1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add delta limits for class V devices. Update the boilerplate to current requirements as specified in MIL-PRF-38535. Editorial changes throughout. jak 06-11-13 Thomas M. Hess B Update boilerplate paragraphs to the current MIL-PRF-38535 requirement
2、s. - LTG 13-03-25 Thomas M. Hess REV SHEET REV B B SHEET 15 16 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAW
3、ING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A CHECKED BY Thanh V. Nguyen APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 8-BIT SERIAL/PARALLEL-IN, SERIAL-OUT SHIFT REGISTER, MONOLITHIC SILICON DRAWING APPROVAL DATE
4、94-12-15 REVISION LEVEL B SIZE A CAGE CODE 67268 5962-90501 SHEET 1 OF 16 DSCC FORM 2233 APR 97 5962-E249-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90501 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-39
5、90 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in
6、 the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 90501 01 M E A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device
7、class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the
8、MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54HC166 Eight-bit serial/paralle
9、l-in, serial-out shift register 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class le
10、vel B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16
11、 16 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,
12、-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90501 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (VIN) -0.5 V dc to VCC+ 0.5 V dc DC output vo
13、ltage range (VOUT) . -0.5 V dc to VCC+ 0.5 V dc DC input clamp current (IIK) . 20 mA DC output clamp current (IOK) 20 mA DC output current (IOUT) (per pin) . 25 mA DC VCCor GND current (ICC, IGND) (per pin) . 50 mA Storage temperature range (TSTG) . -65C to +150C Maximum power dissipation (PD) . 500
14、 mW 3/ Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ). +175C 1.4 Recommended operating conditions. 2/ 4/ Supply voltage range (VCC) +2.0 V dc to +6.0 V dc Input voltage range (VIN) +0.0 V dc to VCCOutput voltage r
15、ange (VOUT) . +0.0 V dc to VCCCase operating temperature range (TC) . -55C to +125C Maximum low level input voltage (VIL): VCC= 2.0 V . 0.3 V dc VCC= 4.5 V . 0.9 V dc VCC= 6.0 V . 1.2 V dc Minimum high level input voltage (VIH): VCC= 2.0 V . 1.5 V dc VCC= 4.5 V . 3.15 V dc VCC= 6.0 V . 4.2 V dc Inpu
16、t rise and fall times (tr, tf): VCC= 2.0 V . 1000 ns 5/ VCC= 4.5 V . 500 ns VCC= 6.0 V . 400 ns Minimum high level output current (IOH) . -5.2 mA at VCC= 6.0 V Maximum low level output current (IOL) +5.2 mA at VCC= 6.0 V 1/ Stresses above the absolute maximum rating may cause permanent damage to the
17、 device. Extended operation at the maximum levels may degrade performance and affect reliability. The maximum junction temperature may be exceeded for allowable short duration burn-in screening conditions in accordance with method 5004 of MIL-STD-883. 2/ Unless otherwise specified, all voltages are
18、referenced to GND. 3/ For TC= +100C to +125C, derate linearly at 8 mW/C to 300 mW. 4/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 5/ Transition times = 1000 ns will not harm the device, however, functionalit
19、y is not guaranteed for the CLK input while in the shift mode. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90501 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR
20、 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contr
21、act. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBO
22、OKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-509
23、4.) 2.2 Non-Government publications. The following document(s) form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents cited in the solicitation or contract. JEDEC SOLID STATE TECHNOLOGY ASSOCIATION (JEDEC) JESD7 - Standard for Descripti
24、on of 54/74HCXXXXX and 54/74HCTXXXXX Advanced High-Speed CMOS Devices. (Copies of these documents are available online at http:/www.jedec.org or from JEDEC Solid State Technology Association, 3103 North 10thStreet, Suite 240-S Arlington, VA 22201-2107). 2.3 Order of precedence. In the event of a con
25、flict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item r
26、equirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirem
27、ents for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device c
28、lasses Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified
29、 on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 4. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IH
30、S-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90501 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characte
31、ristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined
32、 in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on
33、 the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certifica
34、tion mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a Q
35、ML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of c
36、ompliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appe
37、ndix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device
38、 class M. For device class M, notification to DLA Land and Maritime-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA
39、 Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device clas
40、s M devices covered by this drawing shall be in microcircuit group number 40 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90501 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3
41、990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method Symbol Test conditions 1/ -55C TC +125C 2.0 V VCC 6.0 V unless otherwise specified VCCDevice type Group A subgroups Limits 2/ Unit Min Max High level output voltage 30
42、06 VOH1For all inputs affecting output under test, VIN= VIHor VILVIH= 1.5 V, VIL= 0.3 V For all other VIN= VCCor GND IOH= -20 A 2.0 V All 1, 2, 3 1.9 V VOH2For all inputs affecting output under test, VIN= VIH99or VILVIH= 3.15 V, VIL= 0.9 V For all other inputs, VIN= VCCor GND IOH= -20 A 4.5 V All 1,
43、 2, 3 4.4 VOH3For all inputs affecting output under test, VIN= VIHor VILVIH= 4.2 V, VIL= 1.2 V For all other inputs, VIN= VCCor GND IOH= -20 A 6.0 V All 1, 2, 3 5.9 VOH4For all inputs affecting output under test, VIN= VIHor VILVIH= 3.15 V, VIL= 0.9 V For all other inputs, VIN= VCCor GND IOH= -4.0 mA
44、 4.5 V All 1 3.98 2, 3 3.70 VOH5For all inputs affecting output under test, VIN= VIHor VILVIH= 4.2 V, VIL= 1.2 V For all other inputs, VIN= VCCor GND IOH= -5.2 mA 6.0 V All 1 5.48 2, 3 5.20 Low level output voltage 3007 VOL1For all inputs affecting output under test, VIN= VIHor VILVIH= 1.5 V, VIL= 0
45、.3 V For all other, VIN= VCCor GND IOL= +20 A 2.0 V All 1, 2, 3 0.1 V VOL2For all inputs affecting output under test, VIN= VIH99or VILVIH= 3.15 V, VIL= 0.9 V For all other inputs, VIN= VCCor GND IOL= +20 A 4.5 V All 1, 2, 3 0.1 VOL3For all inputs affecting output under test, VIN= VIHor VILVIH= 4.2 V
46、, VIL= 1.2 V For all other inputs, VIN= VCCor GND IOL= +20 A 6.0 V All 1, 2, 3 0.1 VOL4For all inputs affecting output under test, VIN= VIHor VILVIH= 3.15 V, VIL= 0.9 V For all other inputs, VIN= VCCor GND IOL= +4.0 mA 4.5 V All 1 0.26 2, 3 0.4 VOL5For all inputs affecting output under test, VIN= VI
47、Hor VILVIH= 4.2 V, VIL= 1.2 V For all other inputs, VIN= VCCor GND IOL= +5.2 mA 6.0 V All 1 0.26 2, 3 0.4 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90501 DLA LAND AND MARI
48、TIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test and MIL-STD-883 test method Symbol Test conditions 1/ -55C TC +125C 2.0 V VCC 6.0 V unless otherwise specified VCCDevice type Group A subgroups Limits 2/ Unit Min Max Input current high 3010 IIHFor input under test, VIN= VCCFor all other, VIN= VCCor GND 6.0 V All 1 0.1 A 2, 3 1.0 Input current low 3009 IILFor input under test, VIN= GND For all other, VIN= VCCor GND 6.0 V All 1 -0.1 A 2, 3 -1.0 Quiescent supply current output h
