards indicated below. Me
25、mbers of IEC and IS0 maintain registers of currently valid International Standards. IS0 1302: 1992, Technical drawings - Method of indicating surface texture. IS0 3274: 1996, Geometrical Product Specifications (GPSI - Surface texture: Profile method - Nominal character- istics of contact (stylus) in
26、struments. IS0 4287: 1996, Geometrical Product Specifications (GPSI - Surface texture: Profile method - Terms, definitions and parameters of surface texture. IS0 4288:1996, Geometrical Product Specifications (GPS) - Surface texture: Profile method - Rules and pro- cedures for the assessment of surfa
27、ce texture. 3 Definitions For the purposes of this International Standard the following definitions apply. 3.1 General definitions 3.1.1 surface profile: (See IS0 4287.) 3.1.2 primary profile: (See IS0 3274.) Page 4 EN IS0 12085 : 1997 3.1.3 local peak of profile: A part of a profile between two adj
28、acent minima of the profile (see figure 1). /-Local peak of the profile Figure 1 - Local peak of profile 3.1.4 local valley of profile: A part of a profile between two adjacent maxima of the profile (see figure 2) ,-Local valley of the profile Figure 2 - Local valley of profile 3.1.5 motif: A portio
29、n of the primary profile between the highest points of two local peaks of the profile, which are not necessarily adjacent. A motif is characterized by (see figures 3 and 5): - its length, AR or AW, measured parallel to the general direction of the profile; - its two depths, H, and H,+ 1, or Hw, and
30、Hw,+ 1, measured perpendicular to the general direction of the primary profile; - its T characteristic, that is the smallest depth between the two depths. AR, T = MIN H, , U, ,I here. T = H, *, Figure 3 - Roughness motif 3.1.6 roughness motif: Motif derived by using the ideal operator with limit val
31、ue A (see figure 3) NOTE 1 By this definition, a roughness motif has a length ARi smaller than or equal to A. Page 5 EN IS0 12085 : 1997 3.1.7 upper envelope line of the primary profile (waviness profile): Straight lines joining the highest points peaks of the primary profile, after conventional dis
32、crimination of peaks (see figure 4). rUpper envelope line of Figure 4 - Upper envelope line 3.1.8 waviness motif: Motif derived on the upper envelope line by using the ideal operator with limit value B (see figure 5). T = MIN Hwj: HW, .,I here: i = Hw, . , Figure 5 -Waviness motif 3.2 Parameter defi
33、nitions 3.2.1 mean spacing of roughness motifs, AR: The arithmetical mean value of the lengths ARi of roughness mo- tifs, within the evaluation length (see figure 6), .e. AR=- 1“ AR n r=l where n is the number of roughness motifs (equal to the number of ARi values). 3.2.2 mean depth of roughness mot
34、ifs, R: The arithmetical mean value of the depths Hj of roughness motifs, within the evaluation length (see figure 61, .e. where m is the number of H, values. NOTE 2 lhe number of Hj values is twice the number of ARi values (rn = 2n) 3.2.3 maximum depth of profile irregularity, Rx: The largest depth
35、, Hj within the evaluation length EXAMPLE On figure 6: RX = fi3, Page 6 EN IS0 12085 : 1997 I + Figure 6 - Roughness parameters 3.2.4 mean spacing of waviness motifs, AW The arithmetical mean value of the lengths AW, of waviness mo- tifs, within the evaluation length (see figure 71, .e. ln AW=- AW,
36、n i=1 where n is the number of waviness motifs (equal to the number of AWi values) 3.2.5 mean depth of waviness motifs, W: The arithmetical mean value of the depths HwJ of waviness motifs, within the evaluation length (see figure 71, .e. W=-c lrn Hwj m. J =1 where m is the number of Hw, values NOTE
37、3 The number of Hw; values is twice the number of AW, values (rn = 2n) 3.2.6 maximum depth of waviness, Wx: The largest depth Hwj, within the evaluation length (see figure 7) 3.2.7 total depth of waviness, Wte: The distance, measured in a direction perpendicular to the general direction of the prima
