1、 REVISIONS LTR DESCRIPTION YY-MM-DD APPROVED A Page 4: Correct table I to correspond with military specification requirements. 79-08-05 N. A. Hauck B Change from suggested source drawing to approved source drawing. Editorial changes throughout. 86-05-04 N. A. Hauck C Change to military drawing forma
2、t. Add alternate group A programmability sample test. Update vendors part number. Make changes to screening and group A inspection. 87-06-02 N. A. Hauck D Add device 02. Editorial changes throughout. 88-01-22 M. A. Frye E Changes in accordance with NOR 5962-R080-96. 96-03-22 M. A. Frye F Updated boi
3、lerplate. Removed programming specifics from drawing, including table III and table IV. Separated source bulletin from body of drawing. - glg 00-08-07 Raymond Monnin G Corrected marking paragraph 3.5, updated boilerplate paragraphs. ksr 05-03-01 Raymond Monnin H Updated boilerplate for 5 Year Review
4、. Correction of title. lhl 11-04-13 Charles F. Saffle THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. CURRENT CAGE CODE 67268 REV SHEET REV SHEET REV STATUS REV H H H H H H H H H OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY Joan M. Fisher DLA LAND AND MARITIME COLUMBUS, OHIO 432
5、18-3990 STANDARD MICROCIRCUIT DRAWING CHECKED BY C. R. Jackson http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY All DEPARTMENTS APPROVED BY N. A. Hauck MICROCIRCUITS, MEMORY, DIGITAL, 512 X 8 (4K), SCHOTTKY PROM, AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 79-02-20 MON
6、OLITHIC SILICON AMSC N/A REVISION LEVEL H SIZE A CAGE CODE 14933 78016 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E304-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78016 DLA LAND AND MARITIME COLUMBUS, OHIO 432
7、18-3990 REVISION LEVEL H SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN shall be as shown
8、in the following example: 78016 01 J X | | | | | | | | | | | |_ Drawing number Device type Case outline Lead finish (see 1.2.1) (see 1.2.2) (see 1.2.3) 1.2.1 Device type(s). The device type(s) shall identify the circuit function as follows: Device type Generic number Circuit Access time 01 1/ 512 x
9、8-bit Schottky PROM 90 ns 02 1/ 512 x 8-bit Schottky PROM 45 ns 1.2.2 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835, and as follows: Outline letter Descriptive designator Terminals Package style J GDIP1-T24 or CDIP2-T24 24 dual-in-line package K GDFP2-F24 or CDFP3-F24 2
10、4 flat package U CQCC1-N32 32 rectangular chip carrier package 3 CQCC1-N28 28 square leadless chip carrier package 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range . -0.5 V dc to +7.0 V dc Input voltage range . -1.5 V
11、 dc to +5.5 V dc Storage temperature range -65C to +150C Maximum power dissipation (PD): 2/ . 1.02 W Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) 3/ See MIL-STD-1835 Maximum junction temperature (TJ) . +175C Output sink current 100 mA 1.4 Recommended opera
12、ting conditions. Case operating temperature range (TC) -55C to +125C Input low voltage +10% supply (VIL) 0.8 V dc Input high voltage +10% supply (VIH) 2.0 V dc Supply voltage range (VCC) . 4.5 V dc to 5.5 V dc 1/ Generic numbers are listed on the Standard Microcircuit Drawing Source Approval Bulleti
13、n at the end of this document and will also be listed in MIL-HDBK-103. 2/ Must withstand the added PDdue to short-circuit test; e.g., IOS. 3/ Heat sinking is recommended to reduce the junction temperature. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-
14、,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78016 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this draw
15、ing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-88
16、3 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https
17、:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing shall take
18、 precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and
19、 as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers
20、approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification m
21、ark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Terminal connections. The terminal
22、connections shall be as specified on figure 1. 3.2.2 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over t
23、he full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The
24、part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. 3.5.1 Certification/compliance mark. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, Appendix A. 3.6 Certificate of compliance. A certificate of complian
25、ce shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the
26、requirements of MIL-PRF-38535, appendix A and the requirements herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78016 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 4 DSCC FORM 2234
27、APR 97 TABLE I. Electrical performance characteristics. 1/ Not more than one output shall be grounded at one time. Output shall be at high logic level prior to test. Test Symbol Conditions -55C TC +125C 4.5 V VCC 5.5 V unless otherwise specified Group A subgroups Device type Limits Unit Min Max High
