1、O O O I w 1 ANSVEIA-58OA000-1991 APPROVED: Novirbr 7,1991 EIA SP ECI FI CATI ON Sectional Specification for Fixed Chip Capacitors with Metallized Electrodes and Polyethylene- Terephthalate Dielectric for Use in Electronic Equipment EIA-580AOOO JANUARY 1992 ELECTRONIC INDUSTRI ES ASSOCIATION ENGINEER
2、ING DEPARTMENT NOTICE 1 EIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining
3、 with minimum delay the proper product for his particular need. Existence of such Standards and Publications shall not in any respect preclude any member or non- member of EIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such St
4、andards and Publications preclude their voluntary use by those other than EIA members, whether the standard is to be used either domestically or internationally. Recommended Standards and Publications are adopted by EIA without regard to whether their adoption may involve patents on articles, materi
5、als, or processes. By such action, IA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Recommended Standard or Publication. This EIA Specification is considered to have International Standardization implication, but the Internation
6、al Electrotechnical Commission activity has not progressed to the point where a valid comparison between the EIA Specification and the IEC document can be made. This Specification does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is
7、 the responsibility of the user of this Specification to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. (From Standards Proposai No. 2357 formulated under the cognizance of P-2.2 Subcommittee on Plastic and Paper Dielect
8、ric) Published by ELECTRONIC INDUSTRIES ASSOCIATION Engineering Department 2001 Pennsyivania Avenue N.W. Washington, D.C. 26 PRICE: Please reter to the current Catalog of EIA however, when the original dimensions are given in inches, the converted metric dimensions in millimeters shall be added. Nor
9、mally the numerical values shall be given for the length of the body, the width and height of the body. When necessaiy, for example when a number of items sizes and capacitance/voltaue ranges) is covere by a etail specification, the dimensions and their associate tolerances shall be placed in a tabl
10、e below the rawinu. When the configuration is other than describea above, the detail specification shall state such dimensional information as will adequately describe the capacitor. 1.4.2 Yount inq The detail specification shall give guidance on method of mounting for normal use. Mounting for test
11、and measurement purposes (when required) shall be in accordance with Subclause 4.1 of this sectiqnal specification. 1.4.3 Ratinas and Characteristics The ratings and characteristics shall be in accordance with the relevant clauses of section two of this specification, together with the following: 1.
12、4.3.1 Rated CaDac itance Ranae See Subcl.ause 2.2.1. Note: When products approved to the detail specification have different ranges, the following statement should be added: “The range of capacitance values available in each voltage range is given in the Qualified Products LiSt“. EIA-580A000 Page 4
13、1.4.3.2 Particular characteristics Additional characteristics may be listed when they are considered necessary to specify adequately the component for design and application purposes. 1.4.3.3 Solderinq The detail specification shall prescribe the test methods, severities and requirements applicable
14、for the solderability and the resistance to soldering heat test. 1.4.4 Markinq The detail specification snall Specify the content of the marking on the capacitor and on the package. Deviations from Subclause 1.6 of this sectional specification, shall be specifically stated. 1.5 Termin oloav In addit
15、ion to the applicable terms and definitions of IEC Publication 384-1 the following definitions apply: 1.5.1 ChiD capacitor A capacitor whose small dimensions and nature or shape of terminations make it suitable for surface mounting on hybrid circuits or printed boards. 1.5.2 Rated voltaae U,L The ra
16、ted voltage is the maximum dc voltage that may be applied continuously to a capacitor at the rated temperature. Note: If both ac and dc voltages are applied to a capacitor, the sum of the dc voltage and the peak ac voltage shall not exceed the rated voltage. The ac component of the voltage shall not
17、 exceed the percentage listed at the following frequencies and in no case shall be greater than 280 V. 60 Hz : 20 S 100 Hz : 15 3 1,000 Hz : 3 4 10,000 Hz : 1 % unless otherwise spec.fied in the detail specification. 1.6 Mar- 1.6.1 1.6.2 i.6.3 1.6.4 f) 1.6.5 EIA-580A000 Page 5 Subclause 2.4 of IEC P
