1、BRITISH STANDARD BS EN 61143-2:1994 IEC 1143-2: 1992 Incorporating Amendment No. 1 Specification for Electrical measuring instruments X-t recorders Part 2: Recommended additional test methods The European Standard EN 61143-2:1994 has the status of a British StandardBSEN61143-2:1994 This British Stan
2、dard, having been prepared under the directionof the Power Electrical Engineering Standards Policy Committee, was published underthe authority of the Standards Board and comes intoeffect on 15 March 1993 BSI 04-2000 The following BSI references relate to the work on this standard: Committee referenc
3、e PEL/13 Draft for comment 92/25058 DC ISBN 0 580 21993 3 Committees responsible for this British Standard The preparation of this British Standard was entrusted by the Power Electrical Engineering Standards Policy Committee (PEL/-) to Technical Committee PEL/13, upon which the following bodies were
4、 represented: Association of Consulting Engineers Department of Energy (Electricity Division) Department of Trade and Industry (National Physical Laboratory) Electricity Association The Association for the Instrumentation, Control and Automation Industry GAMBICA (BEAMA Ltd.) Institution of Electrica
5、l Engineers Institution of Incorporated Executive Engineers Amendments issued since publication Amd. No. Date Comments 8389 January 1995 Indicated by a sideline in the marginBSEN61143-2:1994 BSI 04-2000 i Contents Page Committees responsible Inside front cover National foreword ii Foreword 2 Introdu
6、ction 3 1.1 Scope 3 2.11 Intrinsic error test 3 2.12 Additional error due to zero displacement 3 2.13 Mutual influence of different measuring circuits of multiple and multiple channel recorders 4 4.20 Determination of the value of the dead band 4 6 Influence of parasitic quantities 4 6.1 Common mode
7、 interference 4 6.2 Series (parallel) mode interference 4 7 Test of dynamic performance 4 7.1 Response time 5 7.2 Frequency response range 5 7.3 Overshoot 5 List of references Inside back coverBSEN61143-2:1994 ii BSI 04-2000 National foreword This British Standard has been prepared under the directi
8、on of the Power Electrical Engineering Standards Policy Committee. It is identical with IEC1143-2:1992 Electrical measuring instruments X-t recorders Part2:Recommended additional test methods published by the International Electrotechnical Commission (IEC). In 1994 the European Committee for Electro
9、technical Standardization (CENELEC) accepted IEC 1143-2:1992 as European Standard EN 61143-2:1994. As a consequence of implementing the European Standard this British Standard is renumbered as BS EN 61143-2 and any reference to BS 7610-2 should be read as a reference to BS EN 61143-2. A British Stan
10、dard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-reference International Standard Corresponding Br
11、itish Standard IEC 51-9 BS 89 Direct acting indicating analogue electrical measuring instruments and their accessories Part 9:1990 Recommended test methods (Identical) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, theEN title page, pages 2 to 6, an in
12、side back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 61143-2 June 1994 ICS 19.080 Supersedes HD 301
13、S1:1977 Descriptors: Measuring instrument, electrical measurement, recorder, X-t recorder, specific tests to X-t recorders English version Electrical measuring instruments X-t recorders Part 2: Recommended additional test methods (IEC 1143-2:1992) Appareils lectriques de mesure Enregistreurs X-t Par
14、tie 2: Mthodes dessais complmentaires recommandes (CEI 1143-2:1992) Elekrische Megerte X-t-Schreiber Teil 2: Empfohlene zustzliche Prfverfahren (IEC 1143-2:1992) This European Standard was approved by CENELEC on 1994-03-08. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulation
15、s which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This Eur
16、opean Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are
17、 the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CENELEC European Committee for Electrotechnical Standardization Comit Europen d
18、e Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1994 Copyright reserved to CENELEC members Ref. No. EN 61143-2:1994 EEN61143-2:1994 2 BSI 04-2000 Foreword The CENELEC questionnaire procedure, performed for fin
19、ding out whether or not the International Standard IEC 1143-2:1992 could be accepted without textual changes, has shown that no common modifications were necessary for the acceptance as European Standard. The reference document was submitted to the CENELEC members for formal vote and was approved by