28、 level output voltage VOHVIL= 0.8 V, VIH= 2.0 V IOH= -2.0 mA, VCC= 4.5 V 1, 2, 3 All 2.4 V Low level output voltage VOLVIL= 0.8 V, VIH= 2.0 V IOL= 8 mA, VCC= 4.5 V 1, 2, 3 All 0.5 Input clamp voltage VICVCC= 4.5 V, IIN= -18 mA 1, 2, 3 All -1.2 High impedance (off- state) output high current IOHZVCC=
29、 5.5 V, VO= 5.2 V 1, 2, 3 All 100 A High impedance (off- state) output low current IOLZVCC= 5.5 V, VO= 0.5 V 1, 2, 3 All -100 High level input current IIHVCC= 5.5 V, VIN= 5.5 V 1, 2, 3 All 50 Low level input current IILVCC= 5.5 V, VIN= 0.5 V 1, 2, 3 All -1.0 -250 Output short-circuit circuit IOSVCC
30、= 5.5 V, VO= 0 V 1/ 1, 2, 3 All -10 -100 mA Supply current ICCVCC= 5.5 V, VIN= 0 V Outputs open 1, 2, 3 All 185 Propagation delay time, address to output tAVQVVCC= 4.5 V and 5.5 V CL= 30 pF See Figure 2 9, 10, 11 01 90 ns 02 45 Propagation delay time, enable to output tEVQVVCC= 4.5 V and 5.5 V CL= 3
31、0 pF See Figure 2 9, 10, 11 01 50 02 25 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78016 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 5 DSCC FORM 2234 APR 97 3.7 Certificate of confo
32、rmance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime-VA shall be required for any change that affects this drawing. 3.9 Ver
33、ification and review. DLA Land and Maritime, DLA Land and Maritimes agent and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Processing opt
34、ions. Since the PROM is an unprogrammed memory capable of being programmed by either the manufacturer or the user to result in a wide variety of PROM configurations, two processing options are provided for the selection in the contract, using an altered item drawing. 3.10.1 Unprogrammed PROM deliver
35、ed to the user. All testing shall be verified through group A testing as defined in table II. It is recommended that users perform subgroups 7 and 9 after programming to verify the specific program configuration. 3.10.2 Manufacturer-programmed PROM delivered to the user. All testing requirements and
36、 quality assurance provisions herein, including the requirements of the altered item drawing shall be satisfied by the manufacturer prior to delivery. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening.
37、 Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test (method 1015 of MIL-STD-883). (1) Test condition A, B, C or D. The test circuit shall be ma
38、intained by the manufacturer under document revision level control and shall be made available to the preparing or procuring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015
39、 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. c. All devices processed to an altered item drawing may be
40、 programmed either before or after burn-in at the discretion of the manufacturer. The required electrical testing shall include, as a minimum, the final electrical tests for programmed devices as specified in table II.Provided by IHSNot for ResaleNo reproduction or networking permitted without licen
41、se from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78016 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 6 DSCC FORM 2234 APR 97 Device Types All Case Outlines J, K Case Outlines U 3 Terminal Number Terminal Symbol Terminal Number Terminal Symbol Terminal Symbol 1 2 3 4 5 6
42、7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 A7 A6 A5 A4 A3 A2 A1 A0 Q1 Q2 Q3 VSS Q4 Q5 Q6 Q7 Q8 CE4 CE3 CE 2 CE 1 NC A8 VCC - - - - - - - - - - - - - - - - - - - - - - - - 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 NC NC A7 A
43、6 A5 A4 A3 A2 A1 A0 NC Q1 Q2 Q3 NC VSS Q4 NC Q5 Q6 Q7 Q8 NC CE4 CE3 CE 2 NC CE 1 NC A8 NC VCC NC A7 A6 A5 A4 A3 A2 A1 A0 NC Q1 Q2 Q3 VSS NC Q4 Q5 Q6 Q7 Q8 NC CE4 CE3 CE 2 CE 1 NC A8 VCC - - - - - - - - - - - - FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking
44、 permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78016 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 7 DSCC FORM 2234 APR 97 NOTE: 1. AC characteristics tested with input transition time of 5 ns or less, timing reference levels of 1.5 V, and input
45、 pulse levels of 0 to 3.0 V using test load circuit provided by the manufacturer. FIGURE 2. Timing waveform.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78016 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REV
46、ISION LEVEL H SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883 method 5005, table I) Interim electrical parameters (method 5004) - Final electrical test parameters (method 5004) for unprogrammed devices 1*,
47、2, 3, 7*, 8 Final electrical test parameters (method 5004) for programmed devices 1*, 2, 3, 7*, 8, 9 Group A test requirements (method 5005) 1, 2, 3, 7, 8, 9, 10, 11 Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroups 1 and 7. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5