18、ublication 384-1, with the following details: The information given in the marking is normally selected from the following list; the relative importance of each item is indicated by its position in the list: Rated capacitance (in clear or code according to IEC Publication 62) Rated voltage (dc volta
19、qe may be indicated by the symbol v or v, 1 tolerance on rated capacitance Year and month (or week) of manufacture Manufacturers name or trae mark Manufacturers type designation Reference to the detail specification Chip capacitors are generally not marked on the body. If some marking can be applied
20、, they shall be clearly marked with as many as possible of the -Y above items as is considered .useful. duplication of information in the marking on the capacitor should be avoided. Any marking shall be legible and not easily smeared or removed by rubbing with the finger. The package containing the
21、capacitor( s) shall be clearly marked with all the information listed in Subclause 1.6.1. Any additional marking shall be so applied that no confusion can arise. EIA 580A000 92 M 3234600 0556303 495 EU-580A000 Page 6 2.1 Preferred cbacterbticg The values given in detail specifications shall preferab
22、ly be selected from the following: 2.1.1 Pref erre d climat ic cateaories The capacitors covered by this specification are classified into climatic categories according to the general rules given in IEC Publication 68-1. The lower and upper category temperature and the duration of the amp heat, stea
23、dy state test shall be chosen from the following: Lower category temperature: -55OC, -4O“C, -25C Upper category temperature: +85“C, +lOO“C and +125“C Duration of the damp heat, steady state test 21 and 56 days flote: With continuous operation at 125C in excess of the endurance test time, accelerated
24、 ageing has to be considered (see detail specification). The severities for the cold and dry heat tests are the lower and the upper category temperatures respectively. 2.2 -ref err ed values of rat- Preferred values of rated capacitance are: 1 - 1.5 - 2.2 - 3.3 - 4.7 and 6.8 and their decimal multip
25、les. These values conform to the E6 series of preferred values given in IEC Publication 63: Preferred number series for resistors and capacitors. If other values are required they shall preferably be chosen from the E12 series. EIA-580A000 Page 7 2.2.2 Toleran ce on Rated CaDacitance The preferred t
26、olerances on the rated capacitance are f5%, +lo%, and f20%. 2.2.3 Rated Voltaae (U,) The preferred values of rated voltage are: 25 - 40 - 50 - 63 - 100 - 160 - 250 - 400 V. These values conform to the basic series of preferred values as given in IS0 Standard 3: Preferred numbers - Series of preferre
27、d numbers. 2.2.4 Catesorv Voltaae (U,) c. The category voltage is: 0.8 U, for upper category temperature 1OOZC 0.5 U, for upper category temperature 125C The standard value of rated temperature is 85C. 2.2.5 EIA-580A000 Page 8 3. 3.1 3.2 3.3 3.4 SECTION THREE - QUALITY ASSESSMENT PROCEDURES Priman s
28、taae of manufacture Structurallv similar components Capacitors considered as being structurally similar are capacitors produced with similar processes and materials, though they may be of different case sizes and Capacitance and voltage values. Certified records of released lots The information requ
29、ired in Subclause 3.5.1 of IEC Publication 384-1 shall be made available when prescribed in the detail specification and when requested by a purchaser. After the endurance test the parameters for which variables information is required are the capacitance change, tangent and the insulation resistanc
30、e. gualification amroval The procedures for qualification approval testing are given in Subclause 3.4 of the generic specification, IEC Publication 384-1. The schedule to be used for qualification approval testing on the basis of lot-by-lot and periodic tests is given in Subclause 3.5 of this specif
31、ication. The procedure using a fixed sample size schedule is given in Subclauses 3.4.1 and 3.4.2 below. For the two procedures the sample sizes and the number of permissible defectives shall be of comparable order. The test conditions and requirements shall be the same. 3.4.1 ualification ammoval on
32、 the basis of fixed sample size procedures. SamDlinq The fixed sample size procedure is described in Subclause 3.4.2 b) of IEC Publication 384-1. The sample shall be representative of the range of capacitors for which approval is sought. This may or may not be the complete range covered by the detai