20、 CENELEC as EN 61143-2 on 8 March 1994. This European Standard replaces HD 301 S1:1977. The following dates were fixed: latest date of publication ofan identical national standard (dop) 1995-03-15 latest date of withdrawal ofconflicting national standards (dow) 1995-03-15EN61143-2:1994 BSI 04-2000 3
21、 Introduction This part of IEC 1143 shall be read in conjunction with part 1 and IEC 51-9:1988, Direct acting indicating analogue electrical measuring instruments and their accessories Part 9: Recommended test methods. It gives details of tests which are specific to X-t recorders. The testing condit
22、ions and the more conventional tests, which shall be followed, are those given in the following list of subclauses from IEC 51-9: Other clauses from IEC 51-9 may also be applied, if relevant. For easier reference clause numbering follows that of IEC 51-9. For X-t recorders, tapping is not allowed. I
23、n case of doubt, the text of this part 2 as well as that of part 1 shall prevail. 1.1 Scope See part 1. 2.11 Intrinsic error test The recorder shall be under reference conditions with the auxiliary circuits energized. 2.11.1 Measuring circuit Before determining the intrinsic error, the record shall
24、be at the chart scale line corresponding to zero and the chart driving mechanism shall be on. The errors shall be determined for both increasing and decreasing values of the measurand as follows: 2.11.1.1 Continuous line recorders and single channel dotted line recorders Procedure: An input quantity
25、 shall be applied and increased sufficiently slowly, in order to avoid overshoot, to a value corresponding to the input quantity, B a . The recorded value, B x , shall be read as soon as the steady state value of the input has been reached and the chart has advanced by at least 2 mm. This test shall
26、 be performed at five approximately equal steps within the span, including the lower and upper limits of the measuring range. For single channel dotted line recorders, the reading used shall be that of the dot next following the one indicating that the steady state has been reached. During this test
27、 the chart shall be driven at a sufficiently high speed for the individual dots to be distinguishable. Computation: The intrinsic error, expressed as a percentage, shall be computed for each selected step as follows: where A sis the span. 2.11.1.2 For multiple recorders, the determination of the err
28、ors shall be carried out on every measuring circuit in sequence, the other measuring circuits being energized so that their record corresponds to the lower limit of the span. 2.11.1.3 For multiple channel recorders, the procedure is analogous to that given in 2.11.1.2. 2.11.2 Time-keeping Procedure:
29、 The recorded time, T x , is determined from the values of the chart time lines corresponding to two abrupt changes in the value of the measurand. The actual value, T a , of the time between these changes shall be measured using a timing device of sufficient accuracy that any error caused is small (
30、such as one tenth) compared with the intrinsic error in time-keeping being determined. The chart shall have been driven for a sufficient time before the first abrupt change to have reached a steady speed and for a distinct change of the record, as a function of time, to be observed. Computation: The
31、 intrinsic error in time-keeping, expressed as a percentage of the actual (true) value of the elapsed time is: 2.12 Additional error due to zero displacement Before the determination of the additional error, the recorder should be on a chart scale line at approximately10% of the span and the chart d
32、riving mechanism on. The zero displacement shall be off. Note the recorded value, B a , after the chart has been driven for5s or approximately2mm whichever is the greater. 1.2 3.5.2 1.2.8 3.6 1.2.9 3.7 1.2.11 3.8 1.2.12 3.17 1.2.13 3.18 3.2 4.1 3.4 4.6 3.5 4.10 3.5.2 4.19 3.6 B x B a A s -100 T x T
33、a T a -100 EN61143-2:1994 4 BSI 04-2000 Procedure Switch on the zero displacement and apply an input quantity, A z , corresponding to the zero displacement value. Note the value, B x , of the record after the chart has been driven for5s or approximately2mm whichever is the greater. The procedure sha
34、ll be carried out with increasing and decreasing values of the input quantity. Computation: The additional error due to zero displacement is expressed as a percentage: 2.13 Mutual influence of different measuring circuits of multiple and multiple channel recorders Procedure: The variation arising fr
