1、IEEE Recommended Practice for the Selection, Field Testing, and Life Expectancy of Molded-Case Circuit Breakers for Industrial Applications IEEE Std 1458-2017 (Revision of IEEE Std 1458-2005) IEEE Industry Applications Society Sponsored by the Petroleum and Chemical Industry Committee IEEE 3 Park Av
2、enue New York, NY 10016-5997 USAIEEE Std 1458-2017 (Revision of IEEE Std 1458-2005) IEEE Recommended Practice for the Selection, Field Testing, and Life Expectancy of Molded-Case Circuit Breakers for Industrial Applications Sponsor Petroleum and Chemical Industry Committee of the IEEE Industry Appli
3、cations Society Approved 28 September 2017 IEEE-SA Standards BoardAbstract: A recommended procedure for the selection, application, and determination of the remaining life in molded-case circuit breaker is provided. Keywords: available fault values, circuit breaker testing, IEEE 1458, insulated-case
4、 circuit breakers, molded-case circuit breakers, molded-case circuit breakers basics, molded-case circuit breakers life, safety The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2018 by The Institute of Electrical and Electronics Engine
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34、ssociation.6 Copyright 2018 IEEE. All rights reserved. Participants At the time this IEEE recommended practice was completed, the IEEE 1458 Recommended Practice for the Selection, Field Testing, and Life Expectancy of Molded-Case Circuit Breakers for Industrial Applications Working Group had the fol
35、lowing membership: Gary L. Donner, Chair Jeremy D. Smith, Vice Chair Jessica J. Maldonado, Secretary Steven Dittmann Paul Dobrowsky David Durocher Timothy Gauthier John Hempstead Ed Larsen Cuong Le Kevin Lippert Daleep Mohla Dennis K. Neitzel Tom Papallo Christopher Pavese Rahul Rajvanshi Kenneth Re
36、mpe Vincent Saporita Todd Sauve Arthur J. Smith III Marcelo E. V aldes The following members of the balloting committee voted on this recommended practice. Balloters may have voted for approval, disapproval, or abstention. Dwight Alexander Robert Arno Thomas Bishop Chris Brooks Bill Brown Demetrio B
37、ucaneg Jr. Edward Byaliy Paul Cardinal Michael Chirico Daryld Crow Glenn Davis Davide De Luca Paul Dobrowsky Gary L. Donner Neal Dowling Robert Durham Keith Flowers Timothy Gauthier Lou Grahor J. Travis Griffith Randall Groves Paul Guidry John Hempstead Lee Herron Scott Hietpas Werner Hoelzl Richard
38、 Holub Yuri Khersonsky Royce King Jim Kulchisky Mikhail Lagoda James Lagree Ed Larsen Steven Liggio Kevin Lippert William Lockley Jessica J. Maldonado Hugo Marroquin John Mcalhaney Jr. William McBride Daleep Mohla Paul Myers Warren Naylor Daniel Neeser Dennis Neitzel Arthur Neubauer Lorraine Padden
39、Thomas Papallo Antony Parsons Christopher Petrola Iulian Profir Kenneth Rempe Ryandi Ryandi Vincent Saporita Todd Sauve Bartien Sayogo Xu She Arthur J. Smith III Jeremy D. Smith Jerry Smith Wayne Stec Gregory Steinman Marcelo E. V aldes Kenneth White7 Copyright 2018 IEEE. All rights reserved. When t
40、he IEEE-SA Standards Board approved this recommended practice on 28 September 2017, it had the following membership: John Kulick, Chair David J. Law, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Stephen Dukes Jean-Philippe Faure Alexander Gelman Mark Halpin Gary Hoffman Paul Houz Jim Hughes Michael Janezic Joseph L. Koepfinger* Oleg Logvinov Ron Petersen Gary Robinson Jon Walter Rosdahl Adrian Stephens Peter Sutherland Y atin Trivedi Phil Winston Y u Y uan *Member Emeritus