33、l specification. t EIA-580A000 Page 9 The sample shall consist of specimens having the lowest and highest voltages, and for these voltages the lowest and highest capacitances. When there are more than four rated voltages an intermediate voltage shall also be tested. Thus for the approval of range, t
34、esting is required of either four or six values (capacitance/voltage combinations) . When the range consists of fewer than four values, the number of specimens to be tested shall be that required for four values. Spare specimens are permitted as follows: a) One per value, which may be used to replac
35、e the permitted defective in Group lfO1g. b) One per value, which may be used as replacements for specimens which are defective because of incidents not attributable to the manufacturer.% The numbers given in Group lfO1f assume that all groups are applicable. If this is not so the numbers may be red
36、uced accordingly. When additional groups are introduced into the qualification approval test schedule, the number of specimens required for Group flO1l shall be increased by the same number as that required for the additional groups. Table 1 gives the number of samples to be tested in each group or
37、subgroup together with the permissible number of defectives for qualification approval tests. 3.4.2 Tests The complete series of tests specified in Tables 1 and 2 are required for the approval of capacitors covered by one detail specification. The tests of each group shall be carried out in the orde
38、r given. The whole sample shall be subjected to the tests of Group lfO1f and then divided for the other groups. Specimens found defective during the tests of Group llOff shall not be used for the other groups. !One defective11 is counted when a capacitor has not satisfied the whole or a part of the
39、tests of a group. EIA 580A000 92 3234600 055b307 030 = EIA-580A000 Page 10 The approval is granted when the number of defectives does not exceed the specified number of permissible defectives for each group or subgroup and the total number of permissible defectives. Note: Tables 1 and 2 together for
40、m the fixed sample size test schedule. Table 1 includes the details for the sampling and permissible defectives for the different tests or groups of tests. Table 2, together with the details of test contained in Section Four, gives a complete summary of test conditions and performance requirements a
41、nd indicates where (for example, for the test method or conditions of test) a choice has to be made in the detail specification. The conditions of test and performance requirements for the fixed sample size test schedule shall be identical to those prescribed in the detail specification for quality
42、conformance inspection. - - EIA 580A000 92 3234600 0556308 T77 W EIA-580A000 Table 1 Page 11 Sample plan together with numbers of permissible defectives for Qualification Approval Tests Nunber of specimens (ni and number of Group Test of this per for 4 or less value for 6 values No. publi- value to
43、be tested to be tested n 4n pd pd 6n pd pd Sub- permissible defectives (pdl clause cation total total Visual exaaination 4.2 Dimensions 4.2 L. Tanaent of loss anale 4.3.3 I Voltage proof 4.3.1 Insulation resistance 4.3.4 Spare specimens 4 16 . 24 O Capacitance 4.3.2 35 140 22 210 32 1A Resistance to
44、 soldering neat 4.6 3 12 1 18 1 1 22 1B Solderability 4.1 3 12 1 18 1 2 Bond strength of the end face platinq 4.5 3 12 1 1181 1 Hountinq 4.1 Visual examination 4.2 Capacitance 4.3.2 26 104 2* 156 32 3 Tangent of loss anale 4.3.3 Voltage proof Insulation resistance Adhesion 4.4 3.1 Rapid change of te
45、nperature 4.8 6 24 1 36 22 Climatic 4.9 3.2 anp heat, steady 43 30 22 6 state 4.10 5 20 1 3.3 Endurance 4.11 10 40 22 60 32 3.4 Change and discharge 4.12 5 20 1 30 2 Capacitance/voltage combination, see Subclause 3.4.1 Not more than one defective is pehtted from any one value. The specimens found to
46、 be defective after muting Ml not be taken into account in calculating the penitted defectives for the following tests. They shall be spare capacitors. EIA 580A000 92 H 3234600 0556309 903 EU-5 8 OA000 Page 12 Table 2 Note 1: Subclause numbers of test and performance requirements refer to Section Fo
47、ur Test and measuring methods Note 2: In this table: D = destructive, ND = nondestructive Subclause D Condition of test Number of Perf onnance number 3.3 Measur ina conditions for measurements at 10 kHg For capacitors with C, I 1 pF, tan 6 shall be measured in addition if required in Table 2 for certain tests. - Frequency: 10 kHz - Voltage: 1 v rms maximum - Inaccuracy: I 1.0 x 10 -3 (absolute value)