35、om a mutual effect between the measuring circuits is determined by energizing one circuit (or channel) so that a record equal to approximately50% of the span is obtained. The value of the input quantity of each other circuit (channel) is then simultaneously changed between the upper and lower limits
36、 of their measuring ranges. The test is to be repeated for each measuring circuit (channel) in turn. Computation: The change in the record of the measuring circuit under test, expressed as a percentage of the span, represents the influence. 4.20 Determination of the value of the dead band The follow
37、ing procedure is to be used to determine the value of the dead band, at approximately50% of the span. Procedure: The starting point corresponds to a value of the input quantity smaller than the chosen value by an amount equivalent to five times the class index. The input quantity is then slowly incr
38、eased until the chosen value is reached and the recorded value, B b , is then noted after the chart has been driven for5s or approximately2mm whichever is the greater. The same operation is then repeated, starting at a value of the input quantity greater than the chosen value by an amount equivalent
39、 to five times the class index and then decreasing the input until the chosen value is reached. The recorded value, B a , is noted. Computation: The dead band is the absolute difference between the two recorded values, expressed as a percentage: 6 Influence of parasitic quantities The method for det
40、ermination of the influence of parasitic quantities is described in Annex A of part1. Measurements are to be made in the centre of the span. During the tests, any earthing (grounding), including connections to any internal screen, shall be as specified by the manufacturer. 6.1 Common mode interferen
41、ce The test is performed with a d.c. voltage and then with an a.c. voltage having a frequency equal to the power supply frequency. The phase relationship between the power supply voltage and the a.c. parasitic voltage shall be adjusted so as to obtain the maximum influence. If the manufacturer has s
42、tated values of parasitic voltages for any other value of frequency, or frequency range, the same test applies. 6.2 Series (parallel) mode interference 6.2.1 Recorders for measuring d.c. quantities The test is performed with an a.c. voltage (current) having a frequency equal to the power supply freq
43、uency. The phase relationship between the power supply voltage and the a.c. parasitic voltage (current) shall be adjusted so as to obtain the maximum influence. If the manufacturer has stated values of parasitic voltages (currents) for any other value of frequency, or frequency range, the same test
44、applies. 6.2.2 Recorders for measuring a.c. quantities The test is performed with a d.c. voltage (current) and the frequency of the measured quantity is varied between the specified limits of the frequency response range. 7 Test of dynamic performance The recorder shall be under reference conditions
45、 with the auxiliary circuits energized. The impedance of the external measuring circuit shall have a steady value between the limits specified by the manufacturer. The amplifier gain or attenuation, if any, shall be set as specified by the manufacturer. B x B a A z -100 B a B b A z -100 EN61143-2:19
46、94 BSI 04-2000 5 7.1 Response time The response time shall be measured in both ascending and descending directions. For single-channel dotted line recorders with a response time less than the dotting time, an abrupt change of the input quantity shall be applied and maintained for a period of time lo
47、nger than the dotting time. This time shall be gradually shortened until the next dot corresponds to the steady state value, within a percentage of the span equivalent to the class index. The time between the application of the change and the next dot is the desired response time. This procedure can
48、 be realised automatically by applying a periodic input quantity of a rectangular waveform and having a repetition time in the vicinity of the dotting time (sampling method). For multiple and multiple channel recorders the same tests shall be applied using first one measuring circuit (channel) and t
49、hen the others. 7.2 Frequency response range The test is carried out by applying, successively, two sinusoidal input quantities corresponding to peak-to-peak deflections of 2/3 and 1/10 of the span respectively. The frequency is then varied between the specified limits of the frequency response range. The values of the frequency at which the deflection deviates by10% from the d.c. (or low frequency) deflection value are the limits of the frequency res
