1、 EIA STANDARD TP-59A Low Temperature Test Procedure for Electrical Connectors and Sockets EIA/ECA-364-59A (Revision of EIA 364-59) August 2006 ANSI/EIA-364-59A-2006 (R2013) Approved: August 28, 2006 Reaffirmed: January 28, 2013 EIA/ECA-364-59A NOTICE EIA Engineering Standards and Publications are de
2、signed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence
3、 of such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than
4、ECIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does
5、it assume any obligation whatever to parties adopting the Standard or Publication. This EIA Standard is considered to have International Standardization implication, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison between the EIA St
6、andard and the IEC document can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the ap
7、plicability of regulatory limitations before its use. (Created under Standards Proposal No. 5111 formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Socket Standards and reaffirmed per Standards Proposal No. 5252.10). Published by: Electronic Components Industry Ass
8、ociation 2013 Engineering Department 2214 Rock Hill Road, Suite 170 Herndon, VA 20170 PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into
9、 a license agreement. For information, contact: IHS 15 Inverness Way East Englewood, CO 80112-5704 or call USA and Canada (1-877-413-5184), International (303-397-7956) i Clause 1 CONTENTS Introduction .Page11.1 Scope . 11.2 Object 12 Test resources . 12.1 Test equipment 13 Test specimen 23.1 Descri
10、ption 23.2 Preparation 24 Test procedure . 24.1 Test temperature . 24.2 Test duration . 24.3 Specimen exposure . 35 Details to be specified . 36 Test documentation . 4Table 1 Test temperature . 22 Test duration . 2ii (This page left blank) EIA-364-59A Page 1 TEST PROCEDURE No. 59A LOW TEMPERATURE TE
11、ST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS (From EIA Standards Proposal No. 5111, formulated under the cognizance EIA CE-2.0 Committee on National Connector Standards, and previously published in EIA-364-59.) 1 Introduction 1.1 Scope This standard establishes a test method for exposing elect
12、rical connectors and sockets to low temperature for a specified duration. 1.2 Object The object of this test procedure is to provide a standardized method of exposing electrical connectors and sockets to sub-ambient temperatures. Measurements and observations made before, during and after the exposu
13、re shall be specified in the referencing document and may assess functionality of connectors and sockets at low temperatures. 2 Test resources 2.1 Equipment 2.1.1 A suitable chamber shall be used that will maintain, monitor and record the test temperature to the tolerance and for the duration specif
14、ied in the referencing document. The chamber temperature measurement shall be made in a manner that will indicate the specimen exposure temperature rather than the chamber temperature. 2.1.2 Forced air circulation and baffling devices may be used to maintain homogeneous conditions. 2.1.3 The chamber
15、 size or capacity shall be such that the specimens under test shall be capable of dissipating through air convection currents, any internally generated specimen heat. The specimens shall be arranged in the chamber in a manner that allows all to maintain the same temperature. EIA-364-59A Page 2 3 Tes
16、t specimen 3.1 Description A specimen shall consist of a mated assembly, unless otherwise specified in the referencing document. 3.2 Preparation Unless otherwise specified in the referencing document the specimens shall be wired, mated and mounted in the normal manner. The method of fixturing, when
17、specified in the referencing document, shall be such that the normal temperature dissipation, absorption, conduction reflection characteristics of the specimen is not infringed. 4 Test procedure 4.1 Test temperature The specimens shall be subjected to the test temperature as specified in the referen
18、cing document. Table 1 gives recommended test temperatures that may be specified. Table 1 Test temperature Condition Temperature Tolerance 1 -65 C 3 C 2 -55 C 3 C 3 -40 C 3 C 4 -25 C 3 C 5 -10 C 3 C 6 +5 C 3 C 4.2 Test duration The specimens shall be subjected to the test durations as specified in t
19、he referencing document. Table 2 gives recommended test durations that may be specified. Table 2 Test duration Condition Exposure time Tolerance A 2 hours -0, +0.25 hour B 16 hours -0, +1.0 hour C 72 hours -0, +5.0 hours D 96 hours -0, +5.0 hours E 240 hours -0, +5.0 hours F 500 hours -0, +10.0 hour
20、s G 1000 hours -0, +10.0 hours EIA-364-59A Page 3 4.3 Specimen exposure 4.3.1 The chamber shall be at room ambient temperature when the specimens are installed. 4.3.2 If specified in the referencing document, the electrical load shall be connected and proper operation verified. 4.3.3 The temperature
21、 within the chamber shall be adjusted and stabilized at the specified level. Unless otherwise specified in the referencing document the rate of temperature change within the chamber shall not exceed 1 C per minute, averaged over 5 minutes. 4.3.4 After the chamber temperature has stabilized, it shall
22、 be maintained for the length of time specified in the referencing document. 4.3.5 At the end of this period, the electrical load (if used) shall be disconnected, the specimens shall be left in the chamber and the temperature shall be gradually increased to room ambient temperature. The rate of temp
23、erature change within the chamber shall not exceed 1 C per minute, averaged over 5 minutes. 4.3.6 The test specimens shall be removed from the chamber. If necessary, unmated specimens may be carefully shaken by hand to remove water droplets that may have condensed on the specimen exterior surfaces.
24、Mated or unmated specimens may be blotted with a towel or gently blasted with air. If an air blast is used as an aid to drying, the air shall be oil free, clean and dry. Care shall be taken not to disturb mated contact interfaces. 4.3.7 Unless otherwise specified in the referencing document, the spe
25、cimens shall be examined visually and measured as specified in the referencing document, after 1 hour minimum, but not more than 2 hours after removal from the chamber. 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Number of specimens to be teste
26、d 5.2 Test temperature condition, see table 1 5.3 Test duration condition, see table 2 5.4 Dwell time at ambient temperature before measurements, if other than specified in 4.3.7. EIA-364-59A Page 4 5.5 Electrical load including voltage, current and wiring configuration, if specified 5.6 Special fix
27、turing and mounting, if required 5.7 Other special conditions and requirements 6 Test documentation Documentation shall contain the details specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.2 Specimen description, including fixturing if applicable 6.3 Test equipment
28、used, and date of last and next calibration 6.4 Name of operator and date of test ECIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below and mail or FAX
29、to: Electronic Components Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 170 Herndon, VA 20170 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Are
30、a: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Electronic Components Industry Association 2214 Rock Hill Road, Suite 170 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.eciaonline.org