38、ry profile, between the highest point and the lowest point of the upper envelope line of the primary profile (see figure 7) -7 Upper envelope Line Figure 7 -Waviness parameters Page 7 EN IS0 12085 : 1997 4 Theoretically exact operator of the motif method 4.1 General This clause describes the identif
39、ication conditions of motifs (length and depth discrimination) and presents the process for calculating roughness and waviness parameters. 4.2 Conventional limits of motifs The recommended values for limits A and B as described in figure 8 are given under clause 5. O - spacing s A I -. -. A - spacin
40、g I B - a) Roughness motits hi Waviness motifs Figure 8 - Conventional limits of motifs 4.3 Depth discrimination The depth discrimination applies to the primary profile for the assessment of surface roughness. 4.3.1 Discrimination based on minimum depth Divide the primary profile into sections of wi
41、dth A/2, and take the height of each rectangle The local peaks taken into account are those whose depth is larger than 5 % of the mean height of these rec- tangles (see figure 9). LLocal peak retained (example) -Local peak rejected (example) LHeight of this rectangle Figure 9 - Depth discrimination
42、Page 8 EN IS0 12085 : 1997 4.3.2 Discrimination based on maximum depth For the roughness motifs the depths of which are H, the value H/ (mean value of HI) and OH/ (standard devi- ation) are calculated. Any depth of local peak or valley the value of which is larger than H = % + l ,65 OH/, is lev- ell
43、ed equal to the H value (see figure 1 O). NOTE 4 If the distribution of H, is Gaussian, this condition concerns 5 YO of the peaks and valleys This discrimination obviates the risk of high isolated peaks interfering with the envelope line / Figure 10 - Discrimination based on maximum depth Page 9 EN
44、IS0 12085 : 1997 (Blank page) Page 1 O EN IS0 12085 : 1997 4.4 Identification of roughness and waviness motifs through the combination of motifs (These four conditions are related to figure 11 .) In figure 1 1, R stands for roughness and W for waviness. I Envelope condition The first condition retai
45、ns peaks, which are higher than one of the adjacent peaks. II Length condition The second condition limits the length of motif to the A value (conventional limit between roughness and waviness) or the B value (conventional limit between waviness and residual form), as defined in 4.2 and 5.2. 111 Enl
46、argement condition The third condition eliminates the smallest peaks, by trying to find the largest motif possible. It does not allow the combining of two motifs into one motif, longer than the two original ones, if it results in a mo- tif the T characteristic of which is smaller than one of the two
47、 original motifs. (it eliminates small peaks which are inserted between large peaks.) IV Similar depth condition The fourth condition limits combination of motifs with similar depths, particularly for periodical surfaces. (it avoids eliminating peaks the depth of which is similar to adjacent peaks.)
48、 The combination algorithm shall be applied until no further combination can be accomplished Page 11 EN IS0 12085 : 1997 No combination Possible cornblnation Conditions P, = P, and P, Examination of motif i and motif i + 1 , Condltlon I I Common peak 2 one of the adjacent peaks I NOi YES , Aor Condl
49、tion II I rAir.lI Length of motif L-_-_-J I AR, + 1 I AW, I (AR, + AR, 5 A (for Ri (A W, + A W, . qi 5 (for W) (AR, + AR, Il) - A (for Ri (AW, + AW!, .) - 8 (for W) NO YES Enlargement of the T characteristic of both motifs T - T1 or T2 I YES Condition IV e One of the depths 5 60 %of the T characteristic of the motif under consideration 1 NO 1 I YES Test if one other motif is available NO 1 /YES , AorB (ARi + AR, ,) 5 A (for R) (AW, + AW,. 5 (for W) I I H, or H, 5 60 % T (for R) Hw, or Hwj. 2 5 60 % T (for W) if two other motifs are
