IEEE C37 122 1-2014 en Gas-Insulated Substations Rated Above 52 kV《52 kV级以上气体绝缘变电站》.pdf

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1、 IEEE Guide for Gas-Insulated Substations Rated Above 52 kV Sponsored by the Substations Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std C37.122.1-2014 (Revision of IEEE Std C37.122.1-1993) IEEE Std C37.122.1-2014 (Revision of IEEE Std C37.122.1-1993)

2、IEEE Guide for Gas-Insulated Substations Rated Above 52 kV Sponsor Substations Committee of the IEEE Power and Energy Society Approved 3 November 2014 IEEE-SA Standards Board Abstract: Information of special relevance to planning, design, testing, installation, operation and maintenance of gas-insul

3、ated substations (GIS) and equipment is provided in this guide, which is intended to supplement IEEE Std C37.122. This guide is applicable to all gas-insulated substations (GIS) above 52 kV. However, the importance of topics covered varies with application category. For example, the issues related t

4、o advanced field test techniques and very fast transients (VFT) are of particular interest for extra-high voltage (EHV) gas-insulated substations (GIS). Keywords: gas-insulated metal enclosed switchgear, gas-insulated substation, gas-insulated switchgear, GIS, GIS design, GIS equipment, GIS installa

5、tion, GIS testing, IEEE C37.122, SF6, sulfur hexafluoride, VFT, very fast transient, partial discharge, PD The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Institute of Electrical and Electronics Engineers, Inc. All rights

6、reserved. Published 5 December 2014. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all con

7、ditions relating to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provid

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19、EE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. I

20、mplementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights

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28、eexplore.ieee.org/xpl/standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Web

29、site at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publicati

30、on of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Web

31、site at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of an

32、y unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the

33、legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determin

34、ation of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this IEEE guide was completed, the K11 Working Group had the following memb

35、ership: David Solhtalab, Chair Godwin Duru, Vice Chair Arun Arora George Becker John Boggess Phil Bolin John Brunke Ed Crocket Ravi Dhara Markus Etter Arnaud Ficheux Patrick Fitzgerald Noboru Fujimoto Dave Giegel Peter Grossman Charles L. Hand Richard Jones Herman Koch Shawn Lav David Lin Hua Y. Liu

36、 Jorge Marques Pravakar Samanta Devki Sharma Ryan Stone Brian Withers Xi Zhu The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Ali Al Awazi Roy Alexander Ficheux Arnaud Arun Arora Rober

37、t Barnett Paul Barnhart George Becker Wallace Binder Michael Bio John Boggess James Bougie Chris Brooks Robert Christman Gary Donner Randall Dotson Edgar Dullni Douglas J Edwards Markus Etter Patrick Fitzgerald Frank Gerleve David Giegel Jalal Gohari Edwin Goodwin James Graham Randall Groves Ajit Gw

38、al Charles Hand David Harris Steven Hensley Lee Herron Gary Heuston Laszlo Kadar Richard Keil Yuri Khersonsky Hermann Koch Joseph L. Koepfinger Boris Kogan Jim Kulchisky Saumen Kundu Chung-Yiu Lam Michael Lauxman Hua Liu Albert Livshitz Jorge Marquez Omar Mazzoni Venkatesh Minisandram Georges Montil

39、let Dennis Neitzel Michael Newman T. W. Olsen Lorraine Padden Mirko Palazzo Moises Ramos Daniel Leland Ransom Johannes Rickmann John Roach Michael Roberts Jesse Rorabaugh Thomas Rozek Anne-Marie Sahazizian Bartien Sayogo Devki Sharma James Smith Jerry Smith Phillip Smitherman David Solhtalab John Sp

40、are Gary Stoedter Ryan Stone Malcolm Thaden John Togh John Vergis Mark Waldron John Wang Yingli Wen Kenneth White James Wilson Brian Withers Jian Yu Matthew Zeedyk Xi Zhu Copyright 2014 IEEE. All rights reserved. vi When the IEEE-SA Standards Board approved this guide on 3 November 2014, it had the

41、following membership: John Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Peter Balma Farooq Bari Ted Burse Clint Chaplin Stephen Dukes Jean-Philippe Faure Gary Hoffman Michael Janezic Jeffrey Katz Joseph L. Koepfinger* David J. Law Hun

42、g Ling Oleg Logvinov T. W. Olsen Glenn Parsons Ron Petersen Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Don Wright Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Represent

43、ative Patrick Gibbons IEEE-SA Content Publishing Erin Spiewak IEEE-SA Technical Community Programs Copyright 2014 IEEE. All rights reserved. vii Introduction This introduction is not part of IEEE Std C37.122.1-2014, IEEE Guide for Gas-Insulated Substations Rated Above 52 kV. IEEE Std C37.122-1983 wa

44、s initiated in the early 1970s when the first gas-insulated substations (GISs) were introduced. The reliability of GISs has improved greatly since the first installations. Utilities have taken advantage of the greater flexibility offered by GISs to locate substations closer to load centers with cons

45、iderable savings in transmission system costs and reduced system loses. In addition, a GIS typically offers 20 years or more of operation before major overhaul is required. During the Working Group and Subcommittee deliberations on the 1993 revision, it was recognized that users would be better serv

46、ed if the original document was divided in two, becoming IEEE Std C37.122 a(a standard) and IEEE Std C37.122.1 (a guide). The two documents can be referred to individually or jointly depending on the purpose. This is the guides first major revision since it was published. This is a general update ba

47、sed on the latest technology and user experience. The subcommittee would like to acknowledge CIGRE for allowing the use of sections of CIGRE 125 B12bfor this guide. The subcommittee would like thank the International Electrotechnical Commission (IEC) for permission to reproduce Information from its

48、International Publication IEC 62271-203 ed.2.0. All such extracts are copyright of IEC, Geneva, Switzerland. All rights reserved. Further information on the IEC is available from www.iec.ch. IEC has no responsibility for the placement and context in which the extracts and contents are reproduced by

49、the author, nor is IEC in any way responsible for the other content or accuracy therein. aInformation on references can be found in Clause 2. bThe numbers in brackets correspond to those of the bibliography in Annex A. Copyright 2014 IEEE. All rights reserved. viii Contents 1. Scope 1 2. Normative references 1 3. Definitions, abbreviations, and acronyms 3 3.1 Definitions . 3 3.2 Abbreviations and acronyms . 5 4. Guideline for GIS . 7 4.1 GIS arrangement 7 4.2 Benefits and drawbacks of a GIS 13 4.3 Primary components .14 4.4 Design, installation, and equipment handling

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